MIL-PRF-38535

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MIL-PRF-38535 [1] is a United States military specification that establishes the general performance and verification requirements of single die integrated circuit device type electronics. It is a performance-based specification document defining the general requirements, as well as the quality assurance and reliability requirements, for the manufacture of microelectronic or integrated circuits used in military applications and high-reliability microcircuit application programs. [2]

Contents

Origins and Evolution

The specification provides the device manufacturer with the flexibility to implement best commercial practices while still providing a product that meets military performance needs. [3] To be granted such privilege, a manufacturer must be certified pursuant to the Qualified Products List (QPL) and the Qualified Manufacturer List (QML) programs. [4] Developed in 1995 pursuant to DoD 4120.24M, [5] the QPL/QML program moved defense procurement processes away from the use of strict detail specifications to a newer system based on industry practices.

Specification Overview

MIL-PRF-38535 allows the device manufacturer the flexibility to implement best commercial practices while still providing a product that meets military performance needs.

Document Structure

As a performance specification, the document provides the device manufacturers with an acceptable established baseline to support Government microcircuit application and logistic programs. The basic section of this specification has been structured as a performance specification, which is supplemented with detailed appendices. These appendices provide guidance to manufacturers on demonstrated successful approaches to meeting military performance needs. These appendices are included as a benchmark and are intended to impose performance requirements. For QML microcircuits the manufacturer developed a program plan that meets the performance detailed in these appendices. Appendix A is mandatory for manufacturers of device types supplied in compliance with MIL-STD-883 and forms the basis for QML classes Q and V. Appendix B is intended for space application and is required for V level devices. Appendix C is mandatory for devices requiring RHA. Appendix D is mandatory for statistical sampling, life test, and qualification procedures used with microcircuits.

RHA levels

The specification defines some high dose rate TID total dose Radiation Hardness Assurance levels:

Letter Designator rad level Gray levelnotes
-RadTolerant only
1 krad10 Gyno designator
M3 krad30 Gy
5 krad50 Gyno designator
D10 krad100 Gy
P30 krad300 Gy
L50 krad500 Gy
R100 krad1 kGy
F300 krad3 kGy
G500 krad5 kGy
H1 Mrad10 kGy

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References

  1. "MIL-PRF-38535J, Performance Specification, Integrated Circuits (Microcircuits) Manufacturing, General Specification for". Department of Defense. 28 December 2010. Retrieved 4 June 2012.
  2. "Mil-PRF-38535". Defense Logistics Agency (DLA) Land and Maritime. Archived from the original on 18 February 2013. Retrieved 5 June 2012.
  3. "Mil-PRF-38535 Standard". siliconfareast.com. Retrieved 4 June 2012.
  4. "SD-6, Provisions Governing Qualification: Qualified Products Lists and Qualified Manufacturers Lists". United States Department of Defense – Defense Standardization Program. February 2009. Retrieved 5 June 2012.
  5. "DoD 4120.24-M – DSP Policies and Procedures ". Office of the Undersecretary of Defense (Acquisition, Technology and Logistics). March 2000. Archived from the original on 1 August 2012. Retrieved 5 June 2012.
  6. Winokur, P.S.; Sexton, F.W.; Fleetwood, D.M.; Terry, M.D.; Shaneyfelt, M.R.; Dressendorfer, P.V.; Schwank, J.R. (1990). "Implementing QML for radiation hardness assurance". IEEE Transactions on Nuclear Science. 37 (6): 1794–1805. doi:10.1109/23.101193. ISSN   0018-9499.