Bahgat G. Sammakia

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Benjamin Gebhart; Yogesh Jaluria; Roop L. Mahajan; Bahgat Sammakia (1988). Buoyancy Induced Flows and Transport. Hemisphere. ISBN   0-89116-402-2.
  • Arunasalam, Parthiban; Ackler, Harold D.; Sammakia, Bahgat G. (Jul–Aug 2006). "Microfabrication of ultrahigh density wafer-level thin film compliant interconnects for through-silicon-via based chip stacks". Journal of Vacuum Science and Technology B . 24 (4): 1780–1784. Bibcode:2006JVSTB..24.1780A. doi:10.1116/1.2210003.
  • Desai, Anand; Geer, James; Sammakia, Bahgat (March 2006). "Models of steady heat conduction in multiple cylindrical domains". Journal of Electronic Packaging. 128 (1): 10–17. doi:10.1115/1.2159003.
  • Desai, Anand; Mahajan, Sanket; Subbarayan, Ganesh; Jones, Wayne; Geer, James; Sammakia, Bahgat (March 2006). "A numerical study of transport in a thermal interface material enhanced with carbon nanotubes". Journal of Electronic Packaging. 128 (1): 92–97. doi:10.1115/1.2161231.
  • Watson, S.P.; Murray, B.T.; Sammakia, B.G. (June 2001). "Computational parameter study of chip scale package array cooling". IEEE Transactions on Components and Packaging Technologies. 24 (2): 184–190. doi:10.1109/6144.926381.
  • Sathe, Sanjeev B.; Sammakia, Bahgat G. (June 2000). "A numerical study of the thermal performance of a tape ball grid array (TBGA) package". Journal of Electronic Packaging. 122 (2): 107–114. doi:10.1115/1.483141.
  • Tyan-Min Niu; Sammakia, B.G.; Sathe, S. (December 1999). "Void-effect modeling of flip-chip encapsulation on ceramic substrate". IEEE Transactions on Components and Packaging Technologies. 22 (4): 484–487. doi:10.1109/6144.814962.
  • Tran, S.K.; Questad, D.L.; Sammakia, B.G. (December 1999). "Adhesion issues in flip-chip on organic modules". IEEE Transactions on Components and Packaging Technologies. 22 (4): 519–524. doi:10.1109/6144.814967.
  • Sathe, S.; Sammakia, B. (November 1998). "A review of recent developments in some practical aspects of air-cooled electronic packages". Journal of Heat Transfer. 120 (4): 830–839. doi:10.1115/1.2825902.
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    References

    1. "Error". portal.rfsuny.org. Archived from the original on 13 July 2018. Retrieved 1 December 2017.
    2. SUNY. "Grace Wang - SUNY". www.suny.edu. Retrieved 2018-07-13.
    3. "SUNY Poly chooses next interim president". www.bizjournals.com. Retrieved 2018-07-13.
    4. "Bahgat Sammakia". Archived from the original on 13 November 2006. Retrieved 1 December 2017.
    5. "ProQuest Dissertation Express - Welcome!". wwwlib.umi.com. Retrieved 1 December 2017.
    6. "Binghamton University - IEEC Landing". www.ieec.binghamton.edu. Retrieved 1 December 2017.
    7. "Inside Binghamton University". Archived from the original on 3 September 2006. Retrieved 1 December 2017.
    8. "Faculty Spotlight - Dr. Bahgat Sammakia". research.binghamton.edu. Retrieved 1 December 2017.
    9. "Journals Publications". Archived from the original on 9 December 2006. Retrieved 1 December 2017.
    Bahgat G. Sammakia
    Bahgat Sammakia.jpg
    2nd President and Chief Executive Officer of the SUNY Polytechnic Institute
    In office
    November 3, 2016 June 30, 2018