The Surface Force Apparatus (SFA) is a scientific instrument which measures the interaction force of two surfaces as they are brought together and retracted using multiple beam interferometry to monitor surface separation and directly measure contact area and observe any surface deformations occurring in the contact zone. One surface is held by a cantilevered spring, and the deflection of the spring is used to calculate the force being exerted. [2] The technique was pioneered by David Tabor and R.H.S. Winterton in the late 1960s at Cambridge University. [3] By the mid-1970s, J.N. Israelachvili had adapted the original design to operate in liquids, notably aqueous solutions, while at the Australian National University, [4] and further advanced the technique to support friction and electro-chemical surface studies [5] while at the University of California Santa Barbara.
A Surface Force Apparatus uses piezoelectric positioning elements (in addition to conventional motors for coarse adjustments), and senses the distance between the surfaces using optical interferometry. [6] Using these sensitive elements, the device can resolve distances to within 0.1 nanometer, and forces at the 10−8 N level. This extremely sensitive technique can be used to measure electrostatic forces, elusive van der Waals forces, and even hydration or solvation forces. SFA is in some ways similar to using an atomic force microscope to measure interaction between a tip (or molecule adsorbed onto the tip) and a surface. The SFA, however, is more ideally suited to measuring surface-surface interactions, can measure much longer-range forces more accurately, and is well-suited to situations where long relaxation times play a role (ordering, high-viscosity, corrosion). The SFA technique is quite demanding, nevertheless, labs worldwide have adopted the technique as part of their surface science research instrumentation.
In the SFA, method two smooth cylindrically curved surfaces whose cylindrical axes are positioned at 90° to each other are made to approach each other in a direction normal to the axes. The distance between the surfaces at the point of closest approach varies between a few micrometers to a few nanometers depending on the apparatus. When the two curved cylinders have the same radius of curvature, R, this so-called 'crossed cylinders' geometry is mathematically equivalent to the interaction between a flat surface and a sphere of radius R. Using the crossed cylinder geometry makes alignment much easier, enables testing of many different surface regions for better statistics, and also enables angle-dependent measurements to be taken. A typical setup involves R = 1 cm.
Position measurements are typically made using multiple beam interferometry (MBI). The transparent surfaces of the perpendicular cylinders, usually mica, are backed with a highly reflective material usually silver before being mounted to the glass cylinders. When a white-light source is shined normal to the perpendicular cylinders the light will reflect back and forth until it is transmitted at where the surfaces are closest. These rays create an interference pattern, known as fringes of equal chromatic order (FECO), which can be observed by microscope. Distance between the two surfaces can be determined by analyzing these patterns. Mica is used because it is extremely flat, easy to work with, and optically transparent. Any other material or molecule of interest can be coated or adsorbed onto the mica layer.
In the jump method, the top cylinder is mounted to a pair of cantilever springs, while the bottom cylinder is brought up towards the top cylinder. While the bottom cylinder approaches the top, there comes a point when they will "jump" into contact with each other. The measurements, in this case, are based on the distance from which they jump and the spring constant. These measurements are usually between surfaces 1.25 nm and 20 nm apart. [6]
The jump method is difficult to execute mainly due to unaccounted vibrations entering the instrument. To overcome this, researchers developed the resonance method which measured surface forces at larger distances, 10 nm to 130 nm. In this case, the bottom cylinder is oscillated at a known frequency, while the frequency of the top cylinder is measured using a piezoelectric bimorph strain gauge. To minimize the dampening due to the surrounding substance, these measurements were originally done in a vacuum. [6]
Early experiments measured the force between mica surfaces in air or vacuum. [6] The technique has been extended, however, to enable an arbitrary vapor or solvent to be introduced between the two surfaces. [7] In this way, interactions in various media can be carefully probed, and the dielectric constant of the gap between the surfaces can be tuned. Moreover, use of water as a solvent enables the measurement of interactions between biological molecules (such as lipids in biological membranes or proteins) in their native environment. In a solvent environment, SFA can even measure the oscillatory solvation and structural forces arising from the packing of individual layers of solvent molecules. It can also measure the electrostatic 'double layer' forces between charged surfaces in an aqueous medium with electrolyte.
The SFA has more recently been extended to perform dynamic measurements, thereby determining viscous and viscoelastic properties of fluids, frictional and tribological properties of surfaces, and the time-dependent interaction between biological structures. [8]
The force measurements of the SFA are based primarily on Hooke's law,
where F is the restoring force of a spring, k is the spring constant and x is the displacement of the spring.
