Sherlock Automated Design Analysis

Last updated

Sherlock Automated Design Analysis is a software tool developed by DfR Solutions [1] [2] for analyzing, grading, and certifying the expected reliability of products at the circuit card assembly level. Based on the science of Physics of Failure, Sherlock predicts failure mechanism-specific failure rates over time using a combination of finite element method and material properties to capture stress values and first order analytical equations to evaluate damage evolution. The software is designed for use by design and reliability engineers and managers in the electronics industry. DfR Solutions is based in Beltsville, Maryland, USA, and was acquired by ANSYS, Inc. in May 2019. [3]

Contents

Approach

Users upload either a complete design package, like ODB++ or IPC-2581, [4] or individual data packets, such as Gerber, Bill of Materials, and Pick and Place [5] files.

Sherlock incorporates stresses from a variety of environments into its physics-based prediction algorithms, including elevated temperature, thermal cycling, vibrations (random and harmonic), mechanical shock and electrical stresses (voltage, current, power). Sherlock then performs several different types of reliability analysis and provides the useful (constant failure rate) and wear out (increasing failure rate) portions of the life curve for each mechanism-component combination. The specific mechanisms that are evaluated and predicted include low-cycle solder fatigue due to thermal cycling, high-cycle solder fatigue due to vibration, solder cracking/component cracking/pad cratering due to mechanical shock or excessive flexure, lead fatigue, wire bond fatigue, via fatigue, electromigration, time dependent dielectric breakdown, hot-carrier injection, and negative bias temperature instability. Published research has indicated that the physics of failure-based predictions are highly accurate [6] and are now used to validate other techniques. [7]

These individual life curves are then summed to provide a physics-based reliability curve for the overall product. Sherlock also provides design rule checks (DRC) for board-level design (schematic and layout) and an overall reliability score. The reliability scoring, which is provided for the overall products – as well as individual scores and commentary for each area of analysis is used when physics-based quantitative predictions are not possible. The analysis is delivered both in PDF and HTML format. Depending on the types of analysis run and the data entered to create the analysis, reports can run between 20 and over 200 pages in length.

The semiconductor module is in compliance with SAE ARP 6338 [8] and is being considered as a replacement to traditional empirical reliability prediction methods (MIL-HDBK-217, [9] Telcordia SR-332, FIDES, and Siemens SN29500) in predicting the reliability of semiconductor devices.

A graphical interface allows users to examine results, make iterations, and pre-perform analyses as necessary. The software does not allow the user to make permanent changes to the electronic design. This activity takes place within the original EDA or CAD software. Sherlock is compatible with Abaqus, Ansys, and Siemens NX.

Outputs

Sherlock Automated Design Analysis produces the following outputs:

Life curves.png Sherlock map showing strain expected during impact across the PCBA.png

Version History

Sherlock Automated Design Analysis was launched in April 2011. [10] Subsequent releases include

Market Acceptance

A company has reported requiring suppliers use Sherlock to reduce risk and help accelerate design validation and product verification. [11]

Related Research Articles

Failure rate is the frequency with which an engineered system or component fails, expressed in failures per unit of time. It is usually denoted by the Greek letter λ (lambda) and is often used in reliability engineering.

Prognostics is an engineering discipline focused on predicting the time at which a system or a component will no longer perform its intended function. This lack of performance is most often a failure beyond which the system can no longer be used to meet desired performance. The predicted time then becomes the remaining useful life (RUL), which is an important concept in decision making for contingency mitigation. Prognostics predicts the future performance of a component by assessing the extent of deviation or degradation of a system from its expected normal operating conditions. The science of prognostics is based on the analysis of failure modes, detection of early signs of wear and aging, and fault conditions. An effective prognostics solution is implemented when there is sound knowledge of the failure mechanisms that are likely to cause the degradations leading to eventual failures in the system. It is therefore necessary to have initial information on the possible failures in a product. Such knowledge is important to identify the system parameters that are to be monitored. Potential uses for prognostics is in condition-based maintenance. The discipline that links studies of failure mechanisms to system lifecycle management is often referred to as prognostics and health management (PHM), sometimes also system health management (SHM) or—in transportation applications—vehicle health management (VHM) or engine health management (EHM). Technical approaches to building models in prognostics can be categorized broadly into data-driven approaches, model-based approaches, and hybrid approaches.

