Surface science

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STM image of a quinacridone adsorbate. The self-assembled supramolecular chains of the organic semiconductor are adsorbed on a graphite surface. Selfassembly Organic Semiconductor Trixler LMU.jpg
STM image of a quinacridone adsorbate. The self-assembled supramolecular chains of the organic semiconductor are adsorbed on a graphite surface.

Surface science is the study of physical and chemical phenomena that occur at the interface of two phases, including solidliquid interfaces, solid–gas interfaces, solid–vacuum interfaces, and liquidgas interfaces. It includes the fields of surface chemistry and surface physics . [1] Some related practical applications are classed as surface engineering. The science encompasses concepts such as heterogeneous catalysis, semiconductor device fabrication, fuel cells, self-assembled monolayers, and adhesives. Surface science is closely related to interface and colloid science. [2] Interfacial chemistry and physics are common subjects for both. The methods are different. In addition, interface and colloid science studies macroscopic phenomena that occur in heterogeneous systems due to peculiarities of interfaces.

Contents

History

The field of surface chemistry started with heterogeneous catalysis pioneered by Paul Sabatier on hydrogenation and Fritz Haber on the Haber process. [3] Irving Langmuir was also one of the founders of this field, and the scientific journal on surface science, Langmuir , bears his name. The Langmuir adsorption equation is used to model monolayer adsorption where all surface adsorption sites have the same affinity for the adsorbing species and do not interact with each other. Gerhard Ertl in 1974 described for the first time the adsorption of hydrogen on a palladium surface using a novel technique called LEED. [4] Similar studies with platinum, [5] nickel, [6] [7] and iron [8] followed. Most recent developments in surface sciences include the 2007 Nobel prize of Chemistry winner Gerhard Ertl's advancements in surface chemistry, specifically his investigation of the interaction between carbon monoxide molecules and platinum surfaces.

Chemistry

Surface chemistry can be roughly defined as the study of chemical reactions at interfaces. It is closely related to surface engineering, which aims at modifying the chemical composition of a surface by incorporation of selected elements or functional groups that produce various desired effects or improvements in the properties of the surface or interface. Surface science is of particular importance to the fields of heterogeneous catalysis, electrochemistry, and geochemistry.

Catalysis

The adhesion of gas or liquid molecules to the surface is known as adsorption. This can be due to either chemisorption or physisorption, and the strength of molecular adsorption to a catalyst surface is critically important to the catalyst's performance (see Sabatier principle). However, it is difficult to study these phenomena in real catalyst particles, which have complex structures. Instead, well-defined single crystal surfaces of catalytically active materials such as platinum are often used as model catalysts. Multi-component materials systems are used to study interactions between catalytically active metal particles and supporting oxides; these are produced by growing ultra-thin films or particles on a single crystal surface. [9]

Relationships between the composition, structure, and chemical behavior of these surfaces are studied using ultra-high vacuum techniques, including adsorption and temperature-programmed desorption of molecules, scanning tunneling microscopy, low energy electron diffraction, and Auger electron spectroscopy. Results can be fed into chemical models or used toward the rational design of new catalysts. Reaction mechanisms can also be clarified due to the atomic-scale precision of surface science measurements. [10]

Electrochemistry

Electrochemistry is the study of processes driven through an applied potential at a solid-liquid or liquid-liquid interface. The behavior of an electrode-electrolyte interface is affected by the distribution of ions in the liquid phase next to the interface forming the electrical double layer. Adsorption and desorption events can be studied at atomically flat single crystal surfaces as a function of applied potential, time, and solution conditions using spectroscopy, scanning probe microscopy [11] and surface X-ray scattering. [12] [13] These studies link traditional electrochemical techniques such as cyclic voltammetry to direct observations of interfacial processes.

Geochemistry

Geologic phenomena such as iron cycling and soil contamination are controlled by the interfaces between minerals and their environment. The atomic-scale structure and chemical properties of mineral-solution interfaces are studied using in situ synchrotron X-ray techniques such as X-ray reflectivity, X-ray standing waves, and X-ray absorption spectroscopy as well as scanning probe microscopy. For example, studies of heavy metal or actinide adsorption onto mineral surfaces reveal molecular-scale details of adsorption, enabling more accurate predictions of how these contaminants travel through soils [14] or disrupt natural dissolution-precipitation cycles. [15]

Physics

Surface physics can be roughly defined as the study of physical interactions that occur at interfaces. It overlaps with surface chemistry. Some of the topics investigated in surface physics include friction, surface states, surface diffusion, surface reconstruction, surface phonons and plasmons, epitaxy, the emission and tunneling of electrons, spintronics, and the self-assembly of nanostructures on surfaces. Techniques to investigate processes at surfaces include Surface X-Ray Scattering, Scanning Probe Microscopy, surface enhanced Raman Spectroscopy and X-ray Photoelectron Spectroscopy (XPS).

