| Discipline | Electronics testing, electronics engineering | 
|---|---|
| Language | English | 
| Edited by | Vishwani Agrawal | 
| Publication details | |
| History | 1986—present | 
| Publisher | |
| Frequency | Bimonthly | 
| 1.3 (2024) | |
| Standard abbreviations | |
| ISO 4 | J. Electron. Test. | 
| Indexing | |
| ISSN |  0923-8174  (print) 1573-0727 (web)  | 
| Links | |
Journal of Electronic Testing: Theory and Applications is a peer-reviewed scientific journal published bimonthly by Springer Science+Business Media. Established in 1990, it covers developments in electronics testing, including tests of VLSI devices and printed circuit boards, as well as fault modeling and analysis. [1] Its current editor-in-chief is Vishwani Agrawal (Auburn University). [2]
The journal is abstracted and indexed in:
According to the Journal Citation Reports , the journal has a 2024 impact factor of 1.3. [6]