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References
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- 1 2 "Richard R. Freeman".
- ↑ "Electromagnetic Radiation".
- 1 2 "APS Fellow Archive".
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- ↑ "OSU Nabs New Dean for Math and Sciences".
- ↑ "Professor Richard R. Freeman Takes One Year Sabbatical".
- ↑ Freeman, Richard R.; Kleppner, Daniel (1976). "Core polarization and quantum defects in high-angular-momentum states of alkali atoms". Physical Review A. 14 (5): 1614–1619. Bibcode:1976PhRvA..14.1614F. doi:10.1103/PhysRevA.14.1614.
- ↑ "Light absorption in ultrashort scale length plasmas".
- ↑ Link, A.; Freeman, R. R.; Schumacher, D. W.; Van Woerkom, L. D. (2011). "Effects of target charging and ion emission on the energy spectrum of emitted electrons". Physics of Plasmas. 18 (5): 053107. Bibcode:2011PhPl...18e3107L. doi:10.1063/1.3587123.
- ↑ "Soft-x-ray projection lithography experiments using Schwarzschild imaging optics".
- ↑ Tichenor, Daniel A.; Kubiak, Glenn D.; Malinowski, Michael E.; Stulen, Richard H.; Haney, Steven J.; Berger, Kurt W.; Nissen, Rodney P.; Wilkerson, G. A.; Paul, Phillip H.; Birtola, S. R.; Jin, P. S.; Arling, Richard W.; Ray-Chaudhuri, Avijit K.; Sweatt, William C.; Chow, Weng W.; Bjorkholm, John E.; Freeman, Richard R.; Himel, Marc D.; MacDowell, Alastair A.; Tennant, Donald M.; Fetter, Linus A.; Wood Ii, Obert R.; Waskiewicz, Warren K.; White, Donald L.; Windt, David L.; Jewell, Tanya E. (1994). "Development of a laboratory extreme-ultraviolet lithography tool". In Patterson, David O (ed.). Electron-Beam, X-Ray, and Ion-Beam Submicrometer Lithographies for Manufacturing IV. Vol. 2194. p. 95. doi:10.1117/12.175834. S2CID 135772193.
- ↑ Waskiewicz, Warren K.; Biddick, Christopher J.; Blakey, Myrtle I.; Brady, Kevin J.; Camarda, Ron M.; Connelly, Wayne F.; Crorken, A. H.; Custy, J. P.; Demarco, R.; Farrow, Reginald C.; Felker, Joseph A.; Fetter, Linus A.; Freeman, Richard R.; Harriott, Lloyd R.; Hopkins, Leslie C.; Huggins, Harold A.; Kasica, Richard J.; Knurek, Chester S.; Kraus, Joseph S.; Liddle, James A.; Mkrtchyan, Masis M.; Novembre, Anthony E.; Peabody, Jr, Milton L.; Rutberg, Len; Wade, Harry H.; Watson, Pat G.; Werder, Kurt S.; Windt, David L.; Tarascon-Auriol, Regine G.; et al. (1997). "SCALPEL proof-of-concept system: preliminary lithography results". In Seeger, David E (ed.). Emerging Lithographic Technologies. Vol. 3048. p. 255. doi:10.1117/12.275786. S2CID 137021646.
- ↑ "Above-Threshold Ionization with subpicosecond laser pulses".
- ↑ Link, Anthony; Chowdhury, Enam A.; Morrison, John T.; Ovchinnikov, Vladimir M.; Offermann, Dustin; Van Woerkom, Linn; Freeman, Richard R.; Pasley, John; Shipton, Erik; Beg, Farhat; Rambo, Patrick; Schwarz, Jens; Geissel, Matthias; Edens, Aaron; Porter, John L. (2006). "Development of an in situ peak intensity measurement method for ultraintense single shot laser-plasma experiments at the Sandia Z petawatt facility". Review of Scientific Instruments. 77 (10): 10E723. Bibcode:2006RScI...77jE723L. doi: 10.1063/1.2336469 .
- ↑ Jiang, Sheng; Krygier, Andrew G.; Schumacher, Douglass W.; Akli, Kramer U.; Freeman, Richard R. (2014). "Enhancing Bremsstrahlung production from ultraintense laser-solid interactions with front surface structures". The European Physical Journal D. 68 (10): 283. arXiv: 1405.0958 . Bibcode:2014EPJD...68..283J. doi:10.1140/epjd/e2014-50339-4. S2CID 119194795.
- ↑ Morrison, J. T.; Chowdhury, E. A.; Frische, K. D.; Feister, S.; Ovchinnikov, V. M.; Nees, J. A.; Orban, C.; Freeman, R. R.; Roquemore, W. M. (2015). "Backward-propagating MeV electrons from 1018 W/cm2 laser interactions with water". Physics of Plasmas. 22 (4): 043101. arXiv: 1501.02261 . Bibcode:2015PhPl...22d3101M. doi:10.1063/1.4916493. S2CID 119262288.
- ↑ Willis, Christopher; Poole, Patrick L.; Akli, Kramer U.; Schumacher, Douglass W.; Freeman, Richard R. (2015). "A confocal microscope position sensor for micron-scale target alignment in ultra-intense laser-matter experiments". Review of Scientific Instruments. 86 (5): 053303. Bibcode:2015RScI...86e3303W. doi: 10.1063/1.4921554 . PMID 26026518.
