Characteristic X-ray

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Characteristic X-rays are emitted when outer-shell electrons fill a vacancy in the inner shell of an atom, releasing X-rays in a pattern that is "characteristic" to each element. Characteristic X-rays were discovered by Charles Glover Barkla in 1909, [1] who later won the Nobel Prize in Physics for his discovery in 1917.

Contents

Explanation

Characteristic X-rays are produced when an element is bombarded with high-energy particles, which can be photons, electrons or ions (such as protons). When the incident particle strikes a bound electron (the target electron) in an atom, the target electron is ejected from the inner shell of the atom. After the electron has been ejected, the atom is left with a vacant energy level, also known as a core hole. Outer-shell electrons then fall into the inner shell, emitting quantized photons with an energy level equivalent to the energy difference between the higher and lower states. Each element has a unique set of energy levels, and thus the transition from higher to lower energy levels produces X-rays with frequencies that are characteristic to each element. [2]

Sometimes, however, instead of releasing the energy in the form of an X-ray, the energy can be transferred to another electron, which is then ejected from the atom. This is called the Auger effect, which is used in Auger electron spectroscopy to analyze the elemental composition of surfaces.

Notation

The different electron states which exist in an atom are usually described by atomic orbital notation, as is used in chemistry and general physics. However, X-ray science has special terminology to describe the transition of electrons from upper to lower energy levels: traditional Siegbahn notation, or alternatively, simplified X-ray notation.

In Siegbahn notation, when an electron falls from the L shell to the K shell, the X-ray radiation emitted is called a K-alpha (Kα) emission. Similarly, when an electron falls from the M shell to the K shell, the X-ray radiation emitted is called a K-beta (Kβ) emission. [3]

Prominent transitions

K-alpha

Siegbahn notation of electron transitions between shells. CharacteristicRadiation.svg
Siegbahn notation of electron transitions between shells.

K-alpha emission lines result when an electron transitions to a vacancy in the innermost "K" shell (principal quantum number n = 1) from a p orbital of the second, "L" shell (n = 2), leaving a vacancy there.

By posing that initially in the K shell there is a single vacancy (and, hence, a single electron is already there), as well as that the L shell is not entirely empty in the final state of the transition, this definition limits the minimal number of electrons in the atom to three, i.e., to lithium (or a lithium-like ion). [4] In the case of two- or one-electron atoms, one talks instead about He-alpha and Lyman-alpha, respectively. In a more formal definition, the L shell is initially fully occupied. In this case, the lighter species with K-alpha is neon. [5] This choice also places K-alpha firmly in the X-ray energy range.

Similarly to Lyman-alpha, the K-alpha emission is composed of two spectral lines, K-alpha1 (Kα1) and K-alpha2 (Kα2). [6] The K-alpha1 emission is slightly higher in energy (and, thus, has a lower wavelength) than the K-alpha2 emission. For all elements, the ratio of the intensities of K-alpha1 and K-alpha2 is very close to 2:1. [7]

An example of K-alpha lines is Fe K-alpha emitted as iron atoms are spiraling into a black hole at the center of a galaxy. [8] The K-alpha line in copper is frequently used as the primary source of X-ray radiation in lab-based X-ray diffraction spectrometry (XRD) instruments.

K-beta

K-beta emissions, similar to K-alpha emissions, result when an electron transitions to the innermost "K" shell (principal quantum number 1) from a 3p orbital of the third or "M" shell (with principal quantum number 3).

Transition energies

The transition energies can be approximately calculated by the use of Moseley's law. For example, , where Z is the atomic number and Ry is the Rydberg energy. The energy of the iron (Z = 26) K-alpha, calculated in this fashion, is 6.375  keV , accurate within 1%. However, for higher Z's the error grows quickly.

Accurate values of transition energies of Kα, Kβ, Lα, Lβ, and so on for different elements can be found in the atomic databases. [5] [9]

Applications

Characteristic X-rays can be used to identify the particular element from which they are emitted. This property is used in various techniques, including X-ray fluorescence spectroscopy, particle-induced X-ray emission, energy-dispersive X-ray spectroscopy, and wavelength-dispersive X-ray spectroscopy.

