Purushottam Chakraborty | |
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| Born | 1953 (age 71–72) Kolkata |
| Alma mater | Brahmananda Keshab Chandra College, Presidency College, Kolkata, University of Calcutta |
| Known for | Secondary Ion Mass Spectrometry, Ion Beam Analysis of Materials and Photonics |
Purushottam Chakraborty is an Indian Physicist who researches materials analysis using ion beams and secondary ion mass spectrometry (SIMS). [1] [2]
He is a former senior professor of Physics at Saha Institute of Nuclear Physics, Kolkata, India [3] & former adjunct professor of Physics at University of Pretoria, South Africa. [4]
He is a member of the Board of Editors, International Journal of Modern Physics B (World Scientific, Singapore) and the board of editors, Modern Physics Letters B (World Scientific, Singapore). He has been a Guest Editor for 2D Materials: Perspectives. [5]
Chakraborty did his Ph.D. on the "Design and development of a radio-frequency (RF) quadrupole mass spectrometer (QMS) for the study of secondary-ions emitted from ion-bombarded metal surfaces". The QMS was initially fabricated by Profs S D Dey, S B Karmohapatro and B M Banerjee at Saha Institute of Nuclear Physics, Kolkata, India.
Chakraborty upgraded the equipment by lowering the frequency of the RF voltage so that the QMS could handle the masses above 200 amu and also by converting the system into a full-fledged UHV-based Secondary Ion Mass Spectrometry (SIMS) Setup at Saha Institute of Nuclear Physics, Kolkata. Making use of the indigenous SIMS instrument, he initiated the experimental research on Ion-Matter Interactions, for which he was awarded the Premchand Roychand Scholarship (PRS) and the Mouat Medal by the University of Calcutta in 1986. Later, he pursued research on Atomic Collisions in Solids, Inelastic Ion-Surface Collisions and Ion-Beam Modifications & Analysis of Materials. His other research areas include Low-Dimensional Materials and Nanoscale Systems, X-UV Optics, Optoelectronics, Nonlinear Optics, Photonics and Plasmonics.
Chakraborty worked on the fabrication of 'layered Synthetic Microstructures (LSM)', at the FOM-Institute for Atomic and Molecular Physics – Amsterdam (AMOLF), in collaboration with the Philips Research Laboratories Netherlands. [6] [7]
The methodology of fabricating aspherically-curved mirrors for reflecting soft x-rays at near-normal incidence was employed to construct 'Soft X-ray Telescopes' for imaging Solar Corona and Solar Flakes in the X-UV domain of electromagnetic spectrum. The European Space Agency, Netherlands also used this technique for reflecting X-rays with wavelengths of 1.85 and 10 to 17 Angstroms.
Chakraborty's "Alkali-element based MCsn+ Molecular-ion SIMS" approach has been used for the quantitative analysis of materials without calibration standards, in general and for the composition analysis of surfaces and interfaces of ultrathin films, superlattices and nanostructured materials, in particular. [8]
Chakraborty's work on 'Ion-beam Synthesis of Metal-Glass Nanocomposites' has led to the development of novel photonic materials, thereby opening the way for advances in all-optical switching, coupled waveguides and optical computation. [9] [10]
Chakraborty has delivered invited lectures at universities and research institutes such as Imperial College London, UK; Vanderbilt University, USA; [11] Yale University, USA; Asian Institute of Technology, Thailand; [12] Kyoto University, Japan; and CERN (Geneva), Switzerland [13] to name a few.