Using a cantilevered spring, the lower surface is brought towards the top surface using a fine micrometer or piezotube. The force between the two surfaces is measured by
where is the change in displacement applied by the micrometer and is the change displacement measured by interferometry.
The spring constants can range anywhere from to . [2] When measuring higher forces, a spring with a higher spring constant would be used.
Electron energy loss spectroscopy (EELS) is a form of electron microscopy in which a material is exposed to a beam of electrons with a known, narrow range of kinetic energies. Some of the electrons will undergo inelastic scattering, which means that they lose energy and have their paths slightly and randomly deflected. The amount of energy loss can be measured via an electron spectrometer and interpreted in terms of what caused the energy loss. Inelastic interactions include phonon excitations, inter- and intra-band transitions, plasmon excitations, inner shell ionizations, and Cherenkov radiation. The inner-shell ionizations are particularly useful for detecting the elemental components of a material. For example, one might find that a larger-than-expected number of electrons comes through the material with 285 eV less energy than they had when they entered the material. This is approximately the amount of energy needed to remove an inner-shell electron from a carbon atom, which can be taken as evidence that there is a significant amount of carbon present in the sample. With some care, and looking at a wide range of energy losses, one can determine the types of atoms, and the numbers of atoms of each type, being struck by the beam. The scattering angle can also be measured, giving information about the dispersion relation of whatever material excitation caused the inelastic scattering.
Force spectroscopy is a set of techniques for the study of the interactions and the binding forces between individual molecules. These methods can be used to measure the mechanical properties of single polymer molecules or proteins, or individual chemical bonds. The name "force spectroscopy", although widely used in the scientific community, is somewhat misleading, because there is no true matter-radiation interaction.
Interferometry is a technique which uses the interference of superimposed waves to extract information. Interferometry typically uses electromagnetic waves and is an important investigative technique in the fields of astronomy, fiber optics, engineering metrology, optical metrology, oceanography, seismology, spectroscopy, quantum mechanics, nuclear and particle physics, plasma physics, biomolecular interactions, surface profiling, microfluidics, mechanical stress/strain measurement, velocimetry, optometry, and making holograms.
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
In surface science, surface energy quantifies the disruption of intermolecular bonds that occurs when a surface is created. In solid-state physics, surfaces must be intrinsically less energetically favorable than the bulk of the material, otherwise there would be a driving force for surfaces to be created, removing the bulk of the material by sublimation. The surface energy may therefore be defined as the excess energy at the surface of a material compared to the bulk, or it is the work required to build an area of a particular surface. Another way to view the surface energy is to relate it to the work required to cut a bulk sample, creating two surfaces. There is "excess energy" as a result of the now-incomplete, unrealized bonding between the two created surfaces.
Ellipsometry is an optical technique for investigating the dielectric properties of thin films. Ellipsometry measures the change of polarization upon reflection or transmission and compares it to a model.
Magnetic force microscopy (MFM) is a variety of atomic force microscopy, in which a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the sample surface. Many kinds of magnetic interactions are measured by MFM, including magnetic dipole–dipole interaction. MFM scanning often uses non-contact atomic force microscopy (NC-AFM) and is considered to be non-destructive with respect to the test sample. In MFM, the test sample(s) do not need to be electrically conductive to be imaged.
Surface metrology is the measurement of small-scale features on surfaces, and is a branch of metrology. Surface primary form, surface fractality, and surface finish are the parameters most commonly associated with the field. It is important to many disciplines and is mostly known for the machining of precision parts and assemblies which contain mating surfaces or which must operate with high internal pressures.
Nanotribology is the branch of tribology that studies friction, wear, adhesion and lubrication phenomena at the nanoscale, where atomic interactions and quantum effects are not negligible. The aim of this discipline is characterizing and modifying surfaces for both scientific and technological purposes.
Dual-polarization interferometry (DPI) is an analytical technique that probes molecular layers adsorbed to the surface of a waveguide using the evanescent wave of a laser beam. It is used to measure the conformational change in proteins, or other biomolecules, as they function.
Magnetic tweezers (MT) are scientific instruments for the manipulation and characterization of biomolecules or polymers. These apparatus exert forces and torques to individual molecules or groups of molecules. It can be used to measure the tensile strength or the force generated by molecules.
