Chalcogenide chemical vapour deposition

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Chalcogenide chemical vapor deposition is a proposed technology for depositing thin films of chalcogenides, i.e. materials derived from sulfides, selenides, and tellurides. Conventional CVD can be used to deposit films of most metals, many non-metallic elements (notably silicon) as well as a wide range of compounds including carbides, nitrides, oxides. CVD can also be used to synthesize chalcogenide glasses. [1]

Contents

Sulfide based thin films

The fabrication of chalcogenide thin films is a topic of research. [2] For example, routes to germanium disulfide films could entail germanium chloride and hydrogen sulphide:

GeCl4 (g) + 2 H2S(g) → GeS2(s) + 4 HCl (g)

Alternatively via plasma enhanced CVD there is the reaction GeH4/H2S. [3] [4]

Germanium sulfide CVD setup GeS CVD setup.png
Germanium sulfide CVD setup

Telluride based thin films

Phase change random access memory (PCRAM) has attracted considerable interest as a candidate for non-volatile devices for higher density and operation speed. [6] [7] The ternary Ge2Sb2Te5 (GST) compound is widely regarded as the most viable and practical phase change family of materials for this application. [8] CVD techniques have been applied to deposit GST materials in sub micron cell pores. [9] Challenges include the need to control device to device variability and undesirable changes in the phase change material that can be induced by the fabrication procedure. A confined cell structure where the phase change material is formed inside a contact via is expected to be essential for the next generation PCRAM device because it requires lower switching power. [10] This structure however requires more complex deposition of the active chalcogenide into a cell pore. CVD techniques could provide better performance and enable the production of thin films with superior quality compared to those obtained by sputtering, especially in terms of conformality, coverage, and stoichiometry control, and allows implementation of phase-change films in nanoelectronic devices. In addition, CVD deposition is well known to provide higher purity materials and provides the scope for new phase change materials with optimized properties to be deposited.

The CVD apparatus for Ge-Sb-Te thin film deposition is shown schematically to the right.

Schematic diagram of CVD system used for Ge-Sb-Te thin film deposition GST CVD setup.tif
Schematic diagram of CVD system used for Ge-Sb-Te thin film deposition

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<span class="mw-page-title-main">Germanium</span> Chemical element with atomic number 32 (Ge)

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<span class="mw-page-title-main">Germanium telluride</span> Chemical compound

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<span class="mw-page-title-main">Isobutylgermane</span> Chemical compound

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<span class="mw-page-title-main">Tantalum(V) ethoxide</span> Chemical compound

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Gallium lanthanum sulfide glass is the name of a family of chalcogenide glasses, referred to as gallium lanthanum sulfide (Ga-La-S) glasses. They are mixtures of La2S3, La2O3, and Ga2S3, which form the basic glass with other glass modifiers added as needed. Gallium-lanthanum-sulfide glasses have a wide range of vitreous formation centered around a 70% Ga2S3 : 30% La2S3 mixture, and readily accept other modifier materials into their structure. This means that Ga-La-S composition can be adjusted to give a wide variety of optical and physical properties.

<span class="mw-page-title-main">Tungsten diselenide</span> Chemical compound

Tungsten diselenide is an inorganic compound with the formula WSe2. The compound adopts a hexagonal crystalline structure similar to molybdenum disulfide. The tungsten atoms are covalently bonded to six selenium ligands in a trigonal prismatic coordination sphere while each selenium is bonded to three tungsten atoms in a pyramidal geometry. The tungsten–selenium bond has a length of 0.2526 nm, and the distance between selenium atoms is 0.334 nm. It is a well studied example of a layered material. The layers stack together via van der Waals interactions. WSe2 is a very stable semiconductor in the group-VI transition metal dichalcogenides.

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<span class="mw-page-title-main">Low-energy plasma-enhanced chemical vapor deposition</span>

Low-energy plasma-enhanced chemical vapor deposition (LEPECVD) is a plasma-enhanced chemical vapor deposition technique used for the epitaxial deposition of thin semiconductor films. A remote low energy, high density DC argon plasma is employed to efficiently decompose the gas phase precursors while leaving the epitaxial layer undamaged, resulting in high quality epilayers and high deposition rates.

<span class="mw-page-title-main">Beta-tungsten</span> Metastable phase of tungsten

Beta-tungsten (β-W) is a metastable phase of tungsten widely observed in tungsten thin films. While the commonly existing stable alpha-tungsten (α-W) has a body-centered cubic (A2) structure, β-W adopts the topologically close-packed A15 structure containing eight atoms per unit cell, and it irreversibly transforms to the stable α phase through thermal annealing of up to 650 °C. It has been found that β-W possesses the giant spin Hall effect, wherein the applied charge current generates a transverse spin current, and this leads to potential applications in magnetoresistive random access memory devices.

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