VIEW Engineering

Last updated
VIEW Engineering
Company type Private
Industry Semiconductor device fabrication
Integrated circuit packaging
Printed circuit board
Computer data storage
Precision assembly & fabrication
Founded Canoga Park, California (March 9, 1976 (1976-03-09))
FounderDr. Richard Hubach
Jack Sacks
Veeder South
FateRenamed to VIEW Micro-Metrology (2008)
Headquarters,
Number of locations
1 facility (2011)
Area served
Worldwide
Products Machine vision systems
Coordinate-measuring machines
Automated optical inspection systems
Parent Quality Vision International, Inc.
Website www.viewmm.com

VIEW Engineering was one of the first manufacturers of commercial machine vision systems. [1] These systems provided automated dimensional measurement, defect detection, alignment and quality control capabilities. They were used primarily in the Semiconductor device fabrication, Integrated circuit packaging, Printed circuit board, Computer data storage and Precision assembly / fabrication industries. [2] VIEW's systems used video and laser technologies to perform their functions without touching the parts being examined.

Contents

History

1976 origins

VIEW Engineering's Logo, circa 1976 VIEW Logo circa 1976.jpg
VIEW Engineering's Logo, circa 1976
VIEW Engineering's Logo, circa 1996 VIEW Engineering Logo circa 1996.jpg
VIEW Engineering's Logo, circa 1996

While working as a physicist at Hughes Aircraft Company, Dick Hubach recognized a need for automated dimensional measurement systems, when he discovered that the cost to verify the correct manufacture of some aerospace components actually exceeded the cost to manufacture those components. [3] This recognition led to a new start-up company named VIEW Engineering.

VIEW Engineering was founded in Canoga Park, California in 1976. [1] The next year, VIEW introduced the word's first automated, 3-axis, machine vision-based, dimensional measurement system – the RB-1. [4] The RB-1 was the forerunner of modern machine vision-based Coordinate-measuring machines (CMMs). This was followed in 1978 by the introduction of the first pattern recognition (Template matching) system for automated Wirebonding machines and Wafer probers – the PR-1. [4]

Growth

As the company's business increased, VIEW Engineering relocated to a facility in Chatsworth, California in late 1977 and again to Simi Valley, California in 1981. [5]

General Motors Corporation invested in VIEW Engineering in 1984 [6] as part of its plan to improve automobile manufacturing quality in the U.S. through widespread use of factory floor machine vision technology. In 1989, VIEW Engineering purchased Synthetic Vision Systems, Inc. [7]

VIEW Engineering was an OEM for Mitutoyo in the late 1980s. This relationship was concluded when Mitutoyo licensed VIEW's machine vision technology in 1994. This licensed technology became the foundation for Mitutoyo's video and laser-based CMMs. [8]

In 1996, Robotic Vision Systems, Inc. (RVSI) first brought a patent infringement lawsuit against VIEW Engineering related to the coplanarity measurement of packaged semiconductor devices. [9] In 2000, RVSI's patent was finally declared invalid and the U.S. District Court for the Central District of California ruled in favor of VIEW Engineering. [10] Even after this ruling, RVSI contemplated continuing its appeals through 2001. [11]

1996 purchase and continued existence

Also in 1996, VIEW Engineering was purchased by General Scanning, Inc. (GSI). [12] Quality Vision International, Inc. (QVI) purchased the company from GSI Lumonics (previously GSI) in 2000. [13] In 2005, QVI combined VIEW Engineering with Micro Metric, Inc. of San Jose, California, and in 2008 renamed the new company "VIEW Micro-Metrology." [1] In 2009, VIEW's California operations were relocated to QVI's Western Region facility in Tempe, Arizona.

VIEW Micro-Metrology continues to be global supplier of high-accuracy video coordinate measuring systems and software, primarily serving micro-electronic, mobile device and data storage manufacturing. [14]

Product timeline

Dr. Richard Hubach demonstrating a VIEW 1101 Pattern Recognition System. VIEW Pattern Recognition.jpg
Dr. Richard Hubach demonstrating a VIEW 1101 Pattern Recognition System.
VIEW 1220, Precis 3000 & Bazic 8 Machine Vision-based CMMs. Three VIEW CMMs.jpg
VIEW 1220, Précis 3000 & Bazic 8 Machine Vision-based CMMs.
A VIEW Voyager 18x18 Machine Vision-based CMM with Microscope Optics. VIEW Engineering CMM.jpg
A VIEW Voyager 18x18 Machine Vision-based CMM with Microscope Optics.
A VIEW 8100 SMT Process Characterization and Control System. VIEW 8100.jpg
A VIEW 8100 SMT Process Characterization and Control System.
A VIEW Machine Vision-based Automotive Shaft Measurement System, circa 2002. VIEW shaft measurement CMM.jpg
A VIEW Machine Vision-based Automotive Shaft Measurement System, circa 2002.

