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Analytical chemistry studies and uses instruments and methods to separate, identify, and quantify matter. In practice, separation, identification or quantification may constitute the entire analysis or be combined with another method. Separation isolates analytes. Qualitative analysis identifies analytes, while quantitative analysis determines the numerical amount or concentration.
Spectroscopy is the field of study that measures and interprets the electromagnetic spectra that result from the interaction between electromagnetic radiation and matter as a function of the wavelength or frequency of the radiation. Matter waves and acoustic waves can also be considered forms of radiative energy, and recently gravitational waves have been associated with a spectral signature in the context of the Laser Interferometer Gravitational-Wave Observatory (LIGO)
X-ray fluorescence (XRF) is the emission of characteristic "secondary" X-rays from a material that has been excited by being bombarded with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science, archaeology and art objects such as paintings.
Mass spectrometry (MS) is an analytical technique that is used to measure the mass-to-charge ratio of ions. The results are presented as a mass spectrum, a plot of intensity as a function of the mass-to-charge ratio. Mass spectrometry is used in many different fields and is applied to pure samples as well as complex mixtures.
Atomic spectroscopy is the study of the electromagnetic radiation absorbed and emitted by atoms. Since unique elements have characteristic (signature) spectra, atomic spectroscopy, specifically the electromagnetic spectrum or mass spectrum, is applied for determination of elemental compositions. It can be divided by atomization source or by the type of spectroscopy used. In the latter case, the main division is between optical and mass spectrometry. Mass spectrometry generally gives significantly better analytical performance, but is also significantly more complex. This complexity translates into higher purchase costs, higher operational costs, more operator training, and a greater number of components that can potentially fail. Because optical spectroscopy is often less expensive and has performance adequate for many tasks, it is far more common. Atomic absorption spectrometers are one of the most commonly sold and used analytical devices.
Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions. The mass/charge ratios of these secondary ions are measured with a mass spectrometer to determine the elemental, isotopic, or molecular composition of the surface to a depth of 1 to 2 nm. Due to the large variation in ionization probabilities among elements sputtered from different materials, comparison against well-calibrated standards is necessary to achieve accurate quantitative results. SIMS is the most sensitive surface analysis technique, with elemental detection limits ranging from parts per million to parts per billion.
Energy-dispersive X-ray spectroscopy, sometimes called energy dispersive X-ray analysis or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and a sample. Its characterization capabilities are due in large part to the fundamental principle that each element has a unique atomic structure allowing a unique set of peaks on its electromagnetic emission spectrum. The peak positions are predicted by the Moseley's law with accuracy much better than experimental resolution of a typical EDX instrument.
X-ray spectroscopy is a general term for several spectroscopic techniques for characterization of materials by using x-ray radiation.
A microprobe is an instrument that applies a stable and well-focused beam of charged particles to a sample.
Elemental analysis is a process where a sample of some material is analyzed for its elemental and sometimes isotopic composition. Elemental analysis can be qualitative, and it can be quantitative. Elemental analysis falls within the ambit of analytical chemistry, the instruments involved in deciphering the chemical nature of our world.
Pittcon Editors’ Awards honoured the best new products on show at the Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, or Pittcon, for 20 years from 1996 having been established by Dr Gordon Wilkinson, managing editor of Analytical Instrument Industry Report. On 8 March 2015, the event returned to the Morial Convention Center in New Orleans and this was the last occasion when the awards were presented.
Instrumental analysis is a field of analytical chemistry that investigates analytes using scientific instruments.
Malvern Panalytical is a Spectris plc company. The company is a manufacturer and supplier of laboratory analytical instruments. It has been influential in the development of the Malvern Correlator, and it remains notable for its work in the advancement of particle sizing technology. The company produces technology for materials analysis and principal instruments designed to measure the size, shape and charge of particles. Additional areas of development include equipment for rheology measurements, chemical imaging and chromatography. In 2017, they merged with PANalytical to form Malvern Panalytical Ltd.
The computed tomography imaging spectrometer (CTIS) is a snapshot imaging spectrometer which can produce in fine the three-dimensional hyperspectral datacube of a scene.
AMETEK, Inc. is an American multinational conglomerate and global designer and manufacturer of electronic instruments and electromechanical devices with headquarters in the United States and over 220 sites worldwide.
CAMECA is a manufacturer of scientific instruments, namely material analysis instruments based on Charged particle beam, ions, or electrons.
Resonance ionization is a process in optical physics used to excite a specific atom beyond its ionization potential to form an ion using a beam of photons irradiated from a pulsed laser light. In resonance ionization, the absorption or emission properties of the emitted photons are not considered, rather only the resulting excited ions are mass-selected, detected and measured. Depending on the laser light source used, one electron can be removed from each atom so that resonance ionization produces an efficient selectivity in two ways: elemental selectivity in ionization and isotopic selectivity in measurement.
SEM-XRF is an established technical term for adding a X-ray generator to a Scanning Electron Microscope (SEM). Technological progress in the fields of small-spot low-power X-ray tubes and of polycapillary X-ray optics has enabled the development of compact micro-focus X-ray sources that can be attached to a SEM equipped for energy-dispersive X-ray spectroscopy.