Beam parameter product

Last updated

In laser science, the beam parameter product (BPP) is the product of a laser beam's divergence angle (half-angle) and the radius of the beam at its narrowest point (the beam waist). [1] The BPP quantifies the quality of a laser beam, and how well it can be focused to a small spot.

Contents

A Gaussian beam has the lowest possible BPP, , where is the wavelength of the light. [1] The ratio of the BPP of an actual beam to that of an ideal Gaussian beam at the same wavelength is denoted M2 ("M squared"). This parameter is a wavelength-independent measure of beam quality.

The general wave equation, assuming paraxial approximation, yields:

.

With:

the half angle in far field
the beam waist
the beam quality factor, M squared
the wavelength.

The quality of a beam is important for many applications. In fiber-optic communications beams with an M2 close to 1 are required for coupling to single-mode optical fiber. Laser machine shops care a lot about the M2 parameter of their lasers because the beams will focus to an area that is M4 times larger than that of a Gaussian beam with the same wavelength and D4σ waist width; in other words, the fluence scales as 1/M4. The rule of thumb is that M2 increases as the laser power increases. It is difficult to obtain excellent beam quality and high average power (100 W to kWs) due to thermal lensing in the laser gain medium.

Measurement

There are several ways to define the width of a beam. When measuring the beam parameter product and M2, one uses the D4σ or "second moment" width of the beam to determine both the radius of the beam's waist and the divergence in the far field. [2]

The BPP can be easily measured by placing an array detector or scanning-slit profiler at multiple positions within the beam after focusing it with a lens of high optical quality and known focal length. To properly obtain the BPP and M2 the following steps must be followed: [3]

  1. Measure the D4σ widths at 5 axial positions near the beam waist (the location where the beam is narrowest).
  2. Measure the D4σ widths at 5 axial positions at least one Rayleigh length away from the waist.
  3. Fit the 10 measured data points to , [4] where and is the second moment of the distribution in the x or y direction (see Beam diameter § D4σ or second-moment width), and is the location of the beam waist with second moment width of . Fitting the 10 data points yields M2, , and . Siegman showed that all beam profiles—Gaussian, flat top, TEMxy, or any shape—must follow the equation above provided that the beam radius uses the D4σ definition of the beam width. Using other definitions of beam width does not work.

In principle, one could use a single measurement at the waist to obtain the waist diameter, a single measurement in the far field to obtain the divergence, and then use these to calculate the BPP. The procedure above gives a more accurate result in practice, however.

High-power lasers, such as those used in laser welding and cutting are typically measured by using a beamsplitter to sample the beam. The sampled beam has much lower intensity and can be measured by a scanning-slit or knife-edge profiler. Good beam quality is very important in laser welding and cutting operations. [5]

See also

Related Research Articles

The Beer-Lambert law is commonly applied to chemical analysis measurements to determine the concentration of chemical species that absorb light. It is often referred to as Beer's law. In physics, the Bouguer–Lambert law is an empirical law which relates the extinction or attenuation of light to the properties of the material through which the light is travelling. It had its first use in astronomical extinction. The fundamental law of extinction is sometimes called the Beer-Bouguer-Lambert law or the Bouguer-Beer-Lambert law or merely the extinction law. The extinction law is also used in understanding attenuation in physical optics, for photons, neutrons, or rarefied gases. In mathematical physics, this law arises as a solution of the BGK equation.

<span class="mw-page-title-main">Optical depth</span> Physics concept

In physics, optical depth or optical thickness is the natural logarithm of the ratio of incident to transmitted radiant power through a material. Thus, the larger the optical depth, the smaller the amount of transmitted radiant power through the material. Spectral optical depth or spectral optical thickness is the natural logarithm of the ratio of incident to transmitted spectral radiant power through a material. Optical depth is dimensionless, and in particular is not a length, though it is a monotonically increasing function of optical path length, and approaches zero as the path length approaches zero. The use of the term "optical density" for optical depth is discouraged.

