Elyse Rosenbaum

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Elyse Rosenbaum is an American electrical engineer, the Melvin and Anne Louise Hassebrock Professor in Electrical and Computer Engineering at the University of Illinois Urbana-Champaign, and the director of the Center for Advanced Electronics through Machine Learning. [1] Her research involves the reliability of integrated circuits, including modeling the effects of heat, electrostatic discharges, aging, and other forms of stress on semiconductor-based circuit components. [2]

Contents

Education and career

Rosenbaum earned a bachelor's degree from Cornell University and a master's degree from Stanford University, in 1984 and 1985 respectively, [3] and became a researcher at Bell Labs. [2] Returning to graduate study, she completed a Ph.D. in 1992 at the University of California, Berkeley. [1] Her dissertation, Thin oxide reliability in integrated circuits, was supervised by Chenming Hu. [3]

She has been a faculty member at the University of Illinois Urbana-Champaign since 1992, [2] and was named Melvin and Anne Louise Hassebrock Professor in 2016. [1]

Recognition

Rosenbaum was named an IEEE Fellow in 2011, "for contributions to electrostatic discharge reliability of integrated circuits". [4]

She received the Industry Pioneer Award in 2017, at the 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD). [5]

Related Research Articles

<span class="mw-page-title-main">Electrostatic discharge</span> Sudden flow of electric current between two electrically charged objects by contact

Electrostatic discharge (ESD) is a sudden and momentary flow of electric current between two differently-charged objects when brought close together or when the dielectric between them breaks down, often creating a visible spark associated with the static electricity between the objects.

<span class="mw-page-title-main">Electrostatic-sensitive device</span> Components that can be damaged by electrostatic discharges

An electrostatic-sensitive device is any component which can be damaged by common static charges which build up on people, tools, and other non-conductors or semiconductors. ESD commonly also stands for electrostatic discharge.

ggNMOS Electrostatic discharge (ESD) protection device

Grounded-gate NMOS, commonly known as ggNMOS, is an electrostatic discharge (ESD) protection device used within CMOS integrated circuits (ICs). Such devices are used to protect the inputs and outputs of an IC, which can be accessed off-chip and are therefore subject to ESD when touched. An ESD event can deliver a large amount of energy to the chip, potentially destroying input/output circuitry; a ggNMOS device or other ESD protective devices provide a safe path for current to flow, instead of through more sensitive circuitry. ESD protection by means of such devices or other techniques is important to product reliability: 35% of all IC failures in the field are associated with ESD damage.

Wen-mei Hwu is a Senior Director of Research and Senior Distinguished Research Scientist at NVIDIA Corporation as well as the Walter J. Sanders III-AMD Endowed Chair Professor Emeritus in Electrical and Computer Engineering at the University of Illinois at Urbana-Champaign. His research is on computer architecture, computer microarchitecture, and parallel processing. He is a principal investigator for the petascale Blue Waters supercomputer, is co-director of the Universal Parallel Computing Research Center (UPCRC), and is principal investigator for the first NVIDIA CUDA Center of Excellence at UIUC. At the Illinois Coordinated Science Lab, Hwu leads the IMPACT Research Group and is director of the OpenIMPACT project – which has delivered new compiler and computer architecture technologies to the computer industry since 1987. From 1997 to 1999, Hwu served as the chairman of the Computer Engineering Program at Illinois. Since 2009, Hwu has served as chief technology officer at MulticoreWare Inc., leading the development of compiler tools for heterogeneous platforms. The OpenCL compilers developed by his team at MulticoreWare are based on the LLVM framework and have been deployed by leading semiconductor companies. In 2020, Hwu retired after serving 33 years in University of Illinois at Urbana-Champaign. Currently, Hwu is a Senior Distinguished Research Scientist at Nvidia Research and Emeritus Professor at University of Illinois at Urbana-Champaign.

<span class="mw-page-title-main">Antistatic device</span> Device that reduces or inhibits electrostatic discharge

An antistatic device is any device that reduces, dampens, or otherwise inhibits electrostatic discharge, or ESD, which is the buildup or discharge of static electricity. ESD can damage electrical components such as computer hard drives, and even ignite flammable liquids and gases.

Chih-Tang "Tom" Sah is a Chinese-American electronics engineer and condensed matter physicist. He is best known for inventing CMOS logic with Frank Wanlass at Fairchild Semiconductor in 1963. CMOS is used in nearly all modern very large-scale integration (VLSI) semiconductor devices.

Transmission-Line Pulse (TLP) is a way to study integrated circuit technologies and circuit behavior in the current and time domain of electrostatic-discharge (ESD) events. The concept was described shortly after WWII in pp. 175–189 of Pulse Generators, Vol. 5 of the MIT Radiation Lab Series. Also, D. Bradley, J. Higgins, M. Key, and S. Majumdar realized a TLP-based laser-triggered spark gap for kilovolt pulses of accurately variable timing in 1969. For investigation of ESD and electrical-overstress (EOS) effects a measurement system using a TLP generator has been introduced first by T. Maloney and N. Khurana in 1985. Since then, the technique has become indispensable for integrated circuit ESD protection development.

