In nonlinear optics z-scan technique is used to measure the non-linear index n2 (Kerr nonlinearity) and the non-linear absorption coefficient Δα via the "closed" and "open" methods, respectively. As nonlinear absorption can affect the measurement of the non-linear index, the open method is typically used in conjunction with the closed method to correct the calculated value. For measuring the real part of the nonlinear refractive index, the z-scan setup is used in its closed-aperture form. In this form, since the nonlinear material reacts like a weak z-dependent lens, the far-field aperture makes it possible to detect the small beam distortions in the original beam. Since the focusing power of this weak nonlinear lens depends on the nonlinear refractive index, [1] it would be possible to extract its value by analyzing the z-dependent data acquired by the detector and by cautiously interpreting them using an appropriate theory. [2] To measure the imaginary part of the nonlinear refractive index, or the nonlinear absorption coefficient, the z-scan setup is used in its open-aperture form. In open-aperture measurements, the far-field aperture is removed and the whole signal is measured by the detector. By measuring the whole signal, the beam small distortions become insignificant and the z-dependent signal variation is due to the nonlinear absorption entirely. Despite its simplicity, in many cases, the original z-scan theory is not completely accurate, e.g. when the investigated sample has inhomogeneous optical nonlinear properties, [3] or when the nonlinear medium response to laser radiation is nonlocal in space. Whenever the laser induced nonlinear response at a certain point of the medium is not solely determined by the laser intensity at that point, but also depends on the laser intensity in the surrounding regions, it will be called a nonlocal nonlinear optical response. Generally, a variety of mechanisms may contribute to the nonlinearity, some of which may be nonlocal. For instance, when the nonlinear medium is dispersed inside a dielectric solution, reorientation of the dipoles (permanent or induced molecular dipoles) as a result of the optical field action is nonlocal in space and changes the electric field experienced by the nonlinear medium. The nonlocal z-scan theory, [4] can be used for systematically analyzing the role of various mechanisms in producing the nonlocal nonlinear response of different materials.
In this setup an aperture is placed to prevent some of the light from reaching the detector. The equipment is arranged as can be seen in the diagram. A lens focuses a laser to a certain point, and after this point the beam naturally defocuses. After a further distance an aperture is placed with a detector behind it. The aperture causes only the central region of the cone of light to reach the detector. Typically values of the normalized transmittance are between .
The detector is now sensitive to any focusing or defocusing that a sample may induce. The sample is typically placed at the focus point of the lens, and then moved along the z-axis a distance of which is given by the Rayleigh length :
The thin sample approximation states that the thickness of the sample must be less than the Rayleigh length
This method is similar to the above method, however, the aperture is removed or enlarged to allow all the light to reach the detector. This in effect sets the normalized transmittance to S = 1. This is used in order to measure the non-linear absorption coefficient Δα. The main cause of non-linear absorption is due to two-photon absorption.
When measuring the nonlinear properties of molecules in solution, the two-photon absorption of the solvent is usually small and determination of for the solute is not problematic. However, this is not the case for nonlinear refraction (NLR). Typically, the NLR per molecule of the solvent is much less than that of the solute, but the large density of solvent molecules yields a large net NLR that may dominate the signal due to the solute. Additionally, there is a contribution to the measured due to the cells used to hold the samples. In cases where the of the solute is small, large discrepancies can arise when reporting the nonlinearity of the solute since the NLR of the solvent and cells must be subtracted from that of the solution. Thus, the determination of solute nonlinearities in regions where the NLR is similar to or much smaller than the solvent or cells has been difficult. Similarly, this problem occurs for thin-films deposited on a substrate, where both film and substrate exhibit two-photon absorption and nonlinear refraction. Dual-arm Z-scan is a modified version of the conventional Z-scan that can address this issue by simultaneously measuring and subtracting the effect of the solvent (or substrate) from the sample under study. [5] [6]
This method is similar to the closed z-scan method, however the sensitivity of the system is increased by only looking at the outer edges of the beam by blocking out the central region. This is achieved by replacing the aperture with disks that block the central part of the beam. The method got its name from the way in which the light passes around the disk to the detector in a similar way to an eclipse.
A further improvement to the eclipsing z-scan method is to add a lens behind the aperture so that the light is focused onto the detector, this can also reduce the need for a larger detector.
Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye. There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.
