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A microscope is a laboratory instrument used to examine objects that are too small to be seen by the naked eye. Microscopy is the science of investigating small objects and structures using a microscope. Microscopic means being invisible to the eye unless aided by a microscope.
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image. In the most common SEM mode, secondary electrons emitted by atoms excited by the electron beam are detected using a secondary electron detector. The number of secondary electrons that can be detected, and thus the signal intensity, depends, among other things, on specimen topography. Some SEMs can achieve resolutions better than 1 nanometer.
Surface science is the study of physical and chemical phenomena that occur at the interface of two phases, including solid–liquid interfaces, solid–gas interfaces, solid–vacuum interfaces, and liquid–gas interfaces. It includes the fields of surface chemistry and surface physics. Some related practical applications are classed as surface engineering. The science encompasses concepts such as heterogeneous catalysis, semiconductor device fabrication, fuel cells, self-assembled monolayers, and adhesives. Surface science is closely related to interface and colloid science. Interfacial chemistry and physics are common subjects for both. The methods are different. In addition, interface and colloid science studies macroscopic phenomena that occur in heterogeneous systems due to peculiarities of interfaces.
Electron energy loss spectroscopy (EELS) is a form of electron microscopy in which a material is exposed to a beam of electrons with a known, narrow range of kinetic energies. Some of the electrons will undergo inelastic scattering, which means that they lose energy and have their paths slightly and randomly deflected. The amount of energy loss can be measured via an electron spectrometer and interpreted in terms of what caused the energy loss. Inelastic interactions include phonon excitations, inter- and intra-band transitions, plasmon excitations, inner shell ionizations, and Cherenkov radiation. The inner-shell ionizations are particularly useful for detecting the elemental components of a material. For example, one might find that a larger-than-expected number of electrons comes through the material with 285 eV less energy than they had when they entered the material. This is approximately the amount of energy needed to remove an inner-shell electron from a carbon atom, which can be taken as evidence that there is a significant amount of carbon present in the sample. With some care, and looking at a wide range of energy losses, one can determine the types of atoms, and the numbers of atoms of each type, being struck by the beam. The scattering angle can also be measured, giving information about the dispersion relation of whatever material excitation caused the inelastic scattering.
A microprobe is an instrument that applies a stable and well-focused beam of charged particles to a sample.
An electron microprobe (EMP), also known as an electron probe microanalyzer (EPMA) or electron micro probe analyzer (EMPA), is an analytical tool used to non-destructively determine the chemical composition of small volumes of solid materials. It works similarly to a scanning electron microscope: the sample is bombarded with an electron beam, emitting x-rays at wavelengths characteristic to the elements being analyzed. This enables the abundances of elements present within small sample volumes to be determined, when a conventional accelerating voltage of 15-20 kV is used. The concentrations of elements from lithium to plutonium may be measured at levels as low as 100 parts per million (ppm), material dependent, although with care, levels below 10 ppm are possible. The ability to quantify lithium by EPMA became a reality in 2008.
A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis. The rastering of the beam across the sample makes STEM suitable for analytical techniques such as Z-contrast annular dark-field imaging, and spectroscopic mapping by energy dispersive X-ray (EDX) spectroscopy, or electron energy loss spectroscopy (EELS). These signals can be obtained simultaneously, allowing direct correlation of images and spectroscopic data.
Annular dark-field imaging is a method of mapping samples in a scanning transmission electron microscope (STEM). These images are formed by collecting scattered electrons with an annular dark-field detector.
Joseph Irwin Goldstein was an American scientist and engineer, working mainly in the fields of materials science and mechanical engineering. He was a Professor of Mechanical Engineering and emeritus Dean of Engineering at the University of Massachusetts Amherst. His research into the nature of outer-space materials led to the naming of an asteroid after him in 2000, 4989 Joegoldstein.
Sir Charles William Oatley OBE, FRS FREng was Professor of Electrical Engineering, University of Cambridge, 1960–1971, and developer of one of the first commercial scanning electron microscopes. He was also a founder member of the Royal Academy of Engineering.
The Microscopy Society of America (MSA) was founded in 1942 as The Electron Microscope Society of America and is a non-profit organization that provides microanalytical facilities for studies within the sciences. Currently, there are approximately 3000 members. The society holds an annual meeting, which is usually held in the beginning of August. It has 30 local affiliates across the United States. The society has a program for examining and certifying technologists of electron microscopes. The organization produces two journals: Microscopy Today, and Microscopy and Microanalysis. As of 2022, the President is Deborah F. Kelly.