Sung-Mo "Steve" Kang is an American electrical engineering scientist, professor, writer, inventor, entrepreneur and 15th president of KAIST. Kang was appointed as the second chancellor of the University of California, Merced in 2007. He was the first department head of foreign origin at the electrical and computer engineering department at the University of Illinois at Urbana-Champaign and Dean of the Baskin School of Engineering at UC Santa Cruz. Kang teaches and has written extensively in the field of computer-aided design for electronic circuits and systems; he is recognized and respected worldwide for his outstanding research contributions. Kang has led the development of the world’s first 32-bit microprocessor chips as a technical supervisor at AT&T Bell Laboratories and designed satellite-based private communication networks as a member of technical staff. Kang holds 15 U.S. patents and has won numerous awards for his ground breaking achievements in the field of electrical engineering.

Chenming Calvin Hu is a Taiwanese-American electronic engineer who specializes in microelectronics. He is TSMC Distinguished Professor Emeritus in the electronic engineering and computer science department of the University of California, Berkeley, in the United States. In 2009, the Institute of Electrical and Electronics Engineers described him as a “microelectronics visionary … whose seminal work on metal-oxide semiconductor MOS reliability and device modeling has had enormous impact on the continued scaling of electronic devices”.

Professor Benjamin Wan-Sang Wah is the Wei Lun Professor of Computer Science and Engineering at the Chinese University of Hong Kong, as well as the former provost of this university. He was elected President of IEEE Computer Society in 2001.

<span class="mw-page-title-main">Failure of electronic components</span> Ways electronic components fail and prevention measures

Electronic components have a wide range of failure modes. These can be classified in various ways, such as by time or cause. Failures can be caused by excess temperature, excess current or voltage, ionizing radiation, mechanical shock, stress or impact, and many other causes. In semiconductor devices, problems in the device package may cause failures due to contamination, mechanical stress of the device, or open or short circuits.

John Patrick Hayes is an Irish-American computer scientist and electrical engineer, the Claude E. Shannon Chair of Engineering Science at the University of Michigan. He supervised over 35 doctoral students, coauthored seven books and over 340 peer-reviewed publications. His Erdös number is 2.

Nancy Marie Amato is an American computer scientist noted for her research on the algorithmic foundations of motion planning, computational biology, computational geometry and parallel computing. Amato is the Abel Bliss Professor of Engineering and Head of the Department of Computer Science at the University of Illinois at Urbana-Champaign. Amato is noted for her leadership in broadening participation in computing, and is currently a member of the steering committee of CRA-WP, of which she has been a member of the board since 2000.

<span class="mw-page-title-main">Rob A. Rutenbar</span> American academic

Rob A. Rutenbar is an American academic noted for contributions to software tools that automate analog integrated circuit design, and custom hardware platforms for high-performance automatic speech recognition. He is Senior Vice Chancellor for Research at the University of Pittsburgh, where he leads the university's strategic and operational vision for research and innovation.

Mangalore Anantha Pai was an Indian electrical engineer, academic and a Professor Emeritus at the University of Illinois at Urbana–Champaign. A former professor of electrical engineering at the Indian Institute of Technology, Kanpur, he is known for his contributions in the fields of power stability, power grids, large scale power system analysis, system security and optimal control of nuclear reactors and he has published 8 books and several articles. Pai is the first India born scientist to be awarded a PhD in Electrical Engineering from the University of California, Berkeley.

John Michael Dallesasse is a Professor of Electrical and Computer Engineering at the University of Illinois at Urbana–Champaign where his research is focused on silicon photonic integrated circuits (PICs), nanophotonics, semiconductor lasers / transistor lasers and photonics-electronics integration. He has over 60 publications and presentations, and holds 29 issued patents.

Nam Sung Kim is a full professor of electrical and computer engineering at the University of Illinois at Urbana–Champaign an IEEE and ACM Fellow. He was on leave for two years serving as a Corporate Senior Vice President at Samsung Electronics and leading the development of the first commercial memory product with near memory computing capability.

Prathima Agrawal is an Indian-American computer engineer known for her contributions to wireless networking, VLSI, and computer-aided design. She is a professor emerita and the former Samuel Ginn Distinguished Professor of Electrical and Computer Engineering at Auburn University.

Jane Win-Shih Liu is a Chinese-American computer scientist known for her work on real-time computing. She is a professor emerita at the University of Illinois at Urbana–Champaign, Shun Hing Honorary Chair Professor of Computer Science at National Tsing Hua University, a distinguished visiting fellow of the Academia Sinica, and the former editor-in-chief of IEEE Transactions on Computers.

Kishor Shridharbhai Trivedi is an Indian-American computer scientist who is currently the Hudson Chaired Professor in department of electrical and computer engineering at Duke University.

References

  1. 1 2 3 "Elyse Rosenbaum", Faculty directory, Illinois Electrical & Computer Engineering, retrieved 2024-07-16
  2. 1 2 3 "Elyse Rosenbaum", Experts, Illinois Electrical & Computer Engineering, retrieved 2024-07-16
  3. 1 2 Rosenbaum, Elyse (1992), Thin oxide reliability in integrated circuits (PhD thesis), University of California, Berkeley, ProQuest   303998245
  4. IEEE Fellows directory, IEEE, retrieved 2024-07-16
  5. "Industry Pioneer Award: Elyse Rosenbaum", 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), IEEE, September 2017, p. 1, doi:10.23919/eosesd.2017.8073470, ISBN   978-1-58537-293-5