Nanometrology is a subfield of metrology, concerned with the science of measurement at the nanoscale level. Nanometrology has a crucial role in order to produce nanomaterials and devices with a high degree of accuracy and reliability in nanomanufacturing.
In optical astronomy, interferometry is used to combine signals from two or more telescopes to obtain measurements with higher resolution than could be obtained with either telescopes individually. This technique is the basis for astronomical interferometer arrays, which can make measurements of very small astronomical objects if the telescopes are spread out over a wide area. If a large number of telescopes are used a picture can be produced which has resolution similar to a single telescope with the diameter of the combined spread of telescopes. These include radio telescope arrays such as VLA, VLBI, SMA, astronomical optical interferometer arrays such as COAST, NPOI and IOTA, resulting in the highest resolution optical images ever achieved in astronomy. The VLT Interferometer is expected to produce its first images using aperture synthesis soon, followed by other interferometers such as the CHARA array and the Magdalena Ridge Observatory Interferometer which may consist of up to 10 optical telescopes. If outrigger telescopes are built at the Keck Interferometer, it will also become capable of interferometric imaging.
Membrane fusion is a key biophysical process that is essential for the functioning of life itself. It is defined as the event where two lipid bilayers approach each other and then merge to form a single continuous structure. In living beings, cells are made of an outer coat made of lipid bilayers; which then cause fusion to take place in events such as fertilization, embryogenesis and even infections by various types of bacteria and viruses. It is therefore an extremely important event to study. From an evolutionary angle, fusion is an extremely controlled phenomenon. Random fusion can result in severe problems to the normal functioning of the human body. Fusion of biological membranes is mediated by proteins. Regardless of the complexity of the system, fusion essentially occurs due to the interplay of various interfacial forces, namely hydration repulsion, hydrophobic attraction and van der Waals forces.
Jacob Nissim Israelachvili, was an Israeli physicist who was a professor at the University of California, Santa Barbara (UCSB).
Photoconductive atomic force microscopy (PC-AFM) is a variant of atomic force microscopy that measures photoconductivity in addition to surface forces.
The Derjaguin approximation (or sometimes also referred to as the proximity approximation), named after the Russian scientist Boris Derjaguin, expresses the force profile acting between finite size bodies in terms of the force profile between two planar semi-infinite walls. This approximation is widely used to estimate forces between colloidal particles, as forces between two planar bodies are often much easier to calculate. The Derjaguin approximation expresses the force F(h) between two bodies as a function of the surface separation as
The colloidal probe technique is commonly used to measure interaction forces acting between colloidal particles and/or planar surfaces in air or in solution. This technique relies on the use of an atomic force microscope (AFM). However, instead of a cantilever with a sharp AFM tip, one uses the colloidal probe. The colloidal probe consists of a colloidal particle of few micrometers in diameter that is attached to an AFM cantilever. The colloidal probe technique can be used in the sphere-plane or sphere-sphere geometries. One typically achieves a force resolution between 1 and 100 pN and a distance resolution between 0.5 and 2 nm.
Ramsey interferometry, also known as the separated oscillating fields method, is a form of particle interferometry that uses the phenomenon of magnetic resonance to measure transition frequencies of particles. It was developed in 1949 by Norman Ramsey, who built upon the ideas of his mentor, Isidor Isaac Rabi, who initially developed a technique for measuring particle transition frequencies. Ramsey's method is used today in atomic clocks and in the SI definition of the second. Most precision atomic measurements, such as modern atom interferometers and quantum logic gates, have a Ramsey-type configuration. A more modern method, known as Ramsey–Bordé interferometry uses a Ramsey configuration and was developed by French physicist Christian Bordé and is known as the Ramsey–Bordé interferometer. Bordé's main idea was to use atomic recoil to create a beam splitter of different geometries for an atom-wave. The Ramsey–Bordé interferometer specifically uses two pairs of counter-propagating interaction waves, and another method named the "photon-echo" uses two co-propagating pairs of interaction waves.
In condensed matter physics and physical chemistry, the Lifshitz theory of van der Waals forces, sometimes called the macroscopic theory of van der Waals forces, is a method proposed by Evgeny Mikhailovich Lifshitz in 1954 for treating van der Waals forces between bodies which does not assume pairwise additivity of the individual intermolecular forces; that is to say, the theory takes into account the influence of neighboring molecules on the interaction between every pair of molecules located in the two bodies, rather than treating each pair independently.
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