Discipline | Electronics testing, electronics engineering |
---|---|
Language | English |
Edited by | Vishwani Agrawal |
Publication details | |
History | 1986—present |
Publisher | |
Frequency | Bimonthly |
1.3 (2024) | |
Standard abbreviations | |
ISO 4 | J. Electron. Test. |
Indexing | |
ISSN | 0923-8174 (print) 1573-0727 (web) |
Links | |
Journal of Electronic Testing: Theory and Applications is a peer-reviewed scientific journal published bimonthly by Springer Science+Business Media. Established in 1990, it covers developments in electronics testing, including tests of VLSI devices and printed circuit boards, as well as fault modeling and analysis. [1] Its current editor-in-chief is Vishwani Agrawal (Auburn University). [2]
The journal is abstracted and indexed in:
According to the Journal Citation Reports , the journal has a 2024 impact factor of 1.3. [6]