Archibald Howie | |
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Born | 8 March 1934 |
Nationality | British |
Alma mater | University of Edinburgh Trinity College, Cambridge [1] |
Known for | Interpretation of transmission electron microscope images |
Awards | Hughes Medal (1988) Guthrie Medal and Prize (1992) Royal Medal (1999) John Cowley Medal (2018) [2] |
Scientific career | |
Fields | Physics |
Institutions | University of Cambridge Cavendish Laboratory |
Notable students |
Archibald "Archie" Howie (born 8 March 1934) [1] is a British physicist and Emeritus Professor at the University of Cambridge, known for his pioneering work on the interpretation of transmission electron microscope images of crystals. Born in 1934, he attended Kirkcaldy High School and the University of Edinburgh. He received his PhD [3] from the University of Cambridge, where he subsequently took up a permanent post. He has been a fellow of Churchill College since its foundation, and was President of its Senior Combination Room (SCR) until 2010.
In 1965, with Hirsch, Whelan, Pashley and Nicholson, he published the seminal text Electron Microscopy of Thin Crystals. [4] He was elected to the Royal Society in 1978 and awarded their Royal Medal in 1999. In 1992 he was awarded the Guthrie Medal and Prize. He was elected an Honorary Fellow of the Royal Society of Edinburgh in 1995. [5] He was head of the Cavendish Laboratory from 1989 to 1997.
Electron diffraction is a generic term for phenomena associated with changes in the direction of electron beams due to elastic interactions with atoms. It occurs due to elastic scattering, when there is no change in the energy of the electrons. The negatively charged electrons are scattered due to Coulomb forces when they interact with both the positively charged atomic core and the negatively charged electrons around the atoms. The resulting map of the directions of the electrons far from the sample is called a diffraction pattern, see for instance Figure 1. Beyond patterns showing the directions of electrons, electron diffraction also plays a major role in the contrast of images in electron microscopes.
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Sir Peter Bernhard Hirsch HonFRMS FRS is a British metallurgist who has made fundamental contributions to the application of transmission electron microscopy to metals.
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Weak beam dark field (WBDF) microscopy is a type of transmission electron microscopy (TEM) dark field imaging technique that allows for the visualization of crystal defects with high resolution and contrast. Specifically, the technique is mainly used to study crystal defects such as dislocations, stacking faults, and interfaces in crystalline materials. WBDF is a valuable tool for studying the microstructure of materials, as it can provide detailed information about the nature and distribution of defects in crystals. These characteristics can have a significant impact on material properties such as strength, ductility, and corrosion resistance.