Nanosurf

Last updated
Nanosurf AG
Company type Publicly unlisted company
Industry Nanotechnology
Founded1997 in Switzerland
FounderDominik Braendlin, Lukas Howald and Robert Sum
Headquarters,
Area served
Global
Key people
Dominik Ziegler (CEO), James Berwick (COO), Björn Pietzak (Head of Industrial Solutions), Mathias Gerardot(Head of Supply Chain), Bart Hoogenboom (Head of Development)
Products Atomic force microscopes and scanning tunneling microscopes
Website https://www.nanosurf.com

Nanosurf AG, headquartered in Liestal, Switzerland, is a developer, manufacturer and supplier of nano-microscopes for industrial and academic research, [1] as well as for educational purposes. [2] Nanosurf's atomic force microscopes (AFM) and scanning tunneling microscopes (STM) are used for metrological surface inspections and for the visualization of structures, and material properties on the nanometer scale. [3] [4]

Contents

Nanosurf worked with NASA's Phoenix Mars mission to provide the atomic force microscopy module for the Mars probe. [5]

History

In 1997, Nanosurf was awarded the "Start-up-Label" by the Swiss government agency for innovation (KTI). [6] Nanosurf was founded June 4, 1997, [7] in order to design scanning probe microscopes [8] that were accessible for everyone. The Nanosurf founders were inspired by Hans-Joachim Guentherodt, [9] the Director of the Swiss NCCR Nanoscale Science, head of the Institute of Physics of the University of Basel, coordinator of the Swiss Nanoscience Institute, and chairman of the National Center of Competence in Research (NCCR) "Nanoscale Science".

In 1998, The NASA Jet Propulsion Laboratory selected the Nanosurf atomic force microscope for its mission to Mars. Nanosurf joined a consortium consisting of the Institute of Microtechnology, University of Neuchatel, and the Institute of Physics, University of Basel to achieve this goal. Nanosurf was awarded the innovation prize by the Swiss Cantons of Basel-Stadt and Basel- Landschaft in 1998.

In 2000, Nanosurf was awarded the Swiss Technology Award by the Swiss federal industry agency. The easyScan atomic force microscope is introduced to the market. Nanosurf received the 2003 KMU Entrepreneurial award by the Chamber of Commerce of the Cantons of Basel-Landschaft and Basel-Stadt. In 2007, Nanosurf received the Swiss Technology Award (Vontobel Stiftung) for the automated Nanite AFM system. [10] On August 4, Phoenix Mars Probe was launched carrying a Nanosurf AFM scanner.

Since its founding in 1997, Nanosurf AG established subsidiaries in Boston and Santa Barbara (US), Langen (Germany), [11] Bracknell (United Kingdom), Shanghai (China), Hyderabad (India) and Singapore.

Product lines

Nanosurf invented the first scanning tunneling microscope (STM) with the compact size and stability to image individual atoms on a coffee table. In its early days, Nanosurf became known for educational AFMs, and over the course of the following decades moved more and more towards providing high-end instruments for research.

Nanosurf released one of the most versatile AFMs in 2020 the DriveAFM, which was awarded the Wiley award in 2023. [12]

Nanosurf offers the following instruments.

Phoenix Mars Lander Mission

Nanosurf, the University of Neuchâtel, and the University of Basel were part of a Swiss consortium [13] challenged to equip the Phoenix Mars Probe [14] with the first atomic force microscope in space. [15] [16] This atomic force microscope was designed to be part of the Microscopy, Electrochemistry, and a Conductivity Analyzer (MECA) unit built by NASA's Jet Propulsion Laboratory. [17] It was a key component of the Phoenix probe's ensemble of on-board scientific instruments. [18]

Nanosurf contributed to the Phoenix Mars Mission [19] with an AFM that recorded high-resolution images of Martian dust. These images allowed researchers to study the history of water on Mars, and represent the highest resolution images ever recorded on another planet. [18]

Nanosurf joined in developing, building and testing an atomic force microscope for planetary science applications, in particular for the study of Martian soil. [20] The system consists of a controller board, an electromagnetic scanner and micro-fabricated sensor-chip. Eight cantilevers with integrated, piezoresistive deflection sensors are aligned in a row and are engaged one after the other to provide redundancy in case of tip or cantilever failure. Silicon and molded diamond tips are used for probing the sample. Images can be recorded in both, static and dynamic operation mode. In the latter case, excitation of the resonance frequencies of the cantilevers is achieved by vibrating the whole chip with a piezoelectric disk.