The beam diameter or beam width of an electromagnetic beam is the diameter along any specified line that is perpendicular to the beam axis and intersects it. Since beams typically do not have sharp edges, the diameter can be defined in many different ways. Five definitions of the beam width are in common use: D4σ, 10/90 or 20/80 knife-edge, 1/e2, FWHM, and D86. The beam width can be measured in units of length at a particular plane perpendicular to the beam axis, but it can also refer to the angular width, which is the angle subtended by the beam at the source. The angular width is also called the beam divergence.

<span class="mw-page-title-main">Beam divergence</span> How much a beam expands as it travels

In electromagnetics, especially in optics, beam divergence is an angular measure of the increase in beam diameter or radius with distance from the optical aperture or antenna aperture from which the beam emerges. The term is relevant only in the "far field", away from any focus of the beam. Practically speaking, however, the far field can commence physically close to the radiating aperture, depending on aperture diameter and the operating wavelength.

<span class="mw-page-title-main">Gaussian beam</span> Monochrome light beam whose amplitude envelope is a Gaussian function

In optics, a Gaussian beam is a beam of electromagnetic radiation with high monochromaticity whose amplitude envelope in the transverse plane is given by a Gaussian function; this also implies a Gaussian intensity (irradiance) profile. This fundamental (or TEM00) transverse Gaussian mode describes the intended output of most (but not all) lasers, as such a beam can be focused into the most concentrated spot. When such a beam is refocused by a lens, the transverse phase dependence is altered; this results in a different Gaussian beam. The electric and magnetic field amplitude profiles along any such circular Gaussian beam (for a given wavelength and polarization) are determined by a single parameter: the so-called waist w0. At any position z relative to the waist (focus) along a beam having a specified w0, the field amplitudes and phases are thereby determined as detailed below.

Ray transfer matrix analysis is a mathematical form for performing ray tracing calculations in sufficiently simple problems which can be solved considering only paraxial rays. Each optical element is described by a 2×2 ray transfer matrix which operates on a vector describing an incoming light ray to calculate the outgoing ray. Multiplication of the successive matrices thus yields a concise ray transfer matrix describing the entire optical system. The same mathematics is also used in accelerator physics to track particles through the magnet installations of a particle accelerator, see electron optics.

In mathematics, a Gaussian function, often simply referred to as a Gaussian, is a function of the base form

<span class="mw-page-title-main">Diffraction-limited system</span> Optical system with resolution performance at the instruments theoretical limit

In optics, any optical instrument or system – a microscope, telescope, or camera – has a principal limit to its resolution due to the physics of diffraction. An optical instrument is said to be diffraction-limited if it has reached this limit of resolution performance. Other factors may affect an optical system's performance, such as lens imperfections or aberrations, but these are caused by errors in the manufacture or calculation of a lens, whereas the diffraction limit is the maximum resolution possible for a theoretically perfect, or ideal, optical system.

<span class="mw-page-title-main">Airy disk</span> Diffraction pattern in optics

In optics, the Airy disk and Airy pattern are descriptions of the best-focused spot of light that a perfect lens with a circular aperture can make, limited by the diffraction of light. The Airy disk is of importance in physics, optics, and astronomy.

In optics, the Fraunhofer diffraction equation is used to model the diffraction of waves when plane waves are incident on a diffracting object, and the diffraction pattern is viewed at a sufficiently long distance from the object, and also when it is viewed at the focal plane of an imaging lens. In contrast, the diffraction pattern created near the diffracting object and is given by the Fresnel diffraction equation.

<span class="mw-page-title-main">Van Deemter equation</span>

The van Deemter equation in chromatography, named for Jan van Deemter, relates the variance per unit length of a separation column to the linear mobile phase velocity by considering physical, kinetic, and thermodynamic properties of a separation. These properties include pathways within the column, diffusion, and mass transfer kinetics between stationary and mobile phases. In liquid chromatography, the mobile phase velocity is taken as the exit velocity, that is, the ratio of the flow rate in ml/second to the cross-sectional area of the ‘column-exit flow path.’ For a packed column, the cross-sectional area of the column exit flow path is usually taken as 0.6 times the cross-sectional area of the column. Alternatively, the linear velocity can be taken as the ratio of the column length to the dead time. If the mobile phase is a gas, then the pressure correction must be applied. The variance per unit length of the column is taken as the ratio of the column length to the column efficiency in theoretical plates. The van Deemter equation is a hyperbolic function that predicts that there is an optimum velocity at which there will be the minimum variance per unit column length and, thence, a maximum efficiency. The van Deemter equation was the result of the first application of rate theory to the chromatography elution process.