Analysis techniques

The study and analysis of surfaces involves both physical and chemical analysis techniques.

Several modern methods probe the topmost 1–10 nm of surfaces exposed to vacuum. These include Angle-resolved photoemission spectroscopy (ARPES), X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), low-energy electron diffraction (LEED), electron energy loss spectroscopy (EELS), thermal desorption spectroscopy (TPD), ion scattering spectroscopy (ISS), secondary ion mass spectrometry, dual-polarization interferometry, and other surface analysis methods included in the list of materials analysis methods. Many of these techniques require vacuum as they rely on the detection of electrons or ions emitted from the surface under study. Moreover, in general ultra-high vacuum, in the range of 10−7 pascal pressure or better, it is necessary to reduce surface contamination by residual gas, by reducing the number of molecules reaching the sample over a given time period. At 0.1 mPa (10−6 torr) partial pressure of a contaminant and standard temperature, it only takes on the order of 1 second to cover a surface with a one-to-one monolayer of contaminant to surface atoms, so much lower pressures are needed for measurements. This is found by an order of magnitude estimate for the (number) specific surface area of materials and the impingement rate formula from the kinetic theory of gases.

Purely optical techniques can be used to study interfaces under a wide variety of conditions. Reflection-absorption infrared, dual polarisation interferometry, surface-enhanced Raman spectroscopy and sum frequency generation spectroscopy can be used to probe solid–vacuum as well as solid–gas, solid–liquid, and liquid–gas surfaces. Multi-parametric surface plasmon resonance works in solid–gas, solid–liquid, liquid–gas surfaces and can detect even sub-nanometer layers. [16] It probes the interaction kinetics as well as dynamic structural changes such as liposome collapse [17] or swelling of layers in different pH. Dual-polarization interferometry is used to quantify the order and disruption in birefringent thin films. [18] This has been used, for example, to study the formation of lipid bilayers and their interaction with membrane proteins.

X-ray scattering and spectroscopy techniques are also used to characterize surfaces and interfaces. While some of these measurements can be performed using laboratory X-ray sources, many require the high intensity and energy tunability of synchrotron radiation. X-ray crystal truncation rods (CTR) and X-ray standing wave (XSW) measurements probe changes in surface and adsorbate structures with sub-Ångström resolution. Surface-extended X-ray absorption fine structure (SEXAFS) measurements reveal the coordination structure and chemical state of adsorbates. Grazing-incidence small angle X-ray scattering (GISAXS) yields the size, shape, and orientation of nanoparticles on surfaces. [19] The crystal structure and texture of thin films can be investigated using grazing-incidence X-ray diffraction (GIXD, GIXRD).

X-ray photoelectron spectroscopy (XPS) is a standard tool for measuring the chemical states of surface species and for detecting the presence of surface contamination. Surface sensitivity is achieved by detecting photoelectrons with kinetic energies of about 10-1000 eV, which have corresponding inelastic mean free paths of only a few nanometers. This technique has been extended to operate at near-ambient pressures (ambient pressure XPS, AP-XPS) to probe more realistic gas-solid and liquid-solid interfaces. [20] Performing XPS with hard X-rays at synchrotron light sources yields photoelectrons with kinetic energies of several keV (hard X-ray photoelectron spectroscopy, HAXPES), enabling access to chemical information from buried interfaces. [21]

Modern physical analysis methods include scanning-tunneling microscopy (STM) and a family of methods descended from it, including atomic force microscopy (AFM). These microscopies have considerably increased the ability and desire of surface scientists to measure the physical structure of many surfaces. For example, they make it possible to follow reactions at the solid–gas interface in real space, if those proceed on a time scale accessible by the instrument. [22] [23]

See also

Related Research Articles

Spectroscopy Study involving matter and electromagnetic radiation

Spectroscopy is the study of the interaction between matter and electromagnetic radiation as a function of the wavelength or frequency of the radiation. In simpler terms, spectroscopy is the precise study of color as generalized from visible light to all bands of the electromagnetic spectrum; indeed, historically, spectroscopy originated as the study of the wavelength dependence of the absorption by gas phase matter of visible light dispersed by a prism. Matter waves and acoustic waves can also be considered forms of radiative energy, and recently gravitational waves have been associated with a spectral signature in the context of the Laser Interferometer Gravitational-Wave Observatory (LIGO).

