Srimanta Baishya

Last updated

  1. "Srimanta Baishya". scholar.google.com. Retrieved 17 September 2023.
  2. "Prof. Srimanta Baishya |" . Retrieved 17 September 2023.
  3. "Vidwan | Profile Page". vidwan.inflibnet.ac.in. Retrieved 17 September 2023.
  4. "National Institute of Technology, Silchar". josaa.admissions.nic.in. Archived from the original on 17 April 2023. Retrieved 17 September 2023.
  5. "INDIAN RESEARCH INFORMATION NETWORK SYSTEM". irins.inflibnet.ac.in. Retrieved 17 September 2023.
  6. Baishya, Srimanta; Mallik, Abhijit; Sarkar, Chandan Kumar (1 January 2008). "A threshold voltage model for short-channel MOSFETs taking into account the varying depth of channel depletion layers around the source and drain". Microelectronics Reliability. 48 (1): 17–22. doi:10.1016/j.microrel.2007.01.086. ISSN   0026-2714.
  7. Baishya, S.; Mallik, A.; Sarkar, C. K. (September 2007). "A Pseudo Two-Dimensional Subthreshold Surface Potential Model for Dual-Material Gate MOSFETs". IEEE Transactions on Electron Devices. 54 (9): 2520–2525. doi:10.1109/TED.2007.903204. ISSN   1557-9646.
  8. Baishya, S; Mallik, A; Sarkar, C K (1 September 2007). "A surface potential based subthreshold drain current model for short-channel MOS transistors". Semiconductor Science and Technology. 22 (9): 1066–1069. doi:10.1088/0268-1242/22/9/015. ISSN   0268-1242.
  9. Baishya, Srimanta; Mallik, Abhijit; Sarkar, Chandan Kumar (1 April 2007). "Subthreshold surface potential and drain current models for short-channel pocket-implanted MOSFETs". Microelectronic Engineering. 84 (4): 653–662. doi:10.1016/j.mee.2006.12.008. ISSN   0167-9317.
  10. Baishya, S.; Mallik, A.; Sarkar, C.K. (March 2006). "A subthreshold surface potential model for short-channel MOSFET taking into account the varying depth of channel depletion layer due to source and drain junctions". IEEE Transactions on Electron Devices. 53 (3): 507–514. doi:10.1109/TED.2005.864364. ISSN   1557-9646.
Srimanta Baishya
NationalityIndian
Academic background
Alma mater Jadavpur University