Scan chain is a technique used in design for testing. The objective is to make testing easier by providing a simple way to set and observe every flip-flop in an IC.The basic structure of scan include the following set of signals in order to control and observe the scan mechanism.
Scan_in and scan_out define the input and output of a scan chain. In a full scan mode usually each input drives only one chain and scan out observe one as well.
A scan enable pin is a special signal that is added to a design. When this signal is asserted, every flip-flop in the design is connected into a long shift register.
Clock signal which is used for controlling all the flip-flops in the chain during shift phase and the capture phase. An arbitrary pattern can be entered into the chain of flip-flops, and the state of every flip-flop can be read out.
In a full scan design, automatic test pattern generation (ATPG) is particularly simple. No sequential pattern generation is required - combinatorial tests, which are much easier to generate, will suffice. If you have a combinatorial test, it can be easily applied.
Assert scan mode, and set up the desired inputs.
De-assert scan mode, and apply one clock. Now the results of the test are captured in the target flip-flops.
Re-assert scan mode, and see if the combinatorial test passed.
In a chip that does not have a full scan design -- i.e., the chip has sequential circuits, such as memory elements that are not part of the scan chain, sequential pattern generation is required. Test pattern generation for sequential circuits searches for a sequence of vectors to detect a particular fault through the space of all possible vector sequences.
Even a simple stuck-at fault requires a sequence of vectors for detection in a sequential circuit. Also, due to the presence of memory elements, the controllability and observability of the internal signals in a sequential circuit are in general much more difficult than those in a combinational logic circuit. These factors make the complexity of sequential ATPG much higher than that of combinational ATPG.
There are many variants:
Partial scan: Only some of the flip-flops are connected into chains.
Multiple scan chains: Two or more scan chains are built in parallel, to reduce the time to load and observe.
Test compression: the input to the scan chain is provided by on-board logic.
In digital logic and computing, a counter is a device which stores the number of times a particular event or process has occurred, often in relationship to a clock. The most common type is a sequential digital logic circuit with an input line called the clock and multiple output lines. The values on the output lines represent a number in the binary or BCD number system. Each pulse applied to the clock input increments or decrements the number in the counter.
Digital electronics is a field of electronics involving the study of digital signals and the engineering of devices that use or produce them. This is in contrast to analog electronics which work primarily with analog signals. Despite the name, digital electronics designs includes important analog design considerations.
VHDL is a hardware description language that can model the behavior and structure of digital systems at multiple levels of abstraction, ranging from the system level down to that of logic gates, for design entry, documentation, and verification purposes. The language was developed for the US military VHSIC program in the 1980s, and has been standardized by the Institute of Electrical and Electronics Engineers (IEEE) as IEEE Std 1076; the latest version of which is IEEE Std 1076-2019. To model analog and mixed-signal systems, an IEEE-standardized HDL based on VHDL called VHDL-AMS has been developed.
In automata theory, sequential logic is a type of logic circuit whose output depends on the present value of its input signals and on the sequence of past inputs, the input history. This is in contrast to combinational logic, whose output is a function of only the present input. That is, sequential logic has state (memory) while combinational logic does not.
In electronics and especially synchronous digital circuits, a clock signal is an electronic logic signal which oscillates between a high and a low state at a constant frequency and is used like a metronome to synchronize actions of digital circuits. In a synchronous logic circuit, the most common type of digital circuit, the clock signal is applied to all storage devices, flip-flops and latches, and causes them all to change state simultaneously, preventing race conditions.
ATPG is an electronic design automation method or technology used to find an input sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, or to assist with determining the cause of failure. The effectiveness of ATPG is measured by the number of modeled defects, or fault models, detectable and by the number of generated patterns. These metrics generally indicate test quality and test application time. ATPG efficiency is another important consideration that is influenced by the fault model under consideration, the type of circuit under test, the level of abstraction used to represent the circuit under test, and the required test quality.
JTAG is an industry standard for verifying designs of and testing printed circuit boards after manufacture.
A fault model is an engineering model of something that could go wrong in the construction or operation of a piece of equipment. From the model, the designer or user can then predict the consequences of this particular fault. Fault models can be used in almost all branches of engineering.