This instrument represents the highest spatial resolution instrument ever produced for in situ planetary studies. The required level of operational robustness was achieved by using a redundant array of microfabricated cantilevers. [20]

First Atomic Force Microscope Image on Mars

First Atomic Force Microscope Image from Mars.jpg

The first image recorded by an atomic force microscope on another planet. [21] On July 9, 2008, Mars day 44 of the Phoenix Mars Mission, [22] the atomic force microscope on the Mars Lander recorded an image of a test grid, which serves as a calibration for the microscope. This image was successfully transmitted to Earth by the Phoenix Mars probe, and demonstrates full functionality of the nano-imaging device under the harsh Martian conditions, satisfying the NASA Phoenix team as well as the Swiss scientific team responsible for the development of the microscope. [20]

The area imaged by the microscope is 40 × 40  μm, small enough to fit on an eyelash. The grooves in this substrate are 14 μm (0.00055 in) apart, from center to center. The vertical dimension is exaggerated in the image to make surface details more visible. The grooves are 300 nm (1.2×10−5 in) deep.

Related Research Articles

<span class="mw-page-title-main">Microscope</span> Scientific instrument

A microscope is a laboratory instrument used to examine objects that are too small to be seen by the naked eye. Microscopy is the science of investigating small objects and structures using a microscope. Microscopic means being invisible to the eye unless aided by a microscope.

<span class="mw-page-title-main">Mariner program</span> NASA space program from 1962 to 1973

The Mariner program was conducted by the American space agency NASA to explore other planets. Between 1962 and late 1973, NASA's Jet Propulsion Laboratory (JPL) designed and built 10 robotic interplanetary probes named Mariner to explore the inner Solar System - visiting the planets Venus, Mars and Mercury for the first time, and returning to Venus and Mars for additional close observations.

<span class="mw-page-title-main">Viking program</span> Pair of NASA landers and orbiters sent to Mars in 1976

The Viking program consisted of a pair of identical American space probes, Viking 1 and Viking 2, which landed on Mars in 1976. The mission effort began in 1968 and was managed by the NASA Langley Research Center. Each spacecraft was composed of two main parts: an orbiter designed to photograph the surface of Mars from orbit, and a lander designed to study the planet from the surface. The orbiters also served as communication relays for the landers once they touched down.

<span class="mw-page-title-main">Atomic force microscopy</span> Type of microscopy

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.

<span class="mw-page-title-main">Mars Polar Lander</span> Failed 1999 robotic Mars lander

The Mars Polar Lander, also known as the Mars Surveyor '98 Lander, was a 290-kilogram robotic spacecraft lander launched by NASA on January 3, 1999, to study the soil and climate of Planum Australe, a region near the south pole on Mars. It formed part of the Mars Surveyor '98 mission. On December 3, 1999, however, after the descent phase was expected to be complete, the lander failed to reestablish communication with Earth. A post-mortem analysis determined the most likely cause of the mishap was premature termination of the engine firing prior to the lander touching the surface, causing it to strike the planet at a high velocity.

<i>Phoenix</i> (spacecraft) NASA Mars lander

Phoenix was an uncrewed space probe that landed on the surface of Mars on May 25, 2008, and operated until November 2, 2008. Phoenix was operational on Mars for 157 sols. Its instruments were used to assess the local habitability and to research the history of water on Mars. The mission was part of the Mars Scout Program; its total cost was $420 million, including the cost of launch.

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.

<span class="mw-page-title-main">Characterization (materials science)</span> Study of material structure and properties

Characterization, when used in materials science, refers to the broad and general process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science, without which no scientific understanding of engineering materials could be ascertained. The scope of the term often differs; some definitions limit the term's use to techniques which study the microscopic structure and properties of materials, while others use the term to refer to any materials analysis process including macroscopic techniques such as mechanical testing, thermal analysis and density calculation. The scale of the structures observed in materials characterization ranges from angstroms, such as in the imaging of individual atoms and chemical bonds, up to centimeters, such as in the imaging of coarse grain structures in metals.

<span class="mw-page-title-main">Gerd Binnig</span> German physicist (born 1947)

Gerd Binnig is a German physicist. He is most famous for having won the Nobel Prize in Physics jointly with Heinrich Rohrer in 1986 for the invention of the scanning tunneling microscope.

<span class="mw-page-title-main">Christoph Gerber</span> Swiss physicist

Christoph Gerber is a titular professor at the Department of Physics, University of Basel, Switzerland. He is the co-inventor of the atomic force microscope (AFM).

A recurrence tracking microscope (RTM) is a microscope that is based on the quantum recurrence phenomenon of an atomic wave packet. It is used to investigate the nano-structure on a surface.

<span class="mw-page-title-main">Photoconductive atomic force microscopy</span> Type of atomic force microscopy

Photoconductive atomic force microscopy (PC-AFM) is a variant of atomic force microscopy that measures photoconductivity in addition to surface forces.