Nestor J. Zaluzec is an American scientist and inventor who works at Argonne National Laboratory. He invented and patented the Scanning Confocal Electron Microscope. and the π Steradian Transmission X-ray Detector for Electron-Optical Beam Lines and Microscopes.
Vernon Ellis Cosslett, FRS was a British microscopist.
David Bernard Williams was the dean of the College of Engineering at the Ohio State University from 2011-2021. He was previously the fifth president of the University of Alabama in Huntsville in Huntsville, Alabama from March 2007 until April 2011, and Vice Provost for Research and Harold Chambers Senior Professor of Materials Science and Engineering at Lehigh University in Bethlehem, Pennsylvania.
Ondrej L. Krivanek is a Czech/British physicist resident in the United States, and a leading developer of electron-optical instrumentation. He won the Kavli Prize for Nanoscience in 2020 for his substantial innovations in atomic resolution electron microscopy.
SEM-XRF is an established technical term for adding a X-ray generator to a Scanning Electron Microscope (SEM). Technological progress in the fields of small-spot low-power X-ray tubes and of polycapillary X-ray optics has enabled the development of compact micro-focus X-ray sources that can be attached to a SEM equipped for energy-dispersive X-ray spectroscopy.
Peter David Nellist, is a British physicist and materials scientist, currently a professor in the Department of Materials at the University of Oxford. He is noted for pioneering new techniques in high-resolution electron microscopy.
Mary Grace Burke is an American materials scientist who is an emeritus professor at the University of Manchester. She was awarded the 2020 International Metallographic Society Henry Clifton Sorby Award and is the President of the Royal Microscopical Society.
Raimond Bernard René Castaing, also spelt as Raymond Castaing, was a French solid state physicist and inventor of various materials characterization methods. He was the founder of the French school of microanalysis and is referred to as the father of microanalysis.
References
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- 1 2 3 4 5 6 7 "Peter Duncumb". London: Royal Society. One or more of the preceding sentences may incorporate text from the royalsociety.org website where "all text published under the heading 'Biography' on Fellow profile pages is available under Creative Commons Attribution 4.0 International License." "Royal Society Terms, conditions and policies". Archived from the original on 2017-07-10. Retrieved 2016-03-09.
{{cite web}}: CS1 maint: bot: original URL status unknown (link), "Intellectual property rights" - ↑ Heinrich, K. F. J.; Newbury, Dale E., eds. (1991). Electron Probe Quantitation. Boston, MA: Springer US. doi:10.1007/978-1-4899-2617-3. ISBN 978-1-4899-2619-7. S2CID 32240607.
- ↑ Melford, D.A. (2004). "3.4 Tube Investments Research Laboratories and the Scanning Electron Probe Microanalyser". Advances in Imaging and Electron Physics. Vol. 133. Elsevier. pp. 289–308. doi:10.1016/s1076-5670(04)33025-9. ISBN 978-0-12-014775-5. ISSN 1076-5670.
- ↑ Cosslett, V.E. (2004). "3.1 The Development of the X-ray Projection Microscope and the X-ray Microprobe Analyser at the Cavendish Laboratory". Advances in Imaging and Electron Physics. Vol. 133. Elsevier. pp. 237–250. doi:10.1016/s1076-5670(04)33019-3. ISBN 978-0-12-014775-5. ISSN 1076-5670.
- ↑ "Announcements". Physics Bulletin. IOP Publishing. 17 (2): 37–38. 1966. doi:10.1088/0031-9112/17/2/001. ISSN 0031-9112.
- ↑ "EC/1977/16: Duncumb, Peter". The Royal Society . Retrieved 20 July 2017.
- ↑ "International Metallographic Society". Microscopy and Microanalysis. Cambridge University Press (CUP). 19 (S3): 41–45. 2013-07-23. Bibcode:2013MiMic..19S..41.. doi:10.1017/s1431927613013111. ISSN 1431-9276. S2CID 232392666.
- ↑ "Peter Duncumb Award for Excellence in Microanalysis". Microanalysis Society. Retrieved 2017-07-20.
