Interferometric microscopy

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Interferometric microscopy or imaging interferometric microscopy is the concept of microscopy which is related to holography, synthetic-aperture imaging, and off-axis-dark-field illumination techniques. Interferometric microscopy allows enhancement of resolution of optical microscopy due to interferometric (holographic) registration of several partial images (amplitude and phase) and the numerical combining.

Contents

Combining of partial images

In interferometric microscopy, the image of a micro-object is synthesized numerically as a coherent combination of partial images with registered amplitude and phase. [1] [2] For registration of partial images, a conventional holographic set-up is used with a reference wave, as is usual in optical holography. Capturing multiple exposures allows the numerical emulation of a large numerical aperture objective from images obtained with an objective lens with smaller-value numerical aperture. [1] Similar techniques allows scanning and precise detection of small particles. [3] As the combined image keeps both amplitude and phase information, the interferometric microscopy can be especially efficient for the phase objects, [3] allowing detection of light variations of index of refraction, which cause the phase shift or the light passing through for a small fraction of a radian.

Non-optical waves

Although the Interferometric microscopy has been demonstrated only for optical images (visible light), this technique may find application in high resolution atom optics, or optics of neutral atom beams (see Atomic de Broglie microscope), where the Numerical aperture is usually very limited . [4]

See also

Related Research Articles

<span class="mw-page-title-main">Microscopy</span> Viewing of objects which are too small to be seen with the naked eye

Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye. There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.

<span class="mw-page-title-main">Holography</span> Recording to reproduce a three-dimensional light field

Holography is a technique that enables a wavefront to be recorded and later re-constructed. Holography is best known as a method of generating three-dimensional images, but it also has a wide range of other applications. In principle, it is possible to make a hologram for any type of wave.

<span class="mw-page-title-main">Optical microscope</span> Microscope that uses visible light

The optical microscope, also referred to as a light microscope, is a type of microscope that commonly uses visible light and a system of lenses to generate magnified images of small objects. Optical microscopes are the oldest design of microscope and were possibly invented in their present compound form in the 17th century. Basic optical microscopes can be very simple, although many complex designs aim to improve resolution and sample contrast.

<span class="mw-page-title-main">Interferometry</span> Measurement method using interference of waves

Interferometry is a technique which uses the interference of superimposed waves to extract information. Interferometry typically uses electromagnetic waves and is an important investigative technique in the fields of astronomy, fiber optics, engineering metrology, optical metrology, oceanography, seismology, spectroscopy, quantum mechanics, nuclear and particle physics, plasma physics, remote sensing, biomolecular interactions, surface profiling, microfluidics, mechanical stress/strain measurement, velocimetry, optometry, and making holograms.

<span class="mw-page-title-main">Diffraction-limited system</span> Optical system with resolution performance at the instruments theoretical limit

The resolution of an optical imaging system – a microscope, telescope, or camera – can be limited by factors such as imperfections in the lenses or misalignment. However, there is a principal limit to the resolution of any optical system, due to the physics of diffraction. An optical system with resolution performance at the instrument's theoretical limit is said to be diffraction-limited.

<span class="mw-page-title-main">Near-field scanning optical microscope</span>

Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. In SNOM, the excitation laser light is focused through an aperture with a diameter smaller than the excitation wavelength, resulting in an evanescent field on the far side of the aperture. When the sample is scanned at a small distance below the aperture, the optical resolution of transmitted or reflected light is limited only by the diameter of the aperture. In particular, lateral resolution of 6 nm and vertical resolution of 2–5 nm have been demonstrated.

Atom optics is the area of physics which deals with beams of cold, slowly moving neutral atoms, as a special case of a particle beam. Like an optical beam, the atomic beam may exhibit diffraction and interference, and can be focused with a Fresnel zone plate or a concave atomic mirror. Several scientific groups work in this field.

<span class="mw-page-title-main">Atomic de Broglie microscope</span>

The atomic de Broglie microscope is an imaging system which is expected to provide resolution at the nanometer scale. It is sometimes referred to as a "nanoscope."

<span class="mw-page-title-main">High-resolution transmission electron microscopy</span>

High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp2-bonded carbon. While this term is often also used to refer to high resolution scanning transmission electron microscopy, mostly in high angle annular dark field mode, this article describes mainly the imaging of an object by recording the two-dimensional spatial wave amplitude distribution in the image plane, in analogy to a "classic" light microscope. For disambiguation, the technique is also often referred to as phase contrast transmission electron microscopy. At present, the highest point resolution realised in phase contrast transmission electron microscopy is around 0.5 ångströms (0.050 nm). At these small scales, individual atoms of a crystal and its defects can be resolved. For 3-dimensional crystals, it may be necessary to combine several views, taken from different angles, into a 3D map. This technique is called electron crystallography.

Electron holography is holography with electron waves. Dennis Gabor invented holography in 1948 when he tried to improve resolution in electron microscope. The first attempts to perform holography with electron waves were made by Haine and Mulvey in 1952; they recorded holograms of zinc oxide crystals with 60 keV electrons, demonstrating reconstructions with approximately 1 nm resolution. In 1955, G. Möllenstedt and H. Düker invented an electron biprism. thus enabling the recording of electron holograms in off-axis scheme. There are many different possible configurations for electron holography, with more than 20 documented in 1992 by Cowley. Usually, high spatial and temporal coherence of the electron beam are required to perform holographic measurements.

