In physics, the cross section is a measure of the probability that a specific process will take place when some kind of radiant excitation intersects a localized phenomenon. For example, the Rutherford cross-section is a measure of probability that an alpha particle will be deflected by a given angle during an interaction with an atomic nucleus. Cross section is typically denoted σ (sigma) and is expressed in units of area, more specifically in barns. In a way, it can be thought of as the size of the object that the excitation must hit in order for the process to occur, but more exactly, it is a parameter of a stochastic process.
Diffraction is the interference or bending of waves around the corners of an obstacle or through an aperture into the region of geometrical shadow of the obstacle/aperture. The diffracting object or aperture effectively becomes a secondary source of the propagating wave. Italian scientist Francesco Maria Grimaldi coined the word diffraction and was the first to record accurate observations of the phenomenon in 1660.
Snell's law is a formula used to describe the relationship between the angles of incidence and refraction, when referring to light or other waves passing through a boundary between two different isotropic media, such as water, glass, or air. In optics, the law is used in ray tracing to compute the angles of incidence or refraction, and in experimental optics to find the refractive index of a material. The law is also satisfied in meta-materials, which allow light to be bent "backward" at a negative angle of refraction with a negative refractive index.
In many areas of science, Bragg's law, Wulff–Bragg's condition or Laue–Bragg interference, are a special case of Laue diffraction, giving the angles for coherent scattering of waves from a large crystal lattice. It describes how the superposition of wave fronts scattered by lattice planes leads to a strict relation between the wavelength and scattering angle. This law was initially formulated for X-rays, but it also applies to all types of matter waves including neutron and electron waves if there are a large number of atoms, as well as visible light with artificial periodic microscale lattices.
In optics, the Fraunhofer diffraction equation is used to model the diffraction of waves when plane waves are incident on a diffracting object, and the diffraction pattern is viewed at a sufficiently long distance from the object, and also when it is viewed at the focal plane of an imaging lens. In contrast, the diffraction pattern created near the diffracting object and is given by the Fresnel diffraction equation.
In particle physics, the Klein–Nishina formula gives the differential cross section of photons scattered from a single free electron, calculated in the lowest order of quantum electrodynamics. It was first derived in 1928 by Oskar Klein and Yoshio Nishina, constituting one of the first successful applications of the Dirac equation. The formula describes both the Thomson scattering of low energy photons and the Compton scattering of high energy photons, showing that the total cross section and expected deflection angle decrease with increasing photon energy.
Powder diffraction is a scientific technique using X-ray, neutron, or electron diffraction on powder or microcrystalline samples for structural characterization of materials. An instrument dedicated to performing such powder measurements is called a powder diffractometer.
In particle physics, wave mechanics, and optics, momentum transfer is the amount of momentum that one particle gives to another particle. It is also called the scattering vector as it describes the transfer of wavevector in wave mechanics.
In physics, a Bragg plane is a plane in reciprocal space which bisects a reciprocal lattice vector, , at right angles. The Bragg plane is defined as part of the Von Laue condition for diffraction peaks in x-ray diffraction crystallography.
X-ray reflectivity is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers. It is a form of reflectometry based on the use of X-rays and is related to the techniques of neutron reflectometry and ellipsometry.
X-ray optics is the branch of optics that manipulates X-rays instead of visible light. It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and X-ray astronomy.
Ring lasers are composed of two beams of light of the same polarization traveling in opposite directions ("counter-rotating") in a closed loop.
Neutron reflectometry is a neutron diffraction technique for measuring the structure of thin films, similar to the often complementary techniques of X-ray reflectivity and ellipsometry. The technique provides valuable information over a wide variety of scientific and technological applications including chemical aggregation, polymer and surfactant adsorption, structure of thin film magnetic systems, biological membranes, etc.
Fluorescence interference contrast (FLIC) microscopy is a microscopic technique developed to achieve z-resolution on the nanometer scale.
Acousto-optics is a branch of physics that studies the interactions between sound waves and light waves, especially the diffraction of laser light by ultrasound through an ultrasonic grating.
The transfer-matrix method is a method used in optics and acoustics to analyze the propagation of electromagnetic or acoustic waves through a stratified medium; a stack of thin films. This is, for example, relevant for the design of anti-reflective coatings and dielectric mirrors.
An ultrasonic grating is a type of diffraction grating produced by the interference of ultrasonic waves in a medium, which alters the physical properties of the medium in a grid-like pattern. The term acoustic grating is a more general term that includes operation at audible frequencies.
The contrast transfer function (CTF) mathematically describes how aberrations in a transmission electron microscope (TEM) modify the image of a sample. This contrast transfer function (CTF) sets the resolution of high-resolution transmission electron microscopy (HRTEM), also known as phase contrast TEM.
Thin-film interference is a natural phenomenon in which light waves reflected by the upper and lower boundaries of a thin film interfere with one another, increasing reflection at some wavelengths and decreasing it at others. When white light is incident on a thin film, this effect produces colorful reflections.
In optics, the Fraunhofer diffraction equation is used to model the diffraction of waves when the diffraction pattern is viewed at a long distance from the diffracting object, and also when it is viewed at the focal plane of an imaging lens.
