Diffraction refers to various phenomena that occur when a wave encounters an obstacle or opening. It is defined as the bending of waves around the corners of an obstacle or through an aperture into the region of geometrical shadow of the obstacle/aperture. The diffracting object or aperture effectively becomes a secondary source of the propagating wave. Italian scientist Francesco Maria Grimaldi coined the word diffraction and was the first to record accurate observations of the phenomenon in 1660.
In optics, a Gaussian beam is a beam of electromagnetic radiation with high monochromaticity whose amplitude envelope in the transverse plane is given by a Gaussian function; this also implies a Gaussian intensity (irradiance) profile. This fundamental (or TEM00) transverse Gaussian mode describes the intended output of most (but not all) lasers, as such a beam can be focused into the most concentrated spot. When such a beam is refocused by a lens, the transverse phase dependence is altered; this results in a different Gaussian beam. The electric and magnetic field amplitude profiles along any such circular Gaussian beam (for a given wavelength and polarization) are determined by a single parameter: the so-called waist w0. At any position z relative to the waist (focus) along a beam having a specified w0, the field amplitudes and phases are thereby determined as detailed below.
Electron diffraction refers to the wave nature of electrons. However, from a technical or practical point of view, it may be regarded as a technique used to study matter by firing electrons at a sample and observing the resulting interference pattern. This phenomenon is commonly known as wave–particle duality, which states that a particle of matter can be described as a wave. For this reason, an electron can be regarded as a wave much like sound or water waves. This technique is similar to X-ray and neutron diffraction.
In physics, the reciprocal lattice represents the Fourier transform of another lattice. In normal usage, the initial lattice is usually a periodic spatial function in real-space and is also known as the direct lattice. While the direct lattice exists in real-space and is what one would commonly understand as a physical lattice, the reciprocal lattice exists in reciprocal space. The reciprocal lattice of a reciprocal lattice is equivalent to the original direct lattice, because the defining equations are symmetrical with respect to the vectors in real and reciprocal space. Mathematically, direct and reciprocal lattice vectors represent covariant and contravariant vectors, respectively.
In optics, the Fraunhofer diffraction equation is used to model the diffraction of waves when the diffraction pattern is viewed at a long distance from the diffracting object, and also when it is viewed at the focal plane of an imaging lens. In contrast, the diffraction pattern created near the object is given by the Fresnel diffraction equation.
Gas electron diffraction (GED) is one of the applications of electron diffraction techniques. The target of this method is the determination of the structure of gaseous molecules i.e. the geometrical arrangement of the atoms from which a molecule is built up. GED is one of two experimental methods to determine the structure of free molecules, undistorted by intermolecular forces, which are omnipresent in the solid and liquid state. The determination of accurate molecular structures by GED studies is fundamental for an understanding of structural chemistry.
Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections at certain positions. The height, width and position of these reflections can be used to determine many aspects of the material's structure.
Powder diffraction is a scientific technique using X-ray, neutron, or electron diffraction on powder or microcrystalline samples for structural characterization of materials. An instrument dedicated to performing such powder measurements is called a powder diffractometer.
In optics, the Fresnel diffraction equation for near-field diffraction is an approximation of the Kirchhoff–Fresnel diffraction that can be applied to the propagation of waves in the near field. It is used to calculate the diffraction pattern created by waves passing through an aperture or around an object, when viewed from relatively close to the object. In contrast the diffraction pattern in the far field region is given by the Fraunhofer diffraction equation.
Low-energy electron diffraction (LEED) is a technique for the determination of the surface structure of single-crystalline materials by bombardment with a collimated beam of low-energy electrons (30–200 eV) and observation of diffracted electrons as spots on a fluorescent screen.
In condensed matter physics and crystallography, the static structure factor is a mathematical description of how a material scatters incident radiation. The structure factor is a critical tool in the interpretation of scattering patterns obtained in X-ray, electron and neutron diffraction experiments.
Diffraction processes affecting waves are amenable to quantitative description and analysis. Such treatments are applied to a wave passing through one or more slits whose width is specified as a proportion of the wavelength. Numerical approximations may be used, including the Fresnel and Fraunhofer approximations.
In crystallography, the Laue equations relate incoming waves to outgoing waves in the process of diffraction by a crystal lattice. They are named after physicist Max von Laue (1879–1960). They reduce to Bragg's law.
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer. It is used in the determination of size of crystals in the form of powder.
The multislice algorithm is a method for the simulation of the elastic interaction of an electron beam with matter, including all multiple scattering effects. The method is reviewed in the book by Cowley. The algorithm is used in the simulation of high resolution Transmission electron microscopy micrographs, and serves as a useful tool for analyzing experimental images. Here we describe relevant background information, the theoretical basis of the technique, approximations used, and several software packages that implement this technique. Moreover, we delineate some of the advantages and limitations of the technique and important considerations that need to be taken into account for real-world use.
In power engineering, winding factor is a technique that is employed to improve the rms generated voltage or electromotive force (EMF) in a three-phase AC electrical machine so that the output voltage and hence torque does not have any harmonics in it which may reduce efficiency. This is because the armature winding of each phase is distributed in a number of slots. Since the EMF induced in different slots are not in phase, their phasor sum is less than their numerical sum. This reduction factor is called distribution factor . Another factor that can reduce the winding factor is when the slot pitch is smaller than the pole pitch, called pitch factor .
In physics and engineering, the envelope of an oscillating signal is a smooth curve outlining its extremes. The envelope thus generalizes the concept of a constant amplitude into an instantaneous amplitude. The figure illustrates a modulated sine wave varying between an upper envelope and a lower envelope. The envelope function may be a function of time, space, angle, or indeed of any variable.
In optics, the Fraunhofer diffraction equation is used to model the diffraction of waves when the diffraction pattern is viewed at a long distance from the diffracting object, and also when it is viewed at the focal plane of an imaging lens.
As described here, white light interferometry is a non-contact optical method for surface height measurement on 3-D structures with surface profiles varying between tens of nanometers and a few centimeters. It is often used as an alternative name for coherence scanning interferometry in the context of areal surface topography instrumentation that relies on spectrally-broadband, visible-wavelength light.
In crystallography, direct methods is a set of techniques used for structure determination using diffraction data and a priori information. It is a solution to the crystallographic phase problem, where phase information is lost during a diffraction measurement. Direct methods provides a method of estimating the phase information by establishing statistical relationships between the recorded amplitude information and phases of strong reflections.