Boundary scan is a method for testing interconnects on printed circuit boards or sub-blocks inside an integrated circuit. Boundary scan is also widely used as a debugging method to watch integrated circuit pin states, measure voltage, or analyze sub-blocks inside an integrated circuit.
Asynchronous circuit is a sequential digital logic circuit that does not use a global clock circuit or signal generator to synchronize its components. Instead, the components are driven by a handshaking circuit which indicates a completion of a set of instructions. Handshaking works by simple data transfer protocols. Many synchronous circuits were developed in early 1950s as part of bigger asynchronous systems. Asynchronous circuits and theory surrounding is a part of several steps in integrated circuit design, a field of digital electronics engineering.
In electronics, metastability is the ability of a digital electronic system to persist for an unbounded time in an unstable equilibrium or metastable state. In digital logic circuits, a digital signal is required to be within certain voltage or current limits to represent a '0' or '1' logic level for correct circuit operation; if the signal is within a forbidden intermediate range it may cause faulty behavior in logic gates the signal is applied to. In metastable states, the circuit may be unable to settle into a stable '0' or '1' logic level within the time required for proper circuit operation. As a result, the circuit can act in unpredictable ways, and may lead to a system failure, sometimes referred to as a "glitch". Metastability is an instance of the Buridan's ass paradox.
A stuck-at fault is a particular fault model used by fault simulators and automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical '1', '0' and 'X'. For example, an input is tied to a logical 1 state during test generation to assure that a manufacturing defect with that type of behavior can be found with a specific test pattern. Likewise the input could be tied to a logical 0 to model the behavior of a defective circuit that cannot switch its output pin. Not all faults can be analyzed using the stuck-at fault model. Compensation for static hazards, namely branching signals, can render a circuit untestable using this model. Also, redundant circuits cannot be tested using this model, since by design there is no change in any output as a result of a single fault.
Design for testing or design for testability (DFT) consists of IC design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning.
In computer architecture, clock gating is a popular power management technique used in many synchronous circuits for reducing dynamic power dissipation, by removing the clock signal when the circuit, or a subpart of it, is not in use or ignores clock signal. Clock gating saves power by pruning the clock tree, at the cost of adding more logic to a circuit. Pruning the clock disables portions of the circuitry so that the flip-flops in them do not switch state, as switching the state consumes power. When not being switched, the switching power consumption goes to zero, and only leakage currents are incurred.
Iddq testing is a method for testing CMOS integrated circuits for the presence of manufacturing faults. It relies on measuring the supply current (Idd) in the quiescent state. The current consumed in the state is commonly called Iddq for Idd (quiescent) and hence the name.
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Test compression is a technique used to reduce the time and cost of testing integrated circuits. The first ICs were tested with test vectors created by hand. It proved very difficult to get good coverage of potential faults, so Design for testability (DFT) based on scan and automatic test pattern generation (ATPG) were developed to explicitly test each gate and path in a design. These techniques were very successful at creating high-quality vectors for manufacturing test, with excellent test coverage. However, as chips got bigger and more complex the ratio of logic to be tested per pin increased dramatically, and the volume of scan test data started causing a significant increase in test time, and required tester memory. This raised the cost of testing.
A Hardware Trojan (HT) is a malicious modification of the circuitry of an integrated circuit. A hardware Trojan is completely characterized by its physical representation and its behavior. The payload of an HT is the entire activity that the Trojan executes when it is triggered. In general, Trojans try to bypass or disable the security fence of a system: for example, leaking confidential information by radio emission. HTs also could disable, damage or destroy the entire chip or components of it.
In electronics, flip-flops and latches are circuits that have two stable states that can store state information – a bistable multivibrator. The circuit can be made to change state by signals applied to one or more control inputs and will output its state. It is the basic storage element in sequential logic. Flip-flops and latches are fundamental building blocks of digital electronics systems used in computers, communications, and many other types of systems.
In cryptography, Mutual Irregular Clocking KEYstream generator (MICKEY) is a stream cipher algorithm developed by Steve Babbage and Matthew Dodd. The cipher is designed to be used in hardware platforms with limited resources, and was one of the three ciphers accepted into Profile 2 of the eSTREAM portfolio. The algorithm is not patented and is free for any use.
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