A multimeter is a measuring instrument that can measure multiple electrical properties. A typical multimeter can measure voltage, resistance, and current, in which case can be used as a voltmeter, ohmmeter, and ammeter. Some feature the measurement of additional properties such as temperature and capacitance.
A printed circuit board (PCB), also called printed wiring board (PWB), is a medium used to connect or "wire" components to one another in a circuit. It takes the form of a laminated sandwich structure of conductive and insulating layers: each of the conductive layers is designed with a pattern of traces, planes and other features etched from one or more sheet layers of copper laminated onto or between sheet layers of a non-conductive substrate. Electrical components may be fixed to conductive pads on the outer layers, generally by means of soldering, which both electrically connects and mechanically fastens the components to the board. Another manufacturing process adds vias, drilled holes that allow electrical interconnections between conductive layers.
JTAG is an industry standard for verifying designs of and testing printed circuit boards after manufacture.
Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits.
Boundary scan is a method for testing interconnects on printed circuit boards or sub-blocks inside an integrated circuit. Boundary scan is also widely used as a debugging method to watch integrated circuit pin states, measure voltage, or analyze sub-blocks inside an integrated circuit.
An electronic component is any basic discrete electronic device or physical entity part of an electronic system used to affect electrons or their associated fields. Electronic components are mostly industrial products, available in a singular form and are not to be confused with electrical elements, which are conceptual abstractions representing idealized electronic components and elements. A datasheet for an electronic component is a technical document that provides detailed information about the component's specifications, characteristics, and performance. Discrete circuits are made of individual electronic components that only perform one function each as packaged, which are known as discrete components, although strictly the term discrete component refers to such a component with semiconductor material such as individual transistors.
Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning.
A bed of nails tester is a traditional electronic test fixture used for in-circuit testing. It has numerous pins inserted into holes in an epoxy phenolic glass cloth laminated sheet (G-10) which are aligned using tooling pins to make contact with test points on a printed circuit board and are also connected to a measuring unit by wires. Named by analogy with a real-world bed of nails, these devices contain an array of small, spring-loaded pogo pins; each pogo pin makes contact with one node in the circuitry of the DUT. By pressing the DUT down against the bed of nails, reliable contact can be quickly and simultaneously made with hundreds or even thousands of individual test points within the circuitry of the DUT. The hold-down force may be provided manually or by means of a vacuum or a mechanical presser, thus pulling the DUT downwards onto the nails.
In-system programming (ISP), or also called in-circuit serial programming (ICSP), is the ability of some programmable logic devices, microcontrollers, chipsets and other embedded devices to be programmed while installed in a complete system, rather than requiring the chip to be programmed prior to installing it into the system. It also allows firmware updates to be delivered to the on-chip memory of microcontrollers and related processors without requiring specialist programming circuitry on the circuit board, and simplifies design work.
A test engineer is a professional who determines how to create a process that would best test a particular product in manufacturing and related disciplines, in order to assure that the product meets applicable specifications. Test engineers are also responsible for determining the best way a test can be performed in order to achieve adequate test coverage. Often test engineers also serve as a liaison between manufacturing, design engineering, sales engineering and marketing communities as well.
A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile. Specific types include test prods, oscilloscope probes and current probes. A test probe is often supplied as a test lead, which includes the probe, cable and terminating connector.
A pogo pin or spring-loaded pin is a type of electrical connector mechanism that is used in many modern electronic applications and in the electronics testing industry. They are used for their improved durability over other electrical contacts, and the resilience of their electrical connection to mechanical shock and vibration.
An electronic circuit is composed of individual electronic components, such as resistors, transistors, capacitors, inductors and diodes, connected by conductive wires or traces through which electric current can flow. It is a type of electrical circuit. For a circuit to be referred to as electronic, rather than electrical, generally at least one active component must be present. The combination of components and wires allows various simple and complex operations to be performed: signals can be amplified, computations can be performed, and data can be moved from one place to another.
Bead probe technology (BPT) is technique used to provide electrical access to printed circuit board (PCB) circuitry for performing in-circuit testing (ICT). It makes use of small beads of solder placed onto the board's traces to allow measuring and controlling of the signals using a test probe. This permits test access to boards on which standard ICT test pads are not feasible due to space constraints.
Flying probes are test probes used for testing both bare circuit boards and boards loaded with components. Flying probes were introduced in the late 1980’s and can be found in many manufacturing and assembly operations, most often in manufacturing of electronic printed circuit boards. A flying probe tester uses one or more test probes to make contact with the circuit board under test; the probes are moved from place to place on the circuit board to carry out tests of multiple conductors or components. Flying probe testers are a more flexible alternative to bed of nails testers, which use multiple contacts to simultaneously contact the board and which rely on electrical switching to carry out measurements.
An LCR meter is a type of electronic test equipment used to measure the inductance (L), capacitance (C), and resistance (R) of an electronic component. In the simpler versions of this instrument the impedance was measured internally and converted for display to the corresponding capacitance or inductance value. Readings should be reasonably accurate if the capacitor or inductor device under test does not have a significant resistive component of impedance. More advanced designs measure true inductance or capacitance, as well as the equivalent series resistance of capacitors and the Q factor of inductive components.
Capacitors have many uses in electronic and electrical systems. They are so ubiquitous that it is rare that an electrical product does not include at least one for some purpose. Capacitors allow only AC signals to pass when they are charged blocking DC signals. The main components of filters are capacitors. Capacitors have the ability to connect one circuit segment to another. Capacitors are used by Dynamic Random Access Memory (DRAM) devices to represent binary information as bits.
An ESR meter is a two-terminal electronic measuring instrument designed and used primarily to measure the equivalent series resistance (ESR) of real capacitors; usually without the need to disconnect the capacitor from the circuit it is connected to. Other types of meters used for routine servicing, including normal capacitance meters, cannot be used to measure a capacitor's ESR, although combined meters are available that measure both ESR and out-of-circuit capacitance. A standard (DC) milliohmmeter or multimeter cannot be used to measure ESR, because a steady direct current cannot be passed through the capacitor. Most ESR meters can also be used to measure non-inductive low-value resistances, whether or not associated with a capacitor; this leads to several additional applications described below.
Circuit Check is an American company with about 225 employees and seven direct operations in six countries. Headquartered in Maple Grove, Minnesota, it is one of the largest manufacturers of electronic and mechanical test fixtures in North America, . The company also manufactures Automatic Test Equipment for end-of-line manufacturing test. The company uses either a Microsoft Excel-driven "CCITest" software platform, or the National Instruments LabVIEW software platform. They have a variety of clients in different industries which include: Automotive, Military & Aerospace, Medical, Industrial, and Computer Networking.
In the electronics industry, embedded instrumentation refers to the integration of test and measurement instrumentation into semiconductor chips. Embedded instrumentation differs from embedded system, which are electronic systems or subsystems that usually comprise the control portion of a larger electronic system. Instrumentation embedded into chips is employed in a variety of electronic test applications, including validating and testing chips themselves, validating, testing and debugging the circuit boards where these chips are deployed, and troubleshooting systems once they have been installed in the field.
