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X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect that can identify the elements that exist within a material or are covering its surface, as well as their chemical state, and the overall electronic structure and density of the electronic states in the material. XPS is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to. The technique can be used in line profiling of the elemental composition across the surface, or in depth profiling when paired with ion-beam etching. It is often applied to study chemical processes in the materials in their as-received state or after cleavage, scraping, exposure to heat, reactive gasses or solutions, ultraviolet light, or during ion implantation.
X-ray fluorescence (XRF) is the emission of characteristic "secondary" X-rays from a material that has been excited by being bombarded with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science, archaeology and art objects such as paintings
The Geiger–Müller tube or G–M tube is the sensing element of the Geiger counter instrument used for the detection of ionizing radiation. It was named after Hans Geiger, who invented the principle in 1908, and Walther Müller, who collaborated with Geiger in developing the technique further in 1928 to produce a practical tube that could detect a number of different radiation types.
A scintillation counter is an instrument for detecting and measuring ionizing radiation by using the excitation effect of incident radiation on a scintillating material, and detecting the resultant light pulses.
An avalanche photodiode (APD) is a highly sensitive semiconductor photodiode that exploits the photoelectric effect to convert light into electricity. From a functional standpoint, they can be regarded as the semiconductor analog of photomultipliers. The avalanche photodiode (APD) was invented by Japanese engineer Jun-ichi Nishizawa in 1952. However, study of avalanche breakdown, microplasma defects in Silicon and Germanium and the investigation of optical detection using p-n junctions predate this patent. Typical applications for APDs are laser rangefinders, long-range fiber-optic telecommunication, and quantum sensing for control algorithms. New applications include positron emission tomography and particle physics. APD arrays are becoming commercially available, also lightning detection and optical SETI may be future applications. It has been discovered in 2020 that adding graphene layer can prevent degradation over time to keep avalanche photodiodes like new, which is important in shrinking their size and costs for many diverse applications & bringing devices out of vacuum tubes into digital age.
A scintillator is a material that exhibits scintillation, the property of luminescence, when excited by ionizing radiation. Luminescent materials, when struck by an incoming particle, absorb its energy and scintillate. Sometimes, the excited state is metastable, so the relaxation back down from the excited state to lower states is delayed. The process then corresponds to one of two phenomena: delayed fluorescence or phosphorescence. The correspondence depends on the type of transition and hence the wavelength of the emitted optical photon.
Energy-dispersive X-ray spectroscopy, sometimes called energy dispersive X-ray analysis or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and a sample. Its characterization capabilities are due in large part to the fundamental principle that each element has a unique atomic structure allowing a unique set of peaks on its electromagnetic emission spectrum. The peak positions are predicted by the Moseley's law with accuracy much better than experimental resolution of a typical EDX instrument.
A semiconductor detector in ionizing radiation detection physics is a device that uses a semiconductor to measure the effect of incident charged particles or photons.
The proportional counter is a type of gaseous ionization detector device used to measure particles of ionizing radiation. The key feature is its ability to measure the energy of incident radiation, by producing a detector output pulse that is proportional to the radiation energy absorbed by the detector due to an ionizing event; hence the detector's name. It is widely used where energy levels of incident radiation must be known, such as in the discrimination between alpha and beta particles, or accurate measurement of X-ray radiation dose.
A wire chamber or multi-wire proportional chamber is a type of proportional counter that detects charged particles and photons and can give positional information on their trajectory, by tracking the trails of gaseous ionization.
X-ray spectroscopy is a general term for several spectroscopic techniques for characterization of materials by using x-ray excitation.
Photodetectors, also called photosensors, are sensors of light or other electromagnetic radiation. There is a wide variety of photodetectors which may be classified by mechanism of detection, such as photoelectric or photochemical effects, or by various performance metrics, such as spectral response. Semiconductor-based photodetectors typically have a p–n junction that converts light photons into current. The absorbed photons make electron–hole pairs in the depletion region. Photodiodes and phototransistors are a few examples of photodetectors. Solar cells convert some of the light energy absorbed into electrical energy.
An electron microprobe (EMP), also known as an electron probe microanalyzer (EPMA) or electron micro probe analyzer (EMPA), is an analytical tool used to non-destructively determine the chemical composition of small volumes of solid materials. It works similarly to a scanning electron microscope: the sample is bombarded with an electron beam, emitting x-rays at wavelengths characteristic to the elements being analyzed. This enables the abundances of elements present within small sample volumes to be determined, when a conventional accelerating voltage of 15-20 kV is used. The concentrations of elements from lithium to plutonium may be measured at levels as low as 100 parts per million (ppm), material dependent, although with care, levels below 10 ppm are possible The ability to quantify lithium by EPMA became a reality in 2008.
Gamma-ray spectroscopy is the quantitative study of the energy spectra of gamma-ray sources, such as in the nuclear industry, geochemical investigation, and astrophysics.
Gaseous ionization detectors are radiation detection instruments used in particle physics to detect the presence of ionizing particles, and in radiation protection applications to measure ionizing radiation.
Lanthanum(III) bromide (LaBr3) is an inorganic halide salt of lanthanum. When pure, it is a colorless white powder. The single crystals of LaBr3 are hexagonal crystals with melting point of 783 °C. It is highly hygroscopic and water-soluble. There are several hydrates, La3Br·x H2O, of the salt also known. It is often used as a source of lanthanum in chemical synthesis and as a scintillation material in certain applications.
X-ray astronomy detectors are instruments that detect X-rays for use in the study of X-ray astronomy.
X-ray detectors are devices used to measure the flux, spatial distribution, spectrum, and/or other properties of X-rays.
Hybrid pixel detectors are a type of ionizing radiation detector consisting of an array of diodes based on semiconductor technology and their associated electronics. The term “hybrid” stems from the fact that the two main elements from which these devices are built, the semiconductor sensor and the readout chip, are manufactured independently and later electrically coupled by means of a bump-bonding process. Ionizing particles are detected as they produce electron-hole pairs through their interaction with the sensor element, usually made of doped silicon or cadmium telluride. The readout ASIC is segmented into pixels containing the necessary electronics to amplify and measure the electrical signals induced by the incoming particles in the sensor layer.