See also

Related Research Articles

<span class="mw-page-title-main">Auger effect</span> Physical phenomenon

The Auger effect or Auger−Meitner effect is a physical phenomenon in which the filling of an inner-shell vacancy of an atom is accompanied by the emission of an electron from the same atom. When a core electron is removed, leaving a vacancy, an electron from a higher energy level may fall into the vacancy, resulting in a release of energy. Although most often this energy is released in the form of an emitted photon, the energy can also be transferred to another electron, which is ejected from the atom; this second ejected electron is called an Auger electron.

<span class="mw-page-title-main">Bohr model</span> Atomic model introduced by Niels Bohr in 1913

In atomic physics, the Bohr model or Rutherford–Bohr model of the atom, presented by Niels Bohr and Ernest Rutherford in 1913, consists of a small, dense nucleus surrounded by orbiting electrons. It is analogous to the structure of the Solar System, but with attraction provided by electrostatic force rather than gravity. In the history of atomic physics, it followed, and ultimately replaced, several earlier models, including Joseph Larmor's solar system model (1897), Jean Perrin's model (1901), the cubical model (1902), Hantaro Nagaoka's Saturnian model (1904), the plum pudding model (1904), Arthur Haas's quantum model (1910), the Rutherford model (1911), and John William Nicholson's nuclear quantum model (1912). The improvement over the 1911 Rutherford model mainly concerned the new quantum mechanical interpretation introduced by Haas and Nicholson, but forsaking any attempt to explain radiation according to classical physics.

<span class="mw-page-title-main">Spectroscopy</span> Study involving matter and electromagnetic radiation

Spectroscopy is the field of study that measures and interprets the electromagnetic spectra that result from the interaction between electromagnetic radiation and matter as a function of the wavelength or frequency of the radiation. Matter waves and acoustic waves can also be considered forms of radiative energy, and recently gravitational waves have been associated with a spectral signature in the context of the Laser Interferometer Gravitational-Wave Observatory (LIGO).

<span class="mw-page-title-main">Auger electron spectroscopy</span> Analytical technique used specifically in the study of surfaces

Auger electron spectroscopy is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. It is a form of electron spectroscopy that relies on the Auger effect, based on the analysis of energetic electrons emitted from an excited atom after a series of internal relaxation events. The Auger effect was discovered independently by both Lise Meitner and Pierre Auger in the 1920s. Though the discovery was made by Meitner and initially reported in the journal Zeitschrift für Physik in 1922, Auger is credited with the discovery in most of the scientific community. Until the early 1950s Auger transitions were considered nuisance effects by spectroscopists, not containing much relevant material information, but studied so as to explain anomalies in X-ray spectroscopy data. Since 1953 however, AES has become a practical and straightforward characterization technique for probing chemical and compositional surface environments and has found applications in metallurgy, gas-phase chemistry, and throughout the microelectronics industry.

<span class="mw-page-title-main">X-ray photoelectron spectroscopy</span> Spectroscopic technique

X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect that can identify the elements that exist within a material or are covering its surface, as well as their chemical state, and the overall electronic structure and density of the electronic states in the material. XPS is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to. The technique can be used in line profiling of the elemental composition across the surface, or in depth profiling when paired with ion-beam etching. It is often applied to study chemical processes in the materials in their as-received state or after cleavage, scraping, exposure to heat, reactive gasses or solutions, ultraviolet light, or during ion implantation.

<span class="mw-page-title-main">X-ray fluorescence</span> Emission of secondary X-rays from a material excited by high-energy X-rays

X-ray fluorescence (XRF) is the emission of characteristic "secondary" X-rays from a material that has been excited by being bombarded with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science, archaeology and art objects such as paintings.

<span class="mw-page-title-main">Rydberg formula</span> Formula for spectral line wavelengths in alkali metals

In atomic physics, the Rydberg formula calculates the wavelengths of a spectral line in many chemical elements. The formula was primarily presented as a generalization of the Balmer series for all atomic electron transitions of hydrogen. It was first empirically stated in 1888 by the Swedish physicist Johannes Rydberg, then theoretically by Niels Bohr in 1913, who used a primitive form of quantum mechanics. The formula directly generalizes the equations used to calculate the wavelengths of the hydrogen spectral series.