Nonlinear optics (NLO) is the branch of optics that describes the behaviour of light in nonlinear media, that is, media in which the polarization density P responds non-linearly to the electric field E of the light. The non-linearity is typically observed only at very high light intensities (when the electric field of the light is >108 V/m and thus comparable to the atomic electric field of ~1011 V/m) such as those provided by lasers. Above the Schwinger limit, the vacuum itself is expected to become nonlinear. In nonlinear optics, the superposition principle no longer holds.
In optics, the refractive index of an optical medium is a dimensionless number that gives the indication of the light bending ability of that medium.
Ultraviolet (UV) spectroscopy or ultraviolet–visible (UV–VIS) spectrophotometry refers to absorption spectroscopy or reflectance spectroscopy in part of the ultraviolet and the full, adjacent visible regions of the electromagnetic spectrum. Being relatively inexpensive and easily implemented, this methodology is widely used in diverse applied and fundamental applications. The only requirement is that the sample absorb in the UV-Vis region, i.e. be a chromophore. Absorption spectroscopy is complementary to fluorescence spectroscopy. Parameters of interest, besides the wavelength of measurement, are absorbance (A) or transmittance (%T) or reflectance (%R), and its change with time.
Optical tweezers are scientific instruments that use a highly focused laser beam to hold and move microscopic and sub-microscopic objects like atoms, nanoparticles and droplets, in a manner similar to tweezers. If the object is held in air or vacuum without additional support, it can be called optical levitation.
In optics, any optical instrument or system – a microscope, telescope, or camera – has a principal limit to its resolution due to the physics of diffraction. An optical instrument is said to be diffraction-limited if it has reached this limit of resolution performance. Other factors may affect an optical system's performance, such as lens imperfections or aberrations, but these are caused by errors in the manufacture or calculation of a lens, whereas the diffraction limit is the maximum resolution possible for a theoretically perfect, or ideal, optical system.
Ellipsometry is an optical technique for investigating the dielectric properties of thin films. Ellipsometry measures the change of polarization upon reflection or transmission and compares it to a model.
In optics, various autocorrelation functions can be experimentally realized. The field autocorrelation may be used to calculate the spectrum of a source of light, while the intensity autocorrelation and the interferometric autocorrelation are commonly used to estimate the duration of ultrashort pulses produced by modelocked lasers. The laser pulse duration cannot be easily measured by optoelectronic methods, since the response time of photodiodes and oscilloscopes are at best of the order of 200 femtoseconds, yet laser pulses can be made as short as a few femtoseconds.
In laser science, the beam parameter product (BPP) is the product of a laser beam's divergence angle (half-angle) and the radius of the beam at its narrowest point. The BPP quantifies the quality of a laser beam, and how well it can be focused to a small spot.
In laser science, the parameter M2, also known as the beam propagation ratio or beam quality factor is a measure of laser beam quality. It represents the degree of variation of a beam from an ideal Gaussian beam. It is calculated from the ratio of the beam parameter product (BPP) of the beam to that of a Gaussian beam with the same wavelength. It relates the beam divergence of a laser beam to the minimum focussed spot size that can be achieved. For a single mode TEM00 (Gaussian) laser beam, M2 is exactly one. Unlike the beam parameter product, M2 is unitless and does not vary with wavelength.
Photothermal spectroscopy is a group of high sensitivity spectroscopy techniques used to measure optical absorption and thermal characteristics of a sample. The basis of photothermal spectroscopy is the change in thermal state of the sample resulting from the absorption of radiation. Light absorbed and not lost by emission results in heating. The heat raises temperature thereby influencing the thermodynamic properties of the sample or of a suitable material adjacent to it. Measurement of the temperature, pressure, or density changes that occur due to optical absorption are ultimately the basis for the photothermal spectroscopic measurements.
A laser beam profiler captures, displays, and records the spatial intensity profile of a laser beam at a particular plane transverse to the beam propagation path. Since there are many types of lasers—ultraviolet, visible, infrared, continuous wave, pulsed, high-power, low-power—there is an assortment of instrumentation for measuring laser beam profiles. No single laser beam profiler can handle every power level, pulse duration, repetition rate, wavelength, and beam size.