Holographic interferometry (HI) is a technique which enables static and dynamic displacements of objects with optically rough surfaces to be measured to optical interferometric precision. These measurements can be applied to stress, strain and vibration analysis, as well as to non-destructive testing and radiation dosimetry. It can also be used to detect optical path length variations in transparent media, which enables, for example, fluid flow to be visualised and analyzed. It can also be used to generate contours representing the form of the surface.

Digital holography refers to the acquisition and processing of holograms with a digital sensor array, typically a CCD camera or a similar device. Image rendering, or reconstruction of object data is performed numerically from digitized interferograms. Digital holography offers a means of measuring optical phase data and typically delivers three-dimensional surface or optical thickness images. Several recording and processing schemes have been developed to assess optical wave characteristics such as amplitude, phase, and polarization state, which make digital holography a very powerful method for metrology applications .

Computer-generated holography (CGH) is the method of digitally generating holographic interference patterns. A holographic image can be generated e.g. by digitally computing a holographic interference pattern and printing it onto a mask or film for subsequent illumination by suitable coherent light source.

<span class="mw-page-title-main">Ptychography</span>

Ptychography is a computational method of microscopic imaging. It generates images by processing many coherent interference patterns that have been scattered from an object of interest. Its defining characteristic is translational invariance, which means that the interference patterns are generated by one constant function moving laterally by a known amount with respect to another constant function. The interference patterns occur some distance away from these two components, so that the scattered waves spread out and "fold" into one another as shown in the figure.

<span class="mw-page-title-main">Digital holographic microscopy</span>

Digital holographic microscopy (DHM) is digital holography applied to microscopy. Digital holographic microscopy distinguishes itself from other microscopy methods by not recording the projected image of the object. Instead, the light wave front information originating from the object is digitally recorded as a hologram, from which a computer calculates the object image by using a numerical reconstruction algorithm. The image forming lens in traditional microscopy is thus replaced by a computer algorithm. Other closely related microscopy methods to digital holographic microscopy are interferometric microscopy, optical coherence tomography and diffraction phase microscopy. Common to all methods is the use of a reference wave front to obtain amplitude (intensity) and phase information. The information is recorded on a digital image sensor or by a photodetector from which an image of the object is created (reconstructed) by a computer. In traditional microscopy, which do not use a reference wave front, only intensity information is recorded and essential information about the object is lost.

<span class="mw-page-title-main">Quantitative phase-contrast microscopy</span>

Quantitative phase contrast microscopy or quantitative phase imaging are the collective names for a group of microscopy methods that quantify the phase shift that occurs when light waves pass through a more optically dense object.

<span class="mw-page-title-main">Light sheet fluorescence microscopy</span> Fluorescence microscopy technique

Light sheet fluorescence microscopy (LSFM) is a fluorescence microscopy technique with an intermediate-to-high optical resolution, but good optical sectioning capabilities and high speed. In contrast to epifluorescence microscopy only a thin slice of the sample is illuminated perpendicularly to the direction of observation. For illumination, a laser light-sheet is used, i.e. a laser beam which is focused only in one direction. A second method uses a circular beam scanned in one direction to create the lightsheet. As only the actually observed section is illuminated, this method reduces the photodamage and stress induced on a living sample. Also the good optical sectioning capability reduces the background signal and thus creates images with higher contrast, comparable to confocal microscopy. Because LSFM scans samples by using a plane of light instead of a point, it can acquire images at speeds 100 to 1,000 times faster than those offered by point-scanning methods.

<span class="mw-page-title-main">Coherence scanning interferometry</span>

Coherence scanning interferometry (CSI) is any of a class of optical surface measurement methods wherein the localization of interference fringes during a scan of optical path length provides a means to determine surface characteristics such as topography, transparent film structure, and optical properties. CSI is currently the most common interference microscopy technique for areal surface topography measurement. The term "CSI" was adopted by the International Organization for Standardization (ISO).

<span class="mw-page-title-main">Fourier ptychography</span> Computational imaging technique in microscopy

Fourier ptychography is a computational imaging technique based on optical microscopy that consists in the synthesis of a wider numerical aperture from a set of full-field images acquired at various coherent illumination angles, resulting in increased resolution compared to a conventional microscope.

The time-domain counterpart of spatial holography is called "Time-Domain Holography". In other words, the principles of spatial holography is surveyed in time domain. Time-domain holography was inspired by the theory known as "Space-Time Duality" which was introduced by Brian H. Kolner in 1994.

References

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  2. Schwarz, Christian J.; Kuznetsova, Yuliya; Brueck, S. R. J. (2003). "Imaging interferometric microscopy". Optics Letters . 28 (16): 1424–6. Bibcode:2003OptL...28.1424S. doi:10.1364/OL.28.001424. PMID   12943079.
  3. 1 2 Hwang, J.; Fejer, M. M.; Moerner, W. E. (2003). "Scanning interferometric microscopy for the detection of ultrasmall phase shifts in condensed matter". Physical Review A . 73 (2): 021802. Bibcode:2006PhRvA..73b1802H. doi:10.1103/PhysRevA.73.021802.
  4. Kouznetsov, D.; Oberst, H.; Neumann, A.; Kuznetsova, Y.; Shimizu, K.; Bisson, J-F; Ueda, K.; Brueck, S R J. (2006). "Ridged atomic mirrors and atomic nanoscope". Journal of Physics B . 39 (7): 1605–1623. Bibcode:2006JPhB...39.1605K. CiteSeerX   10.1.1.172.7872 . doi:10.1088/0953-4075/39/7/005. S2CID   16653364.