<span class="mw-page-title-main">Emission spectrum</span> Frequencies of light emitted by atoms or chemical compounds

The emission spectrum of a chemical element or chemical compound is the spectrum of frequencies of electromagnetic radiation emitted due to an electron making a transition from a high energy state to a lower energy state. The photon energy of the emitted photon is equal to the energy difference between the two states. There are many possible electron transitions for each atom, and each transition has a specific energy difference. This collection of different transitions, leading to different radiated wavelengths, make up an emission spectrum. Each element's emission spectrum is unique. Therefore, spectroscopy can be used to identify elements in matter of unknown composition. Similarly, the emission spectra of molecules can be used in chemical analysis of substances.

<span class="mw-page-title-main">Internal conversion</span>

Internal conversion is an atomic decay process where an excited nucleus interacts electromagnetically with one of the orbital electrons of an atom. This causes the electron to be emitted (ejected) from the atom. Thus, in internal conversion, a high-energy electron is emitted from the excited atom, but not from the nucleus. For this reason, the high-speed electrons resulting from internal conversion are not called beta particles, since the latter come from beta decay, where they are newly created in the nuclear decay process.

<span class="mw-page-title-main">Photoemission spectroscopy</span> Examining a substance by measuring electrons emitted in the photoelectric effect

Photoemission spectroscopy (PES), also known as photoelectron spectroscopy, refers to energy measurement of electrons emitted from solids, gases or liquids by the photoelectric effect, in order to determine the binding energies of electrons in the substance. The term refers to various techniques, depending on whether the ionization energy is provided by X-ray, XUV or UV photons. Regardless of the incident photon beam, however, all photoelectron spectroscopy revolves around the general theme of surface analysis by measuring the ejected electrons.

Wavelength-dispersive X-ray spectroscopy is a non-destructive analysis technique used to obtain elemental information about a range of materials by measuring characteristic x-rays within a small wavelength range. The technique generates a spectrum in which the peaks correspond to specific x-ray lines and elements can be easily identified. WDS is primarily used in chemical analysis, wavelength dispersive X-ray fluorescence (WDXRF) spectrometry, electron microprobes, scanning electron microscopes, and high precision experiments for testing atomic and plasma physics.

<span class="mw-page-title-main">Energy-dispersive X-ray spectroscopy</span> Analytical technique used for the elemental analysis or chemical characterization of a sample

Energy-dispersive X-ray spectroscopy, sometimes called energy dispersive X-ray analysis or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and a sample. Its characterization capabilities are due in large part to the fundamental principle that each element has a unique atomic structure allowing a unique set of peaks on its electromagnetic emission spectrum. The peak positions are predicted by the Moseley's law with accuracy much better than experimental resolution of a typical EDX instrument.

<span class="mw-page-title-main">X-ray spectroscopy</span> Technique to characterize materials using X-ray radiation

X-ray spectroscopy is a general term for several spectroscopic techniques for characterization of materials by using x-ray radiation.

<span class="mw-page-title-main">Electron microprobe</span> Instrument for the micro-chemical analysis of solids

An electron microprobe (EMP), also known as an electron probe microanalyzer (EPMA) or electron micro probe analyzer (EMPA), is an analytical tool used to non-destructively determine the chemical composition of small volumes of solid materials. It works similarly to a scanning electron microscope: the sample is bombarded with an electron beam, emitting x-rays at wavelengths characteristic to the elements being analyzed. This enables the abundances of elements present within small sample volumes to be determined, when a conventional accelerating voltage of 15-20 kV is used. The concentrations of elements from lithium to plutonium may be measured at levels as low as 100 parts per million (ppm), material dependent, although with care, levels below 10 ppm are possible. The ability to quantify lithium by EPMA became a reality in 2008.

The Siegbahn notation is used in X-ray spectroscopy to name the spectral lines that are characteristic to elements. It was introduced by Manne Siegbahn.

