Scan chain is a technique used in design for testing. The objective is to make testing easier by providing a simple way to set and observe every flip-flop in an IC.The basic structure of scan include the following set of signals in order to control and observe the scan mechanism.
Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning.
In electronics, a flip-flop or latch is a circuit that has two stable states and can be used to store state information. A flip-flop is a bistable multivibrator. The circuit can be made to change state by signals applied to one or more control inputs and will have one or two outputs. It is the basic storage element in sequential logic. Flip-flops and latches are fundamental building blocks of digital electronics systems used in computers, communications, and many other types of systems.
An integrated circuit or monolithic integrated circuit is a set of electronic circuits on one small flat piece of semiconductor material that is normally silicon. The integration of large numbers of tiny transistors into a small chip results in circuits that are orders of magnitude smaller, cheaper, and faster than those constructed of discrete electronic components. The IC's mass production capability, reliability and building-block approach to circuit design has ensured the rapid adoption of standardized ICs in place of designs using discrete transistors. ICs are now used in virtually all electronic equipment and have revolutionized the world of electronics. Computers, mobile phones, and other digital home appliances are now inextricable parts of the structure of modern societies, made possible by the small size and low cost of ICs.
Scan_in and scan_out define the input and output of a scan chain. In a full scan mode usually each input drives only one chain and scan out observe one as well.
A scan enable pin is a special signal that is added to a design. When this signal is asserted, every flip-flop in the design is connected into a long shift register.
Clock signal which is used for controlling all the FFs in the chain during shift phase and the capture phase. An arbitrary pattern can be entered into the chain of flip-flops, and the state of every flip-flop can be read out.
In a full scan design, automatic test pattern generation (ATPG) is particularly simple. No sequential pattern generation is required - combinatorial tests, which are much easier to generate, will suffice. If you have a combinatorial test, it can be easily applied.
ATPG is an electronic design automation method/technology used to find an input sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, or to assist with determining the cause of failure. The effectiveness of ATPG is measured by the number of modeled defects, or fault models, detectable and by the number of generated patterns. These metrics generally indicate test quality and test application time. ATPG efficiency is another important consideration that is influenced by the fault model under consideration, the type of circuit under test, the level of abstraction used to represent the circuit under test, and the required test quality.
Assert scan mode, and set up the desired inputs.
De-assert scan mode, and apply one clock. Now the results of the test are captured in the target flip-flops.
Re-assert scan mode, and see if the combinatorial test passed.
In a chip that does not have a full scan design -- i.e., the chip has sequential circuits, such as memory elements that are not part of the scan chain, sequential pattern generation is required. Test pattern generation for sequential circuits searches for a sequence of vectors to detect a particular fault through the space of all possible vector sequences.
Even a simple stuck-at fault requires a sequence of vectors for detection in a sequential circuit. Also, due to the presence of memory elements, the controllability and observability of the internal signals in a sequential circuit are in general much more difficult than those in a combinational logic circuit. These factors make the complexity of sequential ATPG much higher than that of combinational ATPG.
Controllability is an important property of a control system, and the controllability property plays a crucial role in many control problems, such as stabilization of unstable systems by feedback, or optimal control.
In control theory, observability is a measure of how well internal states of a system can be inferred from knowledge of its external outputs. The observability and controllability of a system are mathematical duals. The concept of observability was introduced by Hungarian-American engineer Rudolf E. Kálmán for linear dynamic systems.
In digital circuit theory, combinational logic is a type of digital logic which is implemented by Boolean circuits, where the output is a pure function of the present input only. This is in contrast to sequential logic, in which the output depends not only on the present input but also on the history of the input. In other words, sequential logic has memory while combinational logic does not.
There are many variants:
Partial scan: Only some of the flip-flops are connected into chains.
Multiple scan chains: Two or more scan chains are built in parallel, to reduce the time to load and observe.
Test compression: the input to the scan chain is provided by on-board logic
Test compression is a technique used to reduce the time and cost of testing integrated circuits. The first ICs were tested with test vectors created by hand. It proved very difficult to get good coverage of potential faults, so Design for testability (DFT) based on scan and automatic test pattern generation (ATPG) were developed to explicitly test each gate and path in a design. These techniques were very successful at creating high-quality vectors for manufacturing test, with excellent test coverage. However, as chips got bigger the ratio of logic to be tested per pin increased dramatically, and the volume of scan test data started causing a significant increase in test time, and required tester memory. This raised the cost of testing.
Electronic design automation (EDA), also referred to as electronic computer-aided design (ECAD), is a category of software tools for designing electronic systems such as integrated circuits and printed circuit boards. The tools work together in a design flow that chip designers use to design and analyze entire semiconductor chips. Since a modern semiconductor chip can have billions of components, EDA tools are essential for their design.
Integrated circuit design, or IC design, is a subset of electronics engineering, encompassing the particular logic and circuit design techniques required to design integrated circuits, or ICs. ICs consist of miniaturized electronic components built into an electrical network on a monolithic semiconductor substrate by photolithography.
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Related Research Articles
In digital logic and computing, a counter is a device which stores the number of times a particular event or process has occurred, often in relationship to a clock signal. The most common type is a sequential digital logic circuit with an input line called the clock and multiple output lines. The values on the output lines represent a number in the binary or BCD number system. Each pulse applied to the clock input increments or decrements the number in the counter.