Photothermal optical microscopy / "photothermal single particle microscopy" is a technique that is based on detection of non-fluorescent labels. It relies on absorption properties of labels, and can be realized on a conventional microscope using a resonant modulated heating beam, non-resonant probe beam and lock-in detection of photothermal signals from a single nanoparticle. It is the extension of the macroscopic photothermal spectroscopy to the nanoscopic domain. The high sensitivity and selectivity of photothermal microscopy allows even the detection of single molecules by their absorption. Similar to Fluorescence Correlation Spectroscopy (FCS), the photothermal signal may be recorded with respect to time to study the diffusion and advection characteristics of absorbing nanoparticles in a solution. This technique is called photothermal correlation spectroscopy (PhoCS).
Multiangle light scattering (MALS) describes a technique for measuring the light scattered by a sample into a plurality of angles. It is used for determining both the absolute molar mass and the average size of molecules in solution, by detecting how they scatter light. A collimated beam from a laser source is most often used, in which case the technique can be referred to as multiangle laser light scattering (MALLS). The insertion of the word laser was intended to reassure those used to making light scattering measurements with conventional light sources, such as Hg-arc lamps that low-angle measurements could now be made. Until the advent of lasers and their associated fine beams of narrow width, the width of conventional light beams used to make such measurements prevented data collection at smaller scattering angles. In recent years, since all commercial light scattering instrumentation use laser sources, this need to mention the light source has been dropped and the term MALS is used throughout.
Phase-contrast X-ray imaging or phase-sensitive X-ray imaging is a general term for different technical methods that use information concerning changes in the phase of an X-ray beam that passes through an object in order to create its images. Standard X-ray imaging techniques like radiography or computed tomography (CT) rely on a decrease of the X-ray beam's intensity (attenuation) when traversing the sample, which can be measured directly with the assistance of an X-ray detector. However, in phase contrast X-ray imaging, the beam's phase shift caused by the sample is not measured directly, but is transformed into variations in intensity, which then can be recorded by the detector.
As described here, white light interferometry is a non-contact optical method for surface height measurement on 3D structures with surface profiles varying between tens of nanometers and a few centimeters. It is often used as an alternative name for coherence scanning interferometry in the context of areal surface topography instrumentation that relies on spectrally-broadband, visible-wavelength light.
Wide-field multiphoton microscopy refers to an optical non-linear imaging technique tailored for ultrafast imaging in which a large area of the object is illuminated and imaged without the need for scanning. High intensities are required to induce non-linear optical processes such as two-photon fluorescence or second harmonic generation. In scanning multiphoton microscopes the high intensities are achieved by tightly focusing the light, and the image is obtained by beam scanning. In wide-field multiphoton microscopy the high intensities are best achieved using an optically amplified pulsed laser source to attain a large field of view (~100 µm). The image in this case is obtained as a single frame with a CCD without the need of scanning, making the technique particularly useful to visualize dynamic processes simultaneously across the object of interest. With wide-field multiphoton microscopy the frame rate can be increased up to a 1000-fold compared to multiphoton scanning microscopy. Wide-field multiphoton microscopes are not yet commercially available, but working prototypes exist in several optics laboratories.
The operation of a photon scanning tunneling microscope (PSTM) is analogous to the operation of an electron scanning tunneling microscope, with the primary distinction being that PSTM involves tunneling of photons instead of electrons from the sample surface to the probe tip. A beam of light is focused on a prism at an angle greater than the critical angle of the refractive medium in order to induce total internal reflection within the prism. Although the beam of light is not propagated through the surface of the refractive prism under total internal reflection, an evanescent field of light is still present at the surface.
Three-photon microscopy (3PEF) is a high-resolution fluorescence microscopy based on nonlinear excitation effect. Different from two-photon excitation microscopy, it uses three exciting photons. It typically uses 1300 nm or longer wavelength lasers to excite the fluorescent dyes with three simultaneously absorbed photons. The fluorescent dyes then emit one photon whose energy is three times the energy of each incident photon. Compared to two-photon microscopy, three-photon microscopy reduces the fluorescence away from the focal plane by , which is much faster than that of two-photon microscopy by . In addition, three-photon microscopy employs near-infrared light with less tissue scattering effect. This causes three-photon microscopy to have higher resolution than conventional microscopy.
Anisotropic terahertz microspectroscopy (ATM) is a spectroscopic technique in which molecular vibrations in an anisotropic material are probed with short pulses of terahertz radiation whose electric field is linearly polarized parallel to the surface of the material. The technique has been demonstrated in studies involving single crystal sucrose, fructose, oxalic acid, and molecular protein crystals in which the spatial orientation of molecular vibrations are of interest.