The timeline given above is summarized here. [4]

Patents

VIEW Engineering's patents related to correlation-based pattern recognition were the foundation of the company's beginnings
A number of VIEW Engineering's 31 patents address key video technologies useful in machine vision-based CMMs including
Other VIEW Engineering patents relate to the 3D laser-scanning technology used in VIEW's PGA, QFP, TQFP, TSOP and BGA package inspection systems

Related Research Articles

Computer vision tasks include methods for acquiring, processing, analyzing and understanding digital images, and extraction of high-dimensional data from the real world in order to produce numerical or symbolic information, e.g. in the forms of decisions. Understanding in this context means the transformation of visual images into descriptions of the world that make sense to thought processes and can elicit appropriate action. This image understanding can be seen as the disentangling of symbolic information from image data using models constructed with the aid of geometry, physics, statistics, and learning theory.

<span class="mw-page-title-main">Machine vision</span> Technology and methods used to provide imaging-based automatic inspection and analysis

Machine vision is the technology and methods used to provide imaging-based automatic inspection and analysis for such applications as automatic inspection, process control, and robot guidance, usually in industry. Machine vision refers to many technologies, software and hardware products, integrated systems, actions, methods and expertise. Machine vision as a systems engineering discipline can be considered distinct from computer vision, a form of computer science. It attempts to integrate existing technologies in new ways and apply them to solve real world problems. The term is the prevalent one for these functions in industrial automation environments but is also used for these functions in other environment vehicle guidance.

<span class="mw-page-title-main">Automatix</span> Early robotics and machine vision company

Automatix Inc., founded in January 1980, was the first company to market industrial robots with built-in machine vision. Its founders were Victor Scheinman, inventor of the Stanford arm; Phillippe Villers, Michael Cronin, and Arnold Reinhold of Computervision; Jake Dias and Dan Nigro of Data General; Gordon VanderBrug, of NBS, Donald L. Pieper of General Electric and Norman Wittels of Clark University.

Cognex Corporation is an American manufacturer of machine vision systems, software and sensors used in automated manufacturing to inspect and identify parts, detect defects, verify product assembly, and guide assembly robots. Cognex is headquartered in Natick, Massachusetts, USA and has offices in more than 20 countries.

<span class="mw-page-title-main">Coordinate-measuring machine</span> Device for measuring the geometry of objects

A coordinate-measuring machine (CMM) is a device that measures the geometry of physical objects by sensing discrete points on the surface of the object with a probe. Various types of probes are used in CMMs, the most common being mechanical and laser sensors, though optical and white light sensors do exist. Depending on the machine, the probe position may be manually controlled by an operator, or it may be computer controlled. CMMs typically specify a probe's position in terms of its displacement from a reference position in a three-dimensional Cartesian coordinate system. In addition to moving the probe along the X, Y, and Z axes, many machines also allow the probe angle to be controlled to allow measurement of surfaces that would otherwise be unreachable.

<span class="mw-page-title-main">3D scanning</span> Scanning of an object or environment to collect data on its shape

3D scanning is the process of analyzing a real-world object or environment to collect three dimensional data of its shape and possibly its appearance. The collected data can then be used to construct digital 3D models.

KLA Corporation is an American capital equipment company based in Milpitas, California. It supplies process control and yield management systems for the semiconductor industry and other related nanoelectronics industries. The company's products and services are intended for all phases of wafer, reticle, integrated circuit (IC) and packaging production, from research and development to final volume manufacturing.

The following are common definitions related to the machine vision field.

<span class="mw-page-title-main">InspecVision</span> UK company

InspecVision Ltd., established in 2003, is a UK engineering company based in Mallusk, Northern Ireland. It is a manufacturing company that produces computer vision inspection systems. The company is one of several local companies created as spinoffs or inspired by research conducted at the Queen's University of Belfast.

<span class="mw-page-title-main">Automated optical inspection</span> System for visual inspection of printed circuit boards by a computerized system

Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) manufacture where a camera autonomously scans the device under test for both catastrophic failure and quality defects. It is commonly used in the manufacturing process because it is a non-contact test method. It is implemented at many stages through the manufacturing process including bare board inspection, solder paste inspection (SPI), pre-reflow and post-re-flow as well as other stages.

Dimensional metrology, also known as industrial metrology, is the application of metrology for quantifying the physical size, form (shape), characteristics, and relational distance from any given feature.

Orbotech Ltd. a subsidiary of KLA Corporation and a technology company used in the manufacturing of consumer and industrial products throughout the electronics and adjacent industries. The company providing electronics reading, writing, and connecting solutions used by manufacturers of printed circuit boards, flat panel displays, advanced packaging, micro-electro-mechanical systems and other electronic components. The company is headquartered in Yavne, Israel and operates in North America, Europe, Japan and Asia-Pacific.

A structured-light 3D scanner is a device that measures the three-dimensional shape of an object by projecting light patterns—such as grids or stripes—onto it and capturing their deformation with cameras. This technique allows for precise surface reconstruction by analyzing the displacement of the projected patterns, which are processed into detailed 3D models using specialized algorithms.