<span class="mw-page-title-main">InSight</span> Mars lander, arrived November 2018

The Interior Exploration using Seismic Investigations, Geodesy and Heat Transport (InSight) mission was a robotic lander designed to study the deep interior of the planet Mars. It was manufactured by Lockheed Martin Space, was managed by NASA's Jet Propulsion Laboratory (JPL), and two of its three scientific instruments were built by European agencies. The mission launched on 5 May 2018 at 11:05:01 UTC aboard an Atlas V-401 launch vehicle and successfully landed at Elysium Planitia on Mars on 26 November 2018 at 19:52:59 UTC. InSight was active on Mars for 1440 sols.

<span class="mw-page-title-main">NanoWorld</span>

NanoWorld is the global market leader for tips for scanning probe microscopy (SPM) and atomic force microscopy (AFM). The atomic force microscope (AFM) is the defining instrument for the whole field of nanoscience and nanotechnology. It enables its users in research and high-tech industry to investigate materials at the atomic scale. AFM probes are the key consumable, the “finger” that enables the scientist to scan surfaces point-by-point at the atomic scale. Consistent high quality of the scanning probes is vital for reproducible results.

Nanosensors Inc. is a company that manufactures probes for use in atomic force microscopes (AFM) and scanning probe microscopes (SPM). This private, for profit company was founded November 21, 2018. Nanosensors Inc. is located in Neuchatel, Switzerland.

The Micro-Imaging Dust Analysis System (MIDAS) is one of several instruments on the European Space Agency's Rosetta mission which studied in-situ the environment around the active comet 67P/Churyumov–Gerasimenko as it flew into the inner Solar System. MIDAS is an atomic force microscope (AFM) designed to collect dust particles emitted from the comet, and then scan them with a very sharp needle-like tip to determine their 3D structure, size and texture with very high resolution.

<span class="mw-page-title-main">Non-contact atomic force microscopy</span>

Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close to the surface under study, the probe is then raster scanned across the surface, the image is then constructed from the force interactions during the scan. The probe is connected to a resonator, usually a silicon cantilever or a quartz crystal resonator. During measurements the sensor is driven so that it oscillates. The force interactions are measured either by measuring the change in amplitude of the oscillation at a constant frequency just off resonance or by measuring the change in resonant frequency directly using a feedback circuit to always drive the sensor on resonance.

<span class="mw-page-title-main">Franz Josef Giessibl</span> German physicist

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A probe tip is an instrument used in scanning probe microscopes (SPMs) to scan the surface of a sample and make nano-scale images of surfaces and structures. The probe tip is mounted on the end of a cantilever and can be as sharp as a single atom. In microscopy, probe tip geometry and the composition of both the tip and the surface being probed directly affect resolution and imaging quality. Tip size and shape are extremely important in monitoring and detecting interactions between surfaces. SPMs can precisely measure electrostatic forces, magnetic forces, chemical bonding, Van der Waals forces, and capillary forces. SPMs can also reveal the morphology and topography of a surface.

References

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  2. Swissinfo,the Swiss news and information platform, "Swiss firms in this year's Tornado 100 listing",17.11.2003
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  10. Basel area news, "Nanosurf wins Swiss technology award 2007",April 2007
  11. Basel Area News, "Nanosruf opens the first subsidiary in USA", 12,Juni,2008
  12. https://analyticalscience.wiley.com/content/news-do/wiley-analytical-science-award-2023-winners
  13. "Project Partners", University of Basel.
  14. National Aeronautics and Space Administration, "Phoenix Launch Mission to the Martian Polar North",August 2007
  15. University Research University of Basel.Phoenix gelandet - Spin-Off der Universität Basel baut Rasterkraftmikroskop für Marsmission. University Research, 2008.
  16. EPFL, "AFM for planetary exploration"
  17. "Official Homepage of the NASA Phoenix Mars Mission"
  18. 1 2 Swissnanotech, "Nanosurf Contributes to NASA's Phoenix Mars Lander Mission"
  19. NASA, "Phoenix Mars Mission Overview"
  20. 1 2 3 T. Akiyama, S. Gautsch, N. F. de Rooij, U. Staufer, Ph. Niedermann, L. Howald, D. Müller, A. Tonin, H. -R. Hidberd, W. T. Pike and M. H. Hecht, "Atomic force microscope for planetary applications", Sensors and Actuators A: Physical, Volume 91, Issue 3, 15 July 2001, Pages 321-325
  21. NASA, "First Atomic Force Microscope Image from Mars"
  22. "AFM on Mars project"