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Fault coverage refers to the percentage of some type of fault that can be detected during the test of any engineered system. High fault coverage is particularly valuable during manufacturing test, and techniques such as Design For Test (DFT) and automatic test pattern generation are used to increase it.
In digital electronics, fault coverage refers to stuck-at fault coverage. [1] It is measured by sticking each pin of the hardware model at logic '0' and logic '1', respectively, and running the test vectors. If at least one of the outputs differs from what is to be expected, the fault is said to be detected. Conceptually, the total number of simulation runs is twice the number of pins (since each pin is stuck in one of two ways, and both faults should be detected). However, there are many optimizations that can reduce the needed computation. In particular, often many non-interacting faults can be simulated in one run, and each simulation can be terminated as soon as a fault is detected.
A fault coverage test passes when at least a specified percentage of all possible faults can be detected. If it does not pass, at least three options are possible. First, the designer can augment or otherwise improve the vector set, perhaps by using a more effective automatic test pattern generation tool. Second, the circuit may be re-defined for better fault detectability (improved controllability and observability). Third, the designer may simply accept the lower coverage.
Digital electronics is a field of electronics involving the study of digital signals and the engineering of devices that use or produce them. This is in contrast to analog electronics which work primarily with analog signals. Despite the name, digital electronics designs includes important analog design considerations.
VHDL is a hardware description language that can model the behavior and structure of digital systems at multiple levels of abstraction, ranging from the system level down to that of logic gates, for design entry, documentation, and verification purposes. The language was developed for the US military VHSIC program in the 1980s, and has been standardized by the Institute of Electrical and Electronics Engineers (IEEE) as IEEE Std 1076; the latest version of which is IEEE Std 1076-2019. To model analog and mixed-signal systems, an IEEE-standardized HDL based on VHDL called VHDL-AMS has been developed.
In computer engineering, a hardware description language (HDL) is a specialized computer language used to describe the structure and behavior of electronic circuits, most commonly to design ASICs and program FPGAs.
Electronic design automation (EDA), also referred to as electronic computer-aided design (ECAD), is a category of software tools for designing electronic systems such as integrated circuits and printed circuit boards. The tools work together in a design flow that chip designers use to design and analyze entire semiconductor chips. Since a modern semiconductor chip can have billions of components, EDA tools are essential for their design; this article in particular describes EDA specifically with respect to integrated circuits (ICs).
ATPG is an electronic design automation method or technology used to find an input sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, or to assist with determining the cause of failure. The effectiveness of ATPG is measured by the number of modeled defects, or fault models, detectable and by the number of generated patterns. These metrics generally indicate test quality and test application time. ATPG efficiency is another important consideration that is influenced by the fault model under consideration, the type of circuit under test, the level of abstraction used to represent the circuit under test, and the required test quality.
A fault model is an engineering model of something that could go wrong in the construction or operation of a piece of equipment. From the model, the designer or user can then predict the consequences of this particular fault. Fault models can be used in almost all branches of engineering.
Boundary scan is a method for testing interconnects on printed circuit boards or sub-blocks inside an integrated circuit. Boundary scan is also widely used as a debugging method to watch integrated circuit pin states, measure voltage, or analyze sub-blocks inside an integrated circuit.
A stuck-at fault is a particular fault model used by fault simulators and automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical '1', '0' and 'X'. For example, an input is tied to a logical 1 state during test generation to assure that a manufacturing defect with that type of behavior can be found with a specific test pattern. Likewise the input could be tied to a logical 0 to model the behavior of a defective circuit that cannot switch its output pin. Not all faults can be analyzed using the stuck-at fault model. Compensation for static hazards, namely branching signals, can render a circuit untestable using this model. Also, redundant circuits cannot be tested using this model, since by design there is no change in any output as a result of a single fault.
SystemVerilog, standardized as IEEE 1800, is a hardware description and hardware verification language used to model, design, simulate, test and implement electronic systems. SystemVerilog is based on Verilog and some extensions, and since 2008, Verilog is now part of the same IEEE standard. It is commonly used in the semiconductor and electronic design industry as an evolution of Verilog.
Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning.
Integrated circuit design, semiconductor design, chip design or IC design, is a sub-field of electronics engineering, encompassing the particular logic and circuit design techniques required to design integrated circuits, or ICs. ICs consist of miniaturized electronic components built into an electrical network on a monolithic semiconductor substrate by photolithography.
Runtime verification is a computing system analysis and execution approach based on extracting information from a running system and using it to detect and possibly react to observed behaviors satisfying or violating certain properties. Some very particular properties, such as datarace and deadlock freedom, are typically desired to be satisfied by all systems and may be best implemented algorithmically. Other properties can be more conveniently captured as formal specifications. Runtime verification specifications are typically expressed in trace predicate formalisms, such as finite state machines, regular expressions, context-free patterns, linear temporal logics, etc., or extensions of these. This allows for a less ad-hoc approach than normal testing. However, any mechanism for monitoring an executing system is considered runtime verification, including verifying against test oracles and reference implementations. When formal requirements specifications are provided, monitors are synthesized from them and infused within the system by means of instrumentation. Runtime verification can be used for many purposes, such as security or safety policy monitoring, debugging, testing, verification, validation, profiling, fault protection, behavior modification, etc. Runtime verification avoids the complexity of traditional formal verification techniques, such as model checking and theorem proving, by analyzing only one or a few execution traces and by working directly with the actual system, thus scaling up relatively well and giving more confidence in the results of the analysis, at the expense of less coverage. Moreover, through its reflective capabilities runtime verification can be made an integral part of the target system, monitoring and guiding its execution during deployment.
Functional verification is the task of verifying that the logic design conforms to specification. Functional verification attempts to answer the question "Does this proposed design do what is intended?" This is complex and takes the majority of time and effort in most large electronic system design projects. Functional verification is a part of more encompassing design verification, which, besides functional verification, considers non-functional aspects like timing, layout and power.
Scan chain is a technique used in design for testing. The objective is to make testing easier by providing a simple way to set and observe every flip-flop in an IC.The basic structure of scan include the following set of signals in order to control and observe the scan mechanism.
Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current (Idd) in the quiescent state. The current consumed in the state is commonly called Iddq for Idd (quiescent) and hence the name.
In computer science, fault injection is a testing technique for understanding how computing systems behave when stressed in unusual ways. This can be achieved using physical- or software-based means, or using a hybrid approach. Widely studied physical fault injections include the application of high voltages, extreme temperatures and electromagnetic pulses on electronic components, such as computer memory and central processing units. By exposing components to conditions beyond their intended operating limits, computing systems can be coerced into mis-executing instructions and corrupting critical data.
Model-based design (MBD) is a mathematical and visual method of addressing problems associated with designing complex control, signal processing and communication systems. It is used in many motion control, industrial equipment, aerospace, and automotive applications. Model-based design is a methodology applied in designing embedded software.
In computing, an emulator is hardware or software that enables one computer system to behave like another computer system. An emulator typically enables the host system to run software or use peripheral devices designed for the guest system. Emulation refers to the ability of a computer program in an electronic device to emulate another program or device.
Intelligent Verification, including intelligent testbench automation, is a form of functional verification of electronic hardware designs used to verify that a design conforms to specification before device fabrication. Intelligent verification uses information derived from the design and specification(s) to expose bugs in and between hardware IPs. Intelligent verification tools require considerably less engineering effort and user guidance to achieve verification results that meet or exceed the standard approach of writing a testbench program.
Test compression is a technique used to reduce the time and cost of testing integrated circuits. The first ICs were tested with test vectors created by hand. It proved very difficult to get good coverage of potential faults, so Design for testability (DFT) based on scan and automatic test pattern generation (ATPG) were developed to explicitly test each gate and path in a design. These techniques were very successful at creating high-quality vectors for manufacturing test, with excellent test coverage. However, as chips got bigger and more complex the ratio of logic to be tested per pin increased dramatically, and the volume of scan test data started causing a significant increase in test time, and required tester memory. This raised the cost of testing.