Surface forces apparatus

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A current Surface Force Apparatus. The model shown is the SFA 2000. SFASurForce.jpg
A current Surface Force Apparatus. The model shown is the SFA 2000.

The Surface Force Apparatus (SFA) is a scientific instrument which measures the interaction force of two surfaces as they are brought together and retracted using multiple beam interferometry to monitor surface separation and directly measure contact area and observe any surface deformations occurring in the contact zone. One surface is held by a cantilevered spring, and the deflection of the spring is used to calculate the force being exerted. [2] The technique was pioneered by David Tabor and R.H.S. Winterton in the late 1960s at Cambridge University. [3] By the mid-1970s, J.N. Israelachvili had adapted the original design to operate in liquids, notably aqueous solutions, while at the Australian National University, [4] and further advanced the technique to support friction and electro-chemical surface studies [5] while at the University of California Santa Barbara.

Contents

Operation

A Surface Force Apparatus uses piezoelectric positioning elements (in addition to conventional motors for coarse adjustments), and senses the distance between the surfaces using optical interferometry. [6] Using these sensitive elements, the device can resolve distances to within 0.1 nanometer, and forces at the 10−8 N level. This extremely sensitive technique can be used to measure electrostatic forces, elusive van der Waals forces, and even hydration or solvation forces. SFA is in some ways similar to using an atomic force microscope to measure interaction between a tip (or molecule adsorbed onto the tip) and a surface. The SFA, however, is more ideally suited to measuring surface-surface interactions, can measure much longer-range forces more accurately, and is well-suited to situations where long relaxation times play a role (ordering, high-viscosity, corrosion). The SFA technique is quite demanding, nevertheless, labs worldwide have adopted the technique as part of their surface science research instrumentation.

In the SFA, method two smooth cylindrically curved surfaces whose cylindrical axes are positioned at 90° to each other are made to approach each other in a direction normal to the axes. The distance between the surfaces at the point of closest approach varies between a few micrometers to a few nanometers depending on the apparatus. When the two curved cylinders have the same radius of curvature, R, this so-called 'crossed cylinders' geometry is mathematically equivalent to the interaction between a flat surface and a sphere of radius R. Using the crossed cylinder geometry makes alignment much easier, enables testing of many different surface regions for better statistics, and also enables angle-dependent measurements to be taken. A typical setup involves R = 1 cm.

An example SFA setup showing the various layers, using a geometrically equivalent model. SFA Setup.png
An example SFA setup showing the various layers, using a geometrically equivalent model.

Position measurements are typically made using multiple beam interferometry (MBI). The transparent surfaces of the perpendicular cylinders, usually mica, are backed with a highly reflective material usually silver before being mounted to the glass cylinders. When a white-light source is shined normal to the perpendicular cylinders the light will reflect back and forth until it is transmitted at where the surfaces are closest. These rays create an interference pattern, known as fringes of equal chromatic order (FECO), which can be observed by microscope. Distance between the two surfaces can be determined by analyzing these patterns. Mica is used because it is extremely flat, easy to work with, and optically transparent. Any other material or molecule of interest can be coated or adsorbed onto the mica layer.

The jump method

In the jump method, the top cylinder is mounted to a pair of cantilever springs, while the bottom cylinder is brought up towards the top cylinder. While the bottom cylinder approaches the top, there comes a point when they will "jump" into contact with each other. The measurements, in this case, are based on the distance from which they jump and the spring constant. These measurements are usually between surfaces 1.25 nm and 20 nm apart. [6]

The resonance method

The jump method is difficult to execute mainly due to unaccounted vibrations entering the instrument. To overcome this, researchers developed the resonance method which measured surface forces at larger distances, 10 nm to 130 nm. In this case, the bottom cylinder is oscillated at a known frequency, while the frequency of the top cylinder is measured using a piezoelectric bimorph strain gauge. To minimize the dampening due to the surrounding substance, these measurements were originally done in a vacuum. [6]

Solvent mode

Early experiments measured the force between mica surfaces in air or vacuum. [6] The technique has been extended, however, to enable an arbitrary vapor or solvent to be introduced between the two surfaces. [7] In this way, interactions in various media can be carefully probed, and the dielectric constant of the gap between the surfaces can be tuned. Moreover, use of water as a solvent enables the measurement of interactions between biological molecules (such as lipids in biological membranes or proteins) in their native environment. In a solvent environment, SFA can even measure the oscillatory solvation and structural forces arising from the packing of individual layers of solvent molecules. It can also measure the electrostatic 'double layer' forces between charged surfaces in an aqueous medium with electrolyte.

Dynamic mode

The SFA has more recently been extended to perform dynamic measurements, thereby determining viscous and viscoelastic properties of fluids, frictional and tribological properties of surfaces, and the time-dependent interaction between biological structures. [8]

Theory

The force measurements of the SFA are based primarily on Hooke's Law,

where F is the restoring force of a spring, k is the spring constant and x is the displacement of the spring.

Using a cantilevered spring, the lower surface is brought towards the top surface using a fine micrometer or piezotube. The force between the two surfaces is measured by

where is the change in displacement applied by the micrometer and is the change displacement measured by interferometry.

The spring constants can range anywhere from to . [2] When measuring higher forces, a spring with a higher spring constant would be used.