Human reliability is related to the field of human factors and ergonomics, and refers to the reliability of humans in fields including manufacturing, medicine and nuclear power. Human performance can be affected by many factors such as age, state of mind, physical health, attitude, emotions, propensity for certain common mistakes, errors and cognitive biases, etc.

Reliability engineering is a sub-discipline of systems engineering that emphasizes the ability of equipment to function without failure. Reliability describes the ability of a system or component to function under stated conditions for a specified period of time. Reliability is closely related to availability, which is typically described as the ability of a component or system to function at a specified moment or interval of time.

Ansys American technology company

Ansys, Inc. is an American company based in Canonsburg, Pennsylvania. It develops and markets CAE/multiphysics engineering simulation software for product design, testing and operation and offers its products and services to customers worldwide.

Integrated logistic support (ILS) is a technology in the system engineering to lower a product life cycle cost and decrease demand for logistics by the maintenance system optimization to ease the product support. Although originally developed for military purposes, it is also widely used in commercial customer service organisations.

Flat no-leads package Integrated circuit package with contacts on all 4 sides, on the underside of the package

Flat no-leads packages such as quad-flat no-leads (QFN) and dual-flat no-leads (DFN) physically and electrically connect integrated circuits to printed circuit boards. Flat no-leads, also known as micro leadframe (MLF) and SON, is a surface-mount technology, one of several package technologies that connect ICs to the surfaces of PCBs without through-holes. Flat no-lead is a near chip scale plastic encapsulated package made with a planar copper lead frame substrate. Perimeter lands on the package bottom provide electrical connections to the PCB. Flat no-lead packages include an exposed thermally conductive pad to improve heat transfer out of the IC. Heat transfer can be further facilitated by metal vias in the thermal pad. The QFN package is similar to the quad-flat package (QFP), and a ball grid array (BGA).

Engineering analysis involves the application of scientific/mathematical analytic principles and processes to reveal the properties and state of a system, device or mechanism under study.

NESSUS is a general-purpose, probabilistic analysis program that simulates variations and uncertainties in loads, geometry, material behavior and other user-defined inputs to compute probability of failure and probabilistic sensitivity measures of engineered systems. Because NESSUS uses highly efficient and accurate probabilistic analysis methods, probabilistic solutions can be obtained even for extremely large and complex models. The system performance can be hierarchically decomposed into multiple smaller models and/or analytical equations. Once the probabilistic response is quantified, the results can be used to support risk-informed decisions regarding reliability for safety critical and one-of-a-kind systems, and to maintain a level of quality while reducing manufacturing costs for larger quantity products.

Microvias are used as the interconnects between layers in high density interconnect (HDI) substrates and printed circuit boards (PCBs) to accommodate the high input/output (I/O) density of advanced packages. Driven by portability and wireless communications, the electronics industry strives to produce affordable, light, and reliable products with increased functionality. At the electronic component level, this translates to components with increased I/Os with smaller footprint areas, and on the printed circuit board and package substrate level, to the use of high density interconnects (HDIs).

Reliability of semiconductor devices can be summarized as follows:

  1. Semiconductor devices are very sensitive to impurities and particles. Therefore, to manufacture these devices it is necessary to manage many processes while accurately controlling the level of impurities and particles. The finished product quality depends upon the many layered relationship of each interacting substance in the semiconductor, including metallization, chip material and package.
  2. The problems of micro-processes, and thin films and must be fully understood as they apply to metallization and wire bonding. It is also necessary to analyze surface phenomena from the aspect of thin films.
  3. Due to the rapid advances in technology, many new devices are developed using new materials and processes, and design calendar time is limited due to non-recurring engineering constraints, plus time to market concerns. Consequently, it is not possible to base new designs on the reliability of existing devices.
  4. To achieve economy of scale, semiconductor products are manufactured in high volume. Furthermore, repair of finished semiconductor products is impractical. Therefore, incorporation of reliability at the design stage and reduction of variation in the production stage have become essential.
  5. Reliability of semiconductor devices may depend on assembly, use, environmental, and cooling conditions. Stress factors affecting device reliability include gas, dust, contamination, voltage, current density, temperature, humidity, mechanical stress, vibration, shock, radiation, pressure, and intensity of magnetic and electrical fields.

