A. F. J. Levi

Last updated
Anthony Levi
A.F.J. Levi faculty headshot.jpg
BornFebruary 3, 1959
London, United Kingdom
NationalityAmerican
Alma mater University of Sussex
University of Cambridge
Known for Microdisk nanolaser

Hot electron transport

Optimal semiconductor device design
Scientific career
Fields Physics
Electrical Engineering
Institutions Bell Laboratories
University of Southern California

Anthony F. J. Levi (born 1959) is a British-born engineer and academic. He is professor of electrical and computer engineering at the Department of Electrical and Computer Engineering of the University of Southern California (USC).

Contents

Research

Levi has published research on experimental semiconductor device physics, including the experimental realization of the microdisk laser [1] [2] for the study of semiconductor lasers at the nanoscale. He has published on hot electron spectroscopy in semiconductors, [3] ballistic electron transport in heterostructure bipolar transistors, [4] room temperature operation of unipolar transistors with ballistic electron transport, [5] and optimal design of small electronic and photonic systems. [6] He is also author of the textbook Applied Quantum Mechanics, [7] [8] currently in its third edition.

Working with Agilent Technologies, Levi co-developed an optical connector plug-in package capable of transmitting data at an aggregate rate of 10 Gb/s in late 2000. [9]

Working with the Paul Scherrer Institute and researchers at the USC Viterbi School of Engineering, Levi helped advance a technique for defect detection in manufactured chips as well as for reverse engineering of hardware-embedded circuit design. [10] [11]

In an interview with Reuters, Levi commented on supply chain concerns facing the chip industry in the U.S. during the COVID-19 pandemic, suggesting that such issues could be mitigated by focusing on rebuilding the U.S. chip manufacturing and packaging industry. [12]

Notable Talks

Publications

Books

Related Research Articles

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References

  1. ↑ McCall, S. L.; Levi, A. F. J.; Slusher, R. E.; Pearton, S. J.; Logan, R. A. (1992-01-20). “Whispering-gallery mode microdisk lasers” Applied Physics Letters. American Institute of Physics (AIP). 60 (3): 289-291. doi : 10.1063/1.106688 ISSN   0003-6951
  2. ↑ Levi, Barbara G. (September 1992). "What's the Shape of Things to Come in Semiconductor Lasers?". Physics Today. 45 (9): 17–18. Bibcode:1992PhT....45i..17L. doi:10.1063/1.2809793.
  3. ↑ Levi, A. F. J.; Hayes, J. R.; Platzman P. M.; Wiegmann, W. (1985-11-04). “Injected Hot Electron Transport in GaAs” Physical Review Letters. American Physical Society (APS). 55 (19): 2071-2073. doi : 10.1103/physrevlett.55.2071 PMID   10032002 ISSN   0031-9007
  4. ↑ Berthold, K.; Levi, A. F. J.; Walker, J.; Malik, R. J. (1988-06-27). “Extreme Nonequilibrium Electron Transport in Heterojunction Bipolar Transistors” Applied Physics Letters. American Institute of Physics (AIP). 52 (26): 2247-2249. doi : 10.1063/1.99545 ISSN   0003-6951
  5. ↑ Levi, A. F. J.; Chiu, T. H. (1987-09-28). “Room Temperature Operation of Hot Electron Transistors” Applied Physics Letters. American Institute of Physics (AIP). 51 (13): 984-986. doi : 10.1063/1.98784 ISSN   0003-6951
  6. ↑ Levi, A. F. J.; Haas, S. (2010-01-29). “Optimal Device Design” Cambridge: Cambridge University Press. doi : 10.1017/CBO9780511691881 ISBN   978-0-521-11660-2
  7. ↑ Frensley, William R. (January 2005). "Applied Quantum Mechanics". Physics Today. 58 (1): 55–56. Bibcode:2005PhT....58a..55L. doi: 10.1063/1.1881905 .
  8. ↑ Levi, A. F. J. (2023). “Applied Quantum Mechanics” (Third ed.). Cambridge University Press, ISBN   978-1-009-30807-6 doi : 10.1017/9781009308083
  9. ↑ Savage, Neil (August 1, 2002). "Linking With Light". IEEE Spectrum.
  10. ↑ "Groundbreaking Method Detects Defective Computer Chips". USC Viterbi News. October 8, 2019.
  11. ↑ "Technique Could Check Integrity of Computer Chips and Detect Tampering". Technology Networks. October 11, 2019.
  12. ↑ Nellis, Stephen; Jin, Hyunjoo (April 13, 2021). "Focus: Biden's chip dreams face reality check of supply chain complexity". Reuters.
  13. ↑ "Chip Scan: 3D X-Ray Imaging of CMOS Integrated Circuits". PSW Science. November 18, 2022.
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