Auger electron spectroscopy Analytical technique used specifically in the study of surfaces

Auger electron spectroscopy is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. It is a form of electron spectroscopy that relies on the Auger effect, based on the analysis of energetic electrons emitted from an excited atom after a series of internal relaxation events. The Auger effect was discovered independently by both Lise Meitner and Pierre Auger in the 1920s. Though the discovery was made by Meitner and initially reported in the journal Zeitschrift für Physik in 1922, Auger is credited with the discovery in most of the scientific community. Until the early 1950s Auger transitions were considered nuisance effects by spectroscopists, not containing much relevant material information, but studied so as to explain anomalies in X-ray spectroscopy data. Since 1953 however, AES has become a practical and straightforward characterization technique for probing chemical and compositional surface environments and has found applications in metallurgy, gas-phase chemistry, and throughout the microelectronics industry.

X-ray photoelectron spectroscopy Spectroscopic technique

X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect that can identify the elements that exist within a material or are covering its surface, as well as their chemical state, and the overall electronic structure and density of the electronic states in the material. XPS is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to. The technique can be used in line profiling of the elemental composition across the surface, or in depth profiling when paired with ion-beam etching. It is often applied to study chemical processes in the materials in their as-received state or after cleavage, scraping, exposure to heat, reactive gasses or solutions, ultraviolet light, or during ion implantation.

Synchrotron light source

A synchrotron light source is a source of electromagnetic radiation (EM) usually produced by a storage ring, for scientific and technical purposes. First observed in synchrotrons, synchrotron light is now produced by storage rings and other specialized particle accelerators, typically accelerating electrons. Once the high-energy electron beam has been generated, it is directed into auxiliary components such as bending magnets and insertion devices in storage rings and free electron lasers. These supply the strong magnetic fields perpendicular to the beam which are needed to convert high energy electrons into photons.

Photoemission spectroscopy

Photoemission spectroscopy (PES), also known as photoelectron spectroscopy, refers to energy measurement of electrons emitted from solids, gases or liquids by the photoelectric effect, in order to determine the binding energies of electrons in the substance. The term refers to various techniques, depending on whether the ionization energy is provided by X-ray, XUV or UV photons. Regardless of the incident photon beam, however, all photoelectron spectroscopy revolves around the general theme of surface analysis by measuring the ejected electrons.

Photoemission electron microscopy is a type of electron microscopy that utilizes local variations in electron emission to generate image contrast. The excitation is usually produced by ultraviolet light, synchrotron radiation or X-ray sources. PEEM measures the coefficient indirectly by collecting the emitted secondary electrons generated in the electron cascade that follows the creation of the primary core hole in the absorption process. PEEM is a surface sensitive technique because the emitted electrons originate from a shallow layer. In physics, this technique is referred to as PEEM, which goes together naturally with low-energy electron diffraction (LEED), and low-energy electron microscopy (LEEM). In biology, it is called photoelectron microscopy (PEM), which fits with photoelectron spectroscopy (PES), transmission electron microscopy (TEM), and scanning electron microscopy (SEM).

Extended X-ray absorption fine structure Measurement of X-ray absorption of a material as a function of energy

Extended X-Ray Absorption Fine Structure (EXAFS), along with X-ray Absorption Near Edge Structure (XANES), is a subset of X-ray Absorption Spectroscopy (XAS). Like other absorption spectroscopies, XAS techniques follow Beer's law. The X-ray absorption coefficient of a material as a function of energy is obtained using X-rays of a narrow energy resolution are directed at a sample and the incident and transmitted x-ray intensity is recorded as the incident x-ray energy is incremented.

X-ray absorption spectroscopy Panel of different types of X-ray absorption spectroscopy requiring a synchrotron radiation facility

X-ray absorption spectroscopy (XAS) is a widely used technique for determining the local geometric and/or electronic structure of matter. The experiment is usually performed at synchrotron radiation facilities, which provide intense and tunable X-ray beams. Samples can be in the gas phase, solutions, or solids.