Digital electronics or digital (electronic) circuits are electronics that operate on digital signals. In contrast, analog circuits manipulate analog signals whose performance is more subject to manufacturing tolerance, signal attenuation and noise. Digital techniques are helpful because it is a lot easier to get an electronic device to switch into one of a number of known states than to accurately reproduce a continuous range of values.
In digital circuit theory, sequential logic is a type of logic circuit whose output depends not only on the present value of its input signals but on the sequence of past inputs, the input history as well. This is in contrast to combinational logic, whose output is a function of only the present input. That is, sequential logic has state (memory) while combinational logic does not.
JTAG is an industry standard for verifying designs and testing printed circuit boards after manufacture.
A fault model is an engineering model of something that could go wrong in the construction or operation of a piece of equipment. From the model, the designer or user can then predict the consequences of this particular fault. Fault models can be used in almost all branches of engineering.
Boundary scan is a method for testing interconnects on printed circuit boards or sub-blocks inside an integrated circuit. Boundary scan is also widely used as a debugging method to watch integrated circuit pin states, measure voltage, or analyze sub-blocks inside an integrated circuit.
A synchronous circuit is a digital circuit in which the changes in the state of memory elements are synchronized by a clock signal. In a sequential digital logic circuit, data is stored in memory devices called flip-flops or latches. The output of a flip-flop is constant until a pulse is applied to its "clock" input, upon which the input of the flip-flop is latched into its output. In a synchronous logic circuit, an electronic oscillator called the clock generates a string of pulses, the "clock signal". This clock signal is applied to every storage element, so in an ideal synchronous circuit, every change in the logical levels of its storage components is simultaneous. Ideally, the input to each storage element has reached its final value before the next clock occurs, so the behaviour of the whole circuit can be predicted exactly. Practically, some delay is required for each logical operation, resulting in a maximum speed at which each synchronous system can run.
An asynchronous circuit, or self-timed circuit, is a sequential digital logic circuit which is not governed by a clock circuit or global clock signal. Instead it often uses signals that indicate completion of instructions and operations, specified by simple data transfer protocols. This type of circuit is contrasted with synchronous circuits, in which changes to the signal values in the circuit are triggered by repetitive pulses called a clock signal. Most digital devices today use synchronous circuits. However asynchronous circuits have the potential to be faster, and may also have advantages in lower power consumption, lower electromagnetic interference, and better modularity in large systems. Asynchronous circuits are an active area of research in digital logic design.
Metastability in electronics is the ability of a digital electronics system to persist for an unbounded time in an unstable equilibrium or metastable state.
In digital logic circuits, a digital signal is required to be within certain voltage or current limits to represent a '0' or '1' logic level for correct circuit operation; if the signal is within a forbidden intermediate range it may cause faulty behavior in logic gates the signal is applied to. In metastable states, the circuit may be unable to settle into a stable '0' or '1' logic level within the time required for proper circuit operation. As a result, the circuit can act in unpredictable ways, and may lead to a system failure, sometimes referred to as a "glitch". Metastability is an instance of Buridan's paradox.
A stuck-at fault is a particular fault model used by fault simulators and automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical '1', '0' and 'X'. For example, an input is tied to a logical 1 state during test generation to assure that a manufacturing defect with that type of behavior can be found with a specific test pattern. Likewise the input could be tied to a logical 0 to model the behavior of a defective circuit that cannot switch its output pin.
Not all faults can be analyzed using the stuck-at fault model. Compensation for static hazards, namely branching signals, can render a circuit untestable using this model. Also, redundant circuits cannot be tested using this model, since by design there is no change in any output as a result of a single fault.
Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current (Idd) in the quiescent state. The current consumed in the state is commonly called Iddq for Idd (quiescent) and hence the name.
A frequency divider, also called a clock divider or scaler or prescaler, is a circuit that takes an input signal of a frequency,
, and generates an output signal of a frequency:
Timing closure is the process by which a logic design consisting of primitive elements such as combinatorial logic gates and sequential logic gates is modified to meet its timing requirements. Unlike in a computer program where there is no explicit delay to perform a calculation, logic circuits have intrinsic and well defined delays to propagate inputs to outputs. In simple cases, the user can compute the path delay between elements manually. If the design is more than a dozen or so elements this is impractical. For example, the time delay along a path from the output of a D-Flip Flop, through combinatorial logic gates, then into the next D-Flip Flop input must satisfy the time period between synchronizing clock pulses to the two flip flops. When the delay through the elements is greater than the clock cycle time, the elements are said to be on the critical path. The circuit will not function when the path delay exceeds the clock cycle delay so modifying the circuit to remove the timing failure is an important part of the logic design engineer's task.
A Hardware Trojan (HT) is a malicious modification of the circuitry of an integrated circuit. A hardware Trojan is completely characterized by its physical representation and its behavior.
The payload of an HT is the entire activity that the Trojan executes when it is triggered. In general, malicious Trojans try to bypass or disable the security fence of a system: It can leak confidential information by radio emission. HTs also could disable, derange or destroy the entire chip or components of it.
In cryptography, Mutual Irregular Clocking KEYstream generator (MICKEY) is a stream cipher algorithm developed by Steve Babbage and Matthew Dodd. The cipher is designed to be used in hardware platforms with limited resources, and was one of the three ciphers accepted into Profile 2 of the eSTREAM portfolio. The algorithm is not patented and is free for any use.
Low Power flip-flops are flip-flops that are designed for low-power electronics, such as smartphones and notebooks. A flip-flop, or latch, is a circuit that has two stable states and can be used to store state information.