Pad cratering is a mechanically induced fracture in the resin between copper foil and outermost layer of fiberglass of a printed circuit board (PCB). It may be within the resin or at the resin to fiberglass interface.

A prediction of reliability is an important element in the process of selecting equipment for use by telecommunications service providers and other buyers of electronic equipment, and it is essential during the design stage of engineering systems life cycle. Reliability is a measure of the frequency of equipment failures as a function of time. Reliability has a major impact on maintenance and repair costs and on the continuity of service.

Physics of failure is a technique under the practice of reliability design that leverages the knowledge and understanding of the processes and mechanisms that induce failure to predict reliability and improve product performance.

ODB++ Proprietary CAD-to-CAM data exchange format

ODB++ is a proprietary CAD-to-CAM data exchange format used in the design and manufacture of electronic devices. Its purpose is to exchange printed circuit board design information between design and manufacturing and between design tools from different EDA/ECAD vendors. It was originally developed by Valor Computerized Systems, Ltd. as the job description format for their CAM system.

Software reliability testing is a field of software-testing that relates to testing a software's ability to function, given environmental conditions, for a particular amount of time. Software reliability testing helps discover many problems in the software design and functionality.

OptiSLang

optiSLang is a software platform for CAE-based sensitivity analysis, multi-disciplinary optimization (MDO) and robustness evaluation. It is developed by Dynardo GmbH and provides a framework for numerical Robust Design Optimization (RDO) and stochastic analysis by identifying variables which contribute most to a predefined optimization goal. This includes also the evaluation of robustness, i.e. the sensitivity towards scatter of design variables or random fluctuations of parameters. In 2019, Dynardo GmbH was acquired by Ansys.

Solder fatigue is the mechanical degradation of solder due to deformation under cyclic loading. This can often occur at stress levels below the yield stress of solder as a result of repeated temperature fluctuations, mechanical vibrations, or mechanical loads. Techniques to evaluate solder fatigue behavior include finite element analysis and semi-analytical closed-form equations.

Digital image correlation analyses have applications in material property characterization, displacement measurement, and strain mapping. As such, DIC is becoming an increasingly popular tool when evaluating the thermo-mechanical behavior of electronic components and systems.

Dye-n-Pry, also called Dye And Pry, Dye and Pull, Dye Staining, or Dye Penetrant, is a destructive analysis technique used on surface mount technology (SMT) components to either perform failure analysis or inspect for solder joint integrity. It is an application of dye penetrant inspection.

References

  1. Military Aerospace Electronics,"DfR Solutions launches Sherlock automated design analysis software", www.militaryaerospace.com, published 2011-04-04, retrieved 2011-10-24
  2. SMT iconnect007, "DfR Solutions Launches Sherlock",www.ems007.com, published 2011-10-06,retrieved 2011-10-24
  3. Bloomberg Businessweek, "DfR Solutions, LLC",www.bloomberg.com, retrieved 2011-10-25.
  4. "Home". ipc2581.com.
  5. "Pick and Place Report".
  6. Hillman, Craig, Nathan Blattau, and Matt Lacy. "Predicting Fatigue of Solder Joints Subjected to High Number of Power Cycles." IPC APEX (2014).
  7. Bhavsar, Nilesh R., H. P. Shinde, and Mahesh Bhat. "Determination of Mechanical Properties of PCB." Ijmer journal 2.4.
  8. Process for Assessment and Mitigation of Early Wearout of Life-limited Microcircuits, http://standards.sae.org/arp6338/
  9. "MIL-HDBK-217F. Military Handbook – Reliability Prediction of Electronic Equipment. Department of Defense, 1991". Archived from the original on 2007-03-11. Retrieved 2007-11-17.
  10. Military Aerospace Electronics,"DfR Solutions launches Sherlock automated design analysis software", www.militaryaerospace.com, published 2011-04-04, retrieved 2011-10-24
  11. M. Wagner and V. Nalla, Customer/Supplier Collaborative Accelerated Life Testing: Benefits and Considerations, International Applied Reliability Symposium, June 2014, Indianapolis, http://www.arsymposium.org/2014/abstracts/blue_s12.htm