ISO/IEC JTC 1/SC 42 Artificial Intelligence is a standardization subcommittee of the Joint Technical Committee ISO/IEC JTC 1 of the International Organization for Standardization (ISO) and the International Electrotechnical Commission (IEC). [1] ISO/IEC JTC 1/SC 42 develops and facilitates the development of international standards, technical reports, and technical specifications within the fields of Artificial Intelligence (AI). [2] The international secretariat of ISO/IEC JTC 1/SC 42 is the American National Standards Institute (ANSI), located in the United States of America. The Chair of SC 42 is Wael William Diab. [3] The first meeting of the committee took place in Beijing, China in April 2018. [4] SC 42 meets face-to-face twice a year in an opening and closing plenary format with its subgroups meeting concurrently during the week. SC 42 organizes bi-annual AI workshops that target all stakeholders interested in AI and the committee's work. [5]
| Formation | 2018 |
|---|---|
| Type | Standards organization |
| Purpose | Development of worldwide standards for artificial intelligence |
Region served | Worldwide |
Chair | Wael William Diab [6] |
Committee Manager | Heather Benko [7] |
Parent organization | International Organization for Standardization (ISO) and International Electrotechnical Commission (IEC) JTC 1 |
| Website | jtc1info |
At the 32nd ISO/IEC JTC 1 Plenary in Vladivostok, Russia, Resolution 12 established SC 42 as a system integration entity for Artificial Intelligence. The resolution also appointed Mr. Wael William Diab as Chair of the SC and Ms. Heather Benko was appointed as the Committee Manager. The inaugural meeting was held in Beijing, China on April 18th – 20th. [4]
The scope of ISO/IEC JTC 1/SC 42 is: [8]
ISO/IEC JTC 1/SC 42 is set up as a Systems Integration Entity.
Membership in SC 42 is open to any national body. A member can be either participating (P) or observing (O). The current list of countries active in SC 42 include: [9]
39 p-members: Australia (SA), Austria (ASI), Azerbaijan (AZSTAND), Belgium (NBN), Canada (SCC), China (SAC), Cyprus (CYS), Democratic Republic of the Congo (OCC), Denmark (DS), Egypt (EOS), Finland (SFS), France (AFNOR), Germany (DIN), India (BIS), Ireland (NSAI), Israel (SII), Italy (UNI), Japan (JISC), Kazakhstan (KAZMEMST), Korea, Republic of (KATS), Luxembourg (ILNAS), Malaysia (DSM), Malta (MCCAA), Netherlands (NEN), Norway (SN), Philippines (BPS), Portugal (IPQ), Russian Federation (GOST R), Rwanda (RSB), Saudi Arabia (SASO), Singapore (SSC), Slovakia (UNMS SR), Spain (UNE), Sweden (SIS), Switzerland (SNV), Turkey (TSE), Uganda (UNBS), United Kingdom (BSI), United States (ANSI), Zimbabwe (SAZ).
25 o-members
ISO/IEC JTC 1/SC 42 is currently made up of five working groups, each of which carries out specific tasks in standards development within the field of Artificial Intelligence. The working groups, study groups, and advisory group of ISO/IEC JTC 1/SC 42 are: ISO/IEC JTC 1/SC 42 - Artificial intelligence
| Working Group | Title | Convenor |
|---|---|---|
| WG 1 | Foundational standards | Paul Cotton (Canada) |
| WG 2 | Big Data | David Boyd (United States) |
| WG 3 | Trustworthiness | David Filip (Ireland) |
| WG 4 | Use cases and applications | Fumihiro Maruyama (Japan) |
| WG 5 | Computational approaches and characteristics of artificial intelligence systems | Ning Sun (China) |
The subcommittee also administers a number of Joint Work Groups with other subcommittees:
| Working Group | Title | Convenor |
|---|---|---|
| JWG 2 | With ISO/IEC JTC 1/SC 7: Testing of AI-based systems | Adam Leon Smith (UK) and Stuart Reid (UK) |
| JWG 3 | With ISO/TC 215 WG: AI enabled health informatics | Shushaku Tsumoto (Japan) |
| JWG 4 | With IEC/TC 65/SC 65A: Functional safety and AI systems | Riccardo Mariani (Italy) |
ISO/IEC JTC 1/SC 42 works in close collaboration with a number of other organizations or subcommittees, both internal and external to ISO and IEC. Organizations internal to ISO or IEC that collaborate with or are in liaison to SC 42 include: [10]
JTC 1 Committees and Groups
ISO Committees
IEC Committees
Organizations external to ISO or IEC that collaborate with or are in liaison with SC 42 include:
Category A Liaisons
ISO/IEC also collaborates with CEN/CENELEC through the Vienna Agreement, [12] specifically with CEN/CENELEC JTC 21, charged with writing standards to support the EU's Artificial Intelligence Act.