<span class="mw-page-title-main">Moseley's law</span> Law concerning X-rays emitted by atoms

Moseley's law is an empirical law concerning the characteristic X-rays emitted by atoms. The law had been discovered and published by the English physicist Henry Moseley in 1913–1914. Until Moseley's work, "atomic number" was merely an element's place in the periodic table and was not known to be associated with any measurable physical quantity. In brief, the law states that the square root of the frequency of the emitted X-ray is approximately proportional to the atomic number:

Electron spectroscopy refers to a group formed by techniques based on the analysis of the energies of emitted electrons such as photoelectrons and Auger electrons. This group includes X-ray photoelectron spectroscopy (XPS), which also known as Electron Spectroscopy for Chemical Analysis (ESCA), Electron energy loss spectroscopy (EELS), Ultraviolet photoelectron spectroscopy (UPS), and Auger electron spectroscopy (AES). These analytical techniques are used to identify and determine the elements and their electronic structures from the surface of a test sample. Samples can be solids, gases or liquids.

Iron-55 (55Fe) is a radioactive isotope of iron with a nucleus containing 26 protons and 29 neutrons. It decays by electron capture to manganese-55 and this process has a half-life of 2.737 years. The emitted X-rays can be used as an X-ray source for various scientific analysis methods, such as X-ray diffraction. Iron-55 is also a source for Auger electrons, which are produced during the decay.

<span class="mw-page-title-main">Spectrometer</span> Used to measure spectral components of light

A spectrometer is a scientific instrument used to separate and measure spectral components of a physical phenomenon. Spectrometer is a broad term often used to describe instruments that measure a continuous variable of a phenomenon where the spectral components are somehow mixed. In visible light a spectrometer can separate white light and measure individual narrow bands of color, called a spectrum. A mass spectrometer measures the spectrum of the masses of the atoms or molecules present in a gas. The first spectrometers were used to split light into an array of separate colors. Spectrometers were developed in early studies of physics, astronomy, and chemistry. The capability of spectroscopy to determine chemical composition drove its advancement and continues to be one of its primary uses. Spectrometers are used in astronomy to analyze the chemical composition of stars and planets, and spectrometers gather data on the origin of the universe.

<span class="mw-page-title-main">X-ray emission spectroscopy</span>

X-ray emission spectroscopy (XES) is a form of X-ray spectroscopy in which the X-ray line spectra are measured with a spectral resolution sufficient to analyze the impact of the chemical environment on the X-ray line energy and on branching ratios. This is done by exciting electrons out of their shell and then watching the emitted photons of the recombinating electrons.

References

  1. Wittke, James H. "The Origin of Characteristic X-rays". Archived from the original on 9 July 2013. Retrieved 18 June 2013.
  2. "X-Ray Fluorescence (XRF): Understanding Characteristic X-Rays" (PDF). Archived from the original (PDF) on 28 December 2013. Retrieved 18 June 2013.
  3. Nave, Carl R. "Characteristic X-Rays". HyperPhysics. Retrieved 18 June 2013.
  4. Bearden, J. A. (1967). "X-Ray Wavelengths". Reviews of Modern Physics. 39 (1): 78–124. Bibcode:1967RvMP...39...78B. doi:10.1103/RevModPhys.39.78 . Retrieved 2021-07-01.
  5. 1 2 NIST X-Ray Transition Energies Database
  6. Clark, C. M.; Dutrow, B. L. "Single-crystal X-ray Diffraction". Geochemical Instrumentation and Analysis. Carleton College. Retrieved 22 April 2019.
  7. Klug, H. P.; Alexander, L. E. (1974). X-Ray diffraction procedures: for polycrystalline and amorphous materials (2nd ed.). John Wiley and Sons, Inc. p. 86. ISBN   978-0-471-49369-3.
  8. Fukumura, Keigo; Tsuruta, Sachiko (2004-10-01). "Iron Kα Fluorescent Line Profiles from Spiral Accretion Flows in Active Galactic Nuclei". The Astrophysical Journal. 613 (2): 700–709. arXiv: astro-ph/0405337 . Bibcode:2004ApJ...613..700F. doi:10.1086/423312. S2CID   119372852.
  9. Spectr-W3 database