| Discipline | Microlithography, nanolithography, metrology | 
|---|---|
| Language | English | 
| Edited by | Harry Levinson | 
| Publication details | |
Former name(s)  | 
  | 
| History | 2002–present | 
| Publisher | |
| Frequency | Quarterly | 
| 3.4 (2023) | |
| Standard abbreviations | |
| ISO 4 | J. Micro/Nanopatterning Mater. Metrol. | 
| Indexing | |
| CODEN | JMMMIH | 
| ISSN |  1932-5150  (print) 2708-8340 (web)  | 
| OCLC no. | 1249108189 | 
| Links | |
Journal of Micro/Nanopatterning, Materials, and Metrology is a peer-reviewed scientific journal published quarterly by SPIE. It covers science, development, and practice of micro and nanofabrication processes and metrology. [1] Established in 2002 under the name Journal of Microlithography, Microfabrication, and Microsystems, it was subsequently retitled to Journal of Micro/Nanolithography, MEMS, and MOEMS in 2007. The journal title was changed to its current name in 2021. [2]
The editor-in-chief of the journal is Harry Levinson (HJL Lithography). [1]
The journal is abstracted and indexed in:
According to the Journal Citation Reports , the journal has a 2023 impact factor of 3.4. [8]