Computer-aided inspection (CAI) is the use of software tools to assess manufactured objects. It is closely related to computer-aided design (CAD) and computer-aided manufacturing (CAM). Its primary purpose is to allow engineers to more quickly and precisely assess the physical properties of manufactured objects. These properties can include dimensions, material consistency, roughness and roundness.

<span class="mw-page-title-main">Industrial computed tomography</span> Computer-aided tomographic process

Industrial computed tomography (CT) scanning is any computer-aided tomographic process, usually X-ray computed tomography, that uses irradiation to produce three-dimensional internal and external representations of a scanned object. Industrial CT scanning has been used in many areas of industry for internal inspection of components. Some of the key uses for industrial CT scanning have been flaw detection, failure analysis, metrology, assembly analysis and reverse engineering applications. Just as in medical imaging, industrial imaging includes both nontomographic radiography and computed tomographic radiography.

Novacam Technologies Inc. specializes in designing and manufacturing advanced metrology and imaging systems for industrial and bio-medical applications. Novacam's fiber-based optical profilometers and Optical Coherence Tomography (OCT) systems are based on low coherence interferometry. The fiber-based nature of Novacam's detector probes is unique in the optical metrology industry.

<span class="mw-page-title-main">MountainsMap</span>

Mountains is an image analysis and surface metrology software platform published by the company Digital Surf. Its core is micro-topography, the science of studying surface texture and form in 3D at the microscopic scale. The software is dedicated to profilometers, 3D light microscopes ("MountainsMap"), scanning electron microscopes ("MountainsSEM") and scanning probe microscopes ("MountainsSPIP").

Digital Surf is a French software company formed in 1989 mainly known for its Mountains software, that is offered as embedded or optional OEM surface analysis software by the majority of profilometer and microscope manufacturers.

Geomagic is the professional engineering software brand of 3D Systems. The brand began when Geomagic Inc., a software company based in Morrisville, North Carolina, was acquired by 3D Systems in February 2013 and combined with that company's other software businesses. Geomagic was founded in 1997 by Ping Fu and Herbert Edelsbrunner.

<span class="mw-page-title-main">Air-Cobot</span> French research and development project (2013–)

Air-Cobot (Aircraft Inspection enhanced by smaRt & Collaborative rOBOT) is a French research and development project of a wheeled collaborative mobile robot able to inspect aircraft during maintenance operations. This multi-partner project involves research laboratories and industry. Research around this prototype was developed in three domains: autonomous navigation, human-robot collaboration and nondestructive testing.

References

  1. 1 2 3 "About VIEW Micro-Metrology". VIEW Micro-Metrology. Retrieved 7 July 2011.
  2. "VIEW Micro-Metrology Applications". VIEW Micro-Metrology. Retrieved 7 July 2011.
  3. "VIEW Ugly Duckling PDF Document". VIEW Micro-Metrology. Retrieved 12 July 2011.
  4. 1 2 3 "History of VIEW Micro-Metrology". VIEW Micro-Metrology. Retrieved 9 July 2011.
  5. "VIEW Engineering, Inc, Simi Valley". Techspex. Retrieved 7 July 2011.
  6. "GM Corp acquires a minority stake in VIEW Engineering Inc". Thomson Financial Mergers & Acquisitions. Retrieved 7 July 2011.
  7. "VIEW Engineering Inc acquires Synthetic Vision Systems". Thomson Financial Mergers & Acquisitions. Retrieved 7 July 2011.
  8. "Mitutoyo Company UK, Mitutoyo Worldwide, Section 9, 2nd Paragraph". Mitutoyo UK. Retrieved 13 July 2011.
  9. "189 F3d 1370 Robotic Vision Systems Inc v VIEW Engineering Inc". OpenJurist. Retrieved 14 July 2011.
  10. "Court Decides on Machine Vision Patent Suit". Society of Manufacturing Engineers. Retrieved 14 July 2011.
  11. "Robotic Vision Systems Inc Says It May Appeal in Patent Infringement Suit". MachineVisionOnline. Retrieved 14 July 2011.
  12. "General Scanning Inc acquires VIEW Engineering Inc". Thomson Financial Mergers & Acquisitions. Retrieved 7 July 2011.
  13. "GSI Lumonics announces the sale of its Metrology Product Line to QVI". PRNewswire. Retrieved 7 July 2011.
  14. "VIEW Micro-Metrology". VIEW Micro-Metrology. Retrieved 7 July 2011.
  15. 1 2 3 4 5 "VIEW Engineering Assignee Patent Directory Page 1". Patentmaps. Retrieved 10 July 2011.
  16. "Illumination". VIEW Micro-Metrology. Retrieved 10 July 2011.
  17. 1 2 3 "VIEW Engineering Assignee Patent Directory Page 2". Patentmaps. Retrieved 10 July 2011.
  18. 1 2 3 4 "VIEW Engineering Assignee Patent Directory Page 3". Patentmaps. Retrieved 10 July 2011.
  19. "VIEW Engineering Assignee Patent Directory Page 4". Patentmaps. Retrieved 10 July 2011.
  20. "Ronchi Grid". VIEW Micro-Metrology. Retrieved 10 July 2011.