See also

Related Research Articles

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Jacob Nissim Israelachvili, was an Israeli physicist and chemical engineer who was a professor of chemical engineering at the University of California, Santa Barbara (UCSB).

Photoconductive atomic force microscopy

Photoconductive atomic force microscopy (PC-AFM) is a variant of atomic force microscopy that measures photoconductivity in addition to surface forces.

Derjaguin approximation

The Derjaguin approximation due to the Russian scientist Boris Derjaguin expresses the force profile acting between finite size bodies in terms of the force profile between two planar semi-infinite walls. This approximation is widely used to estimate forces between colloidal particles, as forces between two planar bodies are often much easier to calculate. The Derjaguin approximation expresses the force F(h) between two bodies as a function of the surface separation as

Colloidal probe technique

The colloidal probe technique is commonly used to measure interaction forces acting between colloidal particles and/or planar surfaces in air or in solution. This technique relies on the use of an atomic force microscope (AFM). However, instead of a cantilever with a sharp AFM tip, one uses the colloidal probe. The colloidal probe consists of a colloidal particle of few micrometers in diameter that is attached to an AFM cantilever. The colloidal probe technique can be used in the sphere-plane or sphere-sphere geometries. One typically achieves a force resolution between 1 and 100 pN and a distance resolution between 0.5 and 2 nm.

Ramsey interferometry, also known as Ramsey–Bordé interferometry or the separated oscillating fields method, is a form of particle interferometry that uses the phenomenon of magnetic resonance to measure transition frequencies of particles. It was developed in 1949 by Norman Ramsey, who built upon the ideas of his mentor, Isidor Isaac Rabi, who initially developed a technique for measuring particle transition frequencies. Ramsey's method is used today in atomic clocks and in the S.I. definition of the second. Most precision atomic measurements, such as modern atom interferometers and quantum logic gates, have a Ramsey-type configuration. A modern interferometer using a Ramsey configuration was developed by French physicist Christian Bordé and is known as the Ramsey–Bordé interferometer. Bordé's main idea was to use atomic recoil to create a beam splitter of different geometries for an atom-wave. The Ramsey–Bordé interferometer specifically uses two pairs of counter-propagating interaction waves, and another method named the "photon-echo" uses two co-propagating pairs of interaction waves.

In condensed matter physics and physical chemistry, the Lifshitz theory of van der Waals forces, sometimes called the macroscopic theory of van der Waals forces, is a method proposed by Evgeny Mikhailovich Lifshitz in 1954 for treating van der Waals forces between bodies which does not assume pairwise additivity of the individual intermolecular forces; that is to say, the theory takes into account the influence of neighboring molecules on the interaction between every pair of molecules located in the two bodies, rather than treating each pair independently.

References

  1. "Home - SurForce LLC". SurForce LLC. Retrieved 2018-10-26.
  2. 1 2 Israelachvili, J; Min, Y; Akbulut, M; Alig, A; Carver, G; Greene, W; Kristiansen, K; Meyer, E; Pesika, N; Rosenberg, K; Zeng, H (2010). "Recent advances in the surface forces apparatus (SFA) technique". Reports on Progress in Physics. 73 (3): 036601. Bibcode:2010RPPh...73c6601I. doi:10.1088/0034-4885/73/3/036601. ISSN   0034-4885. S2CID   53958134.
  3. Tabor, D.; Winterton, R. H. S. (30 September 1969). "The Direct Measurement of Normal and Retarded van der Waals Forces". Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences. 312 (1511): 435–450. Bibcode:1969RSPSA.312..435T. doi:10.1098/rspa.1969.0169. S2CID   96200833.
  4. Israelachvili, J. N.; Adams, G. E. (26 August 1976). "Direct measurement of long range forces between two mica surfaces in aqueous KNO3 solutions". Nature. 262 (5571): 774–776. Bibcode:1976Natur.262..774I. doi:10.1038/262774a0. S2CID   4170776.
  5. Israelachvili, J; Min, Y; Akbulut, M; Alig, A; Carver, G; Greene, W; Kristiansen, K; Meyer, E; Pesika, N (2010-01-27). "Recent advances in the surface forces apparatus (SFA) technique". Reports on Progress in Physics. 73 (3): 036601. Bibcode:2010RPPh...73c6601I. doi:10.1088/0034-4885/73/3/036601. ISSN   0034-4885. S2CID   53958134.
  6. 1 2 3 4 Israelachvili, J. N.; Tabor, D. (1972-11-21). "The Measurement of Van Der Waals Dispersion Forces in the Range 1.5 to 130 nm". Proceedings of the Royal Society of London A: Mathematical, Physical and Engineering Sciences. 331 (1584): 19–38. Bibcode:1972RSPSA.331...19I. doi:10.1098/rspa.1972.0162. ISSN   1364-5021. S2CID   202575114.
  7. Israelachvili, J. N.; Adams, G. E. (1976-08-26). "Direct measurement of long range forces between two mica surfaces in aqueous KNO3 solutions". Nature. 262 (5571): 774–776. Bibcode:1976Natur.262..774I. doi:10.1038/262774a0. S2CID   4170776.
  8. Author (2002). "A new surface forces apparatus for nanorheology" (PDF). Review of Scientific Instruments. 73 (6): 2296. Bibcode:2002RScI...73.2292R. doi:10.1063/1.1476719.{{cite journal}}: |last1= has generic name (help)

Further reading