Electron spectroscopy refers to a group formed by techniques based on the analysis of the energies of emitted electrons such as photoelectrons and Auger electrons. This group includes X-ray photoelectron spectroscopy (XPS), which also known as Electron Spectroscopy for Chemical Analysis (ESCA), Electron energy loss spectroscopy (EELS), Ultraviolet photoelectron spectroscopy (UPS), and Auger electron spectroscopy (AES). These analytical techniques are used to identify and determine the elements and their electronic structures from the surface of a test sample. Samples can be solids, gases or liquids.

X-ray absorption near edge structure (XANES), also known as near edge X-ray absorption fine structure (NEXAFS), is a type of absorption spectroscopy that indicates the features in the X-ray absorption spectra (XAS) of condensed matter due to the photoabsorption cross section for electronic transitions from an atomic core level to final states in the energy region of 50–100 eV above the selected atomic core level ionization energy, where the wavelength of the photoelectron is larger than the interatomic distance between the absorbing atom and its first neighbour atoms.

Characterization (materials science) Study of material structure and properties

Characterization, when used in materials science, refers to the broad and general process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science, without which no scientific understanding of engineering materials could be ascertained. The scope of the term often differs; some definitions limit the term's use to techniques which study the microscopic structure and properties of materials, while others use the term to refer to any materials analysis process including macroscopic techniques such as mechanical testing, thermal analysis and density calculation. The scale of the structures observed in materials characterization ranges from angstroms, such as in the imaging of individual atoms and chemical bonds, up to centimeters, such as in the imaging of coarse grain structures in metals.

Ultraviolet photoelectron spectroscopy (UPS) refers to the measurement of kinetic energy spectra of photoelectrons emitted by molecules which have absorbed ultraviolet photons, in order to determine molecular orbital energies in the valence region.

Fritz Haber Institute of the Max Planck Society German catalysis research institute

The Fritz Haber Institute of the Max Planck Society (FHI) is a science research institute located at the heart of the academic district of Dahlem, in Berlin, Germany.

Static secondary-ion mass spectrometry, or static SIMS is a secondary ion mass spectrometry technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or plastic with insignificant disturbance to its composition and structure. It is one of the two principal modes of operation of SIMS, which is the mass spectrometry of ionized particles emitted by a solid surface upon bombardment by energetic primary particles.

Ernst G. Bauer German-American physicist

Ernst G. Bauer is a German-American physicist known for his studies in the field of surface science. His most prominent contributions are his work on establishing thin film growth and nucleation mechanisms and his invention in 1962 of the Low Energy Electron Microscopy (LEEM), which came to fruition in 1985 in the workgroup of Ernst Bauer in Germany. In the early 90s, he extended the LEEM technique in two directions by developing Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM). He is currently Distinguished Research Professor Emeritus at the Arizona State University.

Scanning electrochemical microscopy (SECM) is a technique within the broader class of scanning probe microscopy (SPM) that is used to measure the local electrochemical behavior of liquid/solid, liquid/gas and liquid/liquid interfaces. Initial characterization of the technique was credited to University of Texas electrochemist, Allen J. Bard, in 1989. Since then, the theoretical underpinnings have matured to allow widespread use of the technique in chemistry, biology and materials science. Spatially resolved electrochemical signals can be acquired by measuring the current at an ultramicroelectrode (UME) tip as a function of precise tip position over a substrate region of interest. Interpretation of the SECM signal is based on the concept of diffusion-limited current. Two-dimensional raster scan information can be compiled to generate images of surface reactivity and chemical kinetics.

Characterization of nanoparticles Measurement of physical and chemical properties of nanoparticles

The characterization of nanoparticles is a branch of nanometrology that deals with the characterization, or measurement, of the physical and chemical properties of nanoparticles. Nanoparticles measure less than 100 nanometers in at least one of their external dimensions, and are often engineered for their unique properties. Nanoparticles are unlike conventional chemicals in that their chemical composition and concentration are not sufficient metrics for a complete description, because they vary in other physical properties such as size, shape, surface properties, crystallinity, and dispersion state.

Paul Fenter is a senior physicist and leader for Interfacial Processes Group, in the Chemical Sciences and Engineering Division at the U.S. Department of Energy’s (DOE) Argonne National Laboratory and the former director of the Center for Electrochemical Energy Science (CEES), a DOE Energy Frontier Research Center.

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Further reading