ISO/IEC JTC 1/SC 42 currently has published a number of standards, as well as various other standards or technical reports under development within the field of artificial intelligence. These include: [13]
| ISO/IEC Standard | Title | Status |
|---|---|---|
| ISO/IEC 5259-1 | ISO/IEC 5259-1: Data quality for analytics and machine learning — Part 1: Overview, terminology, and examples | Published (2024) |
| ISO/IEC 5259-3 | ISO/IEC 5259-3: Data quality for analytics and machine learning — Part 3: Data quality management requirements and guidelines | Published (2024) |
| ISO/IEC 5259-4 | ISO/IEC 5259-4: Data quality for analytics and machine learning — Part 4: Data quality process framework | Published (2024) |
| ISO/IEC 8183 | ISO/IEC 8183: Data life cycle framework | Published (2023) |
| ISO/IEC TS 8200 | ISO/IEC TS 8200: Controllability of automated AI systems | Published (2024) |
| ISO/IEC 17903 | ISO/IEC 17903: Overview of machine learning computing devices | Published (2024) |
| ISO/IEC 20546 | ISO/IEC 20547-1: Big data -- Overview and vocabulary | Published (2019) |
| ISO/IEC 20547-1 | ISO/IEC 20547-1: Big data reference architecture -- Part 1: Framework and application process | Published (2020) |
| ISO/IEC 20547-2 | ISO/IEC TR 20547-2:2018 : Big data reference architecture -- Part 2: Use cases and derived requirements | Published (2018) |
| ISO/IEC 20547-3 | ISO/IEC 20547-3: Big data reference architecture -- Part 3: Reference architecture | Published (2020) |
| ISO/IEC 20547-5 | ISO/IEC TR 20547-5:2018: Big data reference architecture -- Part 5: Standards roadmap | Published (2018) |
| ISO/IEC 20546 | ISO/IEC 20546: Big data -- Overview and vocabulary | Published (2019) |
| ISO/IEC 22989 | ISO/IEC 22989: Artificial Intelligence Concepts and Terminology | Published (2022) |
| ISO/IEC 23053 | ISO/IEC 23053: Framework for Artificial Intelligence (AI) Systems Using Machine Learning (ML) | Published (2022) |
| ISO/IEC 23894 | ISO/IEC 23894: Artificial intelligence - Guidance on risk management [14] | Published (2023) |
| ISO/IEC TR 24027 | ISO/IEC TR 24027: Bias in AI systems and AI aided decision making [15] | Published (2021) |
| ISO/IEC TR 24028 | ISO/IEC TR 24028: Overview of trustworthiness in artificial intelligence | Published (2020) |
| ISO/IEC TR 24368 | ISO/IEC TR 24368: Overview of ethical and societal concerns [16] | Published (2022) |
| ISO/IEC 24668 | ISO/IEC 24668: Process management framework for big data analytics | Published (2022) |
| ISO/IEC TS 4213 | ISO/IEC TS 4213: Assessment of Machine Learning Classification Performance [17] | Published (2022) |
| ISO/IEC 24029-1 | ISO/IEC TR 24029-1: Assessment of the robustness of neural networks — Part 1: Overview | Published (2021) |
| ISO/IEC 24029-2 | ISO/IEC 24029-2: Assessment of the robustness of neural networks — Part 2: Methodology for the use of formal methods [18] | Published (2023) |
| ISO/IEC 24030 | ISO/IEC 24030: AI use cases | Published (2024) |
| ISO/IEC TS 25058 | ISO/IEC TS 25058: Systems and software Quality Requirements and Evaluation (SQuaRE) - Guidance for quality evaluation of AI systems | Published (2024) |
| ISO/IEC 25059 | ISO/IEC 25059: Systems and software Quality Requirements and Evaluation (SQuaRE) - Quality model for AI systems [19] | Published (2023) |
| ISO/IEC 42001 | ISO/IEC 42001: AI management system [20] | Published (2023) |
| ISO/IEC 5338 | ISO/IEC 5338: AI system life cycle processes | Published (2023) |
| ISO/IEC 5339 | ISO/IEC 5339: Guidance for AI applications | Published (2024) |
| ISO/IEC 5392 | ISO/IEC 5392: Reference architecture of knowledge engineering | Published (2024) |
| ISO/IEC 5469 | ISO/IEC 5469: Functional safety and AI systems | Published (2024) |
In 2023, the ISO/IEC JTC 1/SC 42 has won ISO's Lawrence D. Eicher Award. [21] [22] [23]