Carol Trager-Cowan | |
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Born | Carol Trager |
Alma mater | University of Glasgow (BSc) University of St Andrews (MSc) Royal Holloway, University of London (PhD) |
Scientific career | |
Institutions | University of Strathclyde |
Thesis | The study of novel electrostatic electron lenses (1987) |
Doctoral advisor | Doug Heddle [1] |
Website | www |
Carol Trager-Cowan FRSE FInstP FRMS is a Scottish physicist who is a Reader (Associate Professor) in physics and Science Communicator at the University of Strathclyde. She works on scanning electron microscopy, including Electron backscatter diffraction (EBSD), diffraction contrast and cathodoluminescence imaging. [2] [3] [4]
Trager-Cowan was an undergraduate student at the University of Glasgow, where she earned a bachelor's degree in natural philosophy in 1983. [5] She moved to the University of St Andrews for her graduate studies, earning a master's degree in 1984. [5] Her dissertation considered hot electrons in Gallium arsenide. [6] She moved to Royal Holloway, University of London for her doctorate, completing her thesis on electrostatic electron lenses in 1987 supervised by Doug Heddle . [1] [5] She completed experimental and theoretical investigations into electrostatic lenses. [1]
Trager-Cowan is a Reader (Associate Professor) in Physics at the University of Strathclyde. She develops fast, non-destructive characterisation techniques to study crystalline materials. [2] In particular, Trager-Cowan works on nitride semiconductor thin films. Nitride semiconducting films form the basis of solid-state lighting, satellite communications and cable television. [2] The performance of nitride light emitting devices depends on the number of extended defects, which can cause scattering of light or charges and result in poor device performance with short lifetimes. [2] Defects limit device performance due to non-radiative recombination and high leakage currents. Extended defects including threading and partial dislocations, grain boundaries and stacking faults, and can be electrically active. Trager-Cowan develops sensitive characterisation techniques that can detect nanoscale defects, including electron backscatter diffraction and electron channeling contrast imaging. [2] These make it possible to uncover the structure, texture and strain within semiconducting crystals. Trager-Cowan uses the Timepix semiconductor hybrid pixel detector developed by CERN. Timepix allows direct electron detection with exceptional detail. [2] Electron channeling contrast imaging allows Trager-Cowan to analyse the failure mechanisms in nanoscale electronic devices. [2] Trager-Cowan is a member of ManuGaN, a multi-university collaboration to fabricate gallium nitride on a manufacturing scale. [7]
Trager-Cowan is involved in public engagement and outreach, delivering popular science lectures and running science workshops with schools. She was described by Gail McConnell as an inspiration. [8] Trager-Cowan has worked with the Royal Philosophical Society of Glasgow, Glasgow Science Festival and European Researchers Night. In 2007 she was named the "Strathclyder of the Year" in recognition for her work encouraging school students to study physics. [9] [10] She is an elected member of AcademiaNet and the University of Strathclyde Women in Science and Engineering group. [11] [12]
In recognition of her public engagement, Trager-Cowan was elected a Fellow of the Royal Society of Edinburgh (FRSE) in 2014. [13] She is a Fellow of the Institute of Physics (FInstP) and the Royal Microscopical Society. [14]
Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In the microscope an incident beam of electrons hits a tilted sample. As backscattered electrons leave the sample, they interact with the atoms and are both elastically diffracted and lose energy, leaving the sample at various scattering angles before reaching the phosphor screen forming Kikuchi patterns (EBSPs). The EBSD spatial resolution depends on many factors, including the nature of the material under study and the sample preparation. They can be indexed to provide information about the material's grain structure, grain orientation, and phase at the micro-scale. EBSD is used for impurities and defect studies, plastic deformation, and statistical analysis for average misorientation, grain size, and crystallographic texture. EBSD can also be combined with energy-dispersive X-ray spectroscopy (EDS), cathodoluminescence (CL), and wavelength-dispersive X-ray spectroscopy (WDS) for advanced phase identification and materials discovery.
David John Hugh Cockayne FRS FInstP was Professor in the physical examination of materials in the Department of Materials at the University of Oxford and professorial fellow at Linacre College from 2000 to 2009. He was the president of the International Federation of Societies for Microscopy from 2003 till 2007, then vice-president 2007 to 2010.
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Electron channelling contrast imaging (ECCI) is a scanning electron microscope (SEM) diffraction technique used in the study of defects in materials. These can be dislocations or stacking faults that are close to the surface of the sample, low angle grain boundaries or atomic steps. Unlike the use of transmission electron microscopy (TEM) for the investigation of dislocations, the ECCI approach has been called a rapid and non-destructive characterisation technique
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