In optics, the complex beam parameter is a complex number that specifies the properties of a Gaussian beam at a particular point z along the axis of the beam. It is usually denoted by q. It can be calculated from the beam's vacuum wavelength λ0, the radius of curvature R of the phase front, the index of refraction n (n=1 for air), and the beam radius w (defined at 1/e2 intensity), according to:

In nonlinear optics, filament propagation is propagation of a beam of light through a medium without diffraction. This is possible because the Kerr effect causes an index of refraction change in the medium, resulting in self-focusing of the beam.

In laser science, the parameter M2, also known as the beam propagation ratio or beam quality factor is a measure of laser beam quality. It represents the degree of variation of a beam from an ideal Gaussian beam. It is calculated from the ratio of the beam parameter product (BPP) of the beam to that of a Gaussian beam with the same wavelength. It relates the beam divergence of a laser beam to the minimum focussed spot size that can be achieved. For a single mode TEM00 (Gaussian) laser beam, M2 is exactly one. Unlike the beam parameter product, M2 is unitless and does not vary with wavelength.

<span class="mw-page-title-main">Inverse Gaussian distribution</span> Family of continuous probability distributions

In probability theory, the inverse Gaussian distribution is a two-parameter family of continuous probability distributions with support on (0,∞).

<span class="mw-page-title-main">Rayleigh length</span>

In optics and especially laser science, the Rayleigh length or Rayleigh range, , is the distance along the propagation direction of a beam from the waist to the place where the area of the cross section is doubled. A related parameter is the confocal parameter, b, which is twice the Rayleigh length. The Rayleigh length is particularly important when beams are modeled as Gaussian beams.

<span class="mw-page-title-main">Laser beam profiler</span> Measurement device

A laser beam profiler captures, displays, and records the spatial intensity profile of a laser beam at a particular plane transverse to the beam propagation path. Since there are many types of lasers—ultraviolet, visible, infrared, continuous wave, pulsed, high-power, low-power—there is an assortment of instrumentation for measuring laser beam profiles. No single laser beam profiler can handle every power level, pulse duration, repetition rate, wavelength, and beam size.

Laser linewidth is the spectral linewidth of a laser beam.

<span class="mw-page-title-main">Laser beam quality</span>

In laser science, laser beam quality defines aspects of the beam illumination pattern and the merits of a particular laser beam's propagation and transformation properties. By observing and recording the beam pattern, for example, one can infer the spatial mode properties of the beam and whether or not the beam is being clipped by an obstruction; By focusing the laser beam with a lens and measuring the minimum spot size, the number of times diffraction limit or focusing quality can be computed.

In the study of heat transfer, Schwarzschild's equation is used to calculate radiative transfer through a medium in local thermodynamic equilibrium that both absorbs and emits radiation.

References

  1. 1 2 Paschotta, Rüdiger. "Beam parameter product". Encyclopedia of Laser Physics and Technology. RP Photonics. Archived from the original on 18 October 2006. Retrieved 2006-09-22.
  2. A. E. Siegman, "How to (Maybe) Measure Laser Beam Quality," Tutorial presentation at the Optical Society of America Annual Meeting, Long Beach, California, October 1997.
  3. ISO 11146-1:2005(E), "Lasers and laser-related equipment — Test methods for laser beam widths, divergence angles and beam propagation ratios — Part 1: Stigmatic and simple astigmatic beams."
  4. A. E. Siegman, "How to (Maybe) Measure Laser Beam Quality," Tutorial presentation at the Optical Society of America Annual Meeting Long Beach, California, October 1997, p.9. (Note that there is a typo in equation on page 3. Correct form comes from equations on page 9.)
  5. Aharon, Oren (February 20, 2014). Dorsch, Friedhelm (ed.). "High power beam analysis". Proc. SPIE. High-Power Laser Materials Processing: Lasers, Beam Delivery, Diagnostics, and Applications III. 8963: 89630M. Bibcode:2014SPIE.8963E..0MA. doi:10.1117/12.2036550. S2CID   122675242.

Further reading