Nanotechnology was defined by the National Nanotechnology Initiative as the manipulation of matter with at least one dimension sized from 1 to 100 nanometers (nm). At this scale, commonly known as the nanoscale, surface area and quantum mechanical effects become important in describing properties of matter. The definition of nanotechnology is inclusive of all types of research and technologies that deal with these special properties. It is therefore common to see the plural form "nanotechnologies" as well as "nanoscale technologies" to refer to the broad range of research and applications whose common trait is size. An earlier description of nanotechnology referred to the particular technological goal of precisely manipulating atoms and molecules for fabrication of macroscale products, also now referred to as molecular nanotechnology.
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
The Molecular Foundry is a nanoscience user facility located at the Lawrence Berkeley National Laboratory in Berkeley, California, and is one of five Nanoscale Science Research Centers sponsored by the United States Department of Energy.
Nanomaterials describe, in principle, materials of which a single unit is sized between 1 and 100 nm.
A nanoruler is a tool or a method used within the subfield of "nanometrology" to achieve precise control and measurements at the nanoscale. Measurements of extremely tiny proportions require more complicated procedures, such as manipulating the properties of light (plasmonic) or DNA to determine distances. At the nanoscale, materials and devices exhibit unique properties that can significantly influence their behavior. In fields like electronics, medicine, and biotechnology, where advancements come from manipulating matter at the atomic and molecular levels, nanoscale measurements become essential.
Nanoelectrochemistry is a branch of electrochemistry that investigates the electrical and electrochemical properties of materials at the nanometer size regime. Nanoelectrochemistry plays significant role in the fabrication of various sensors, and devices for detecting molecules at very low concentrations.
The hard X-ray nanoprobe at the Center for Nanoscale Materials (CNM), Argonne National Lab advanced the state of the art by providing a hard X-ray microscopy beamline with the highest spatial resolution in the world. It provides for fluorescence, diffraction, and transmission imaging with hard X-rays at a spatial resolution of 30 nm or better. A dedicated source, beamline, and optics form the basis for these capabilities. This unique instrument is not only key to the specific research areas of the CNM; it will also be a general utility, available to the broader nanoscience community in studying nanomaterials and nanostructures, particularly for embedded structures.
Magnetic resonance force microscopy (MRFM) is an imaging technique that acquires magnetic resonance images (MRI) at nanometer scales, and possibly at atomic scales in the future. MRFM is potentially able to observe protein structures which cannot be seen using X-ray crystallography and protein nuclear magnetic resonance spectroscopy. Detection of the magnetic spin of a single electron has been demonstrated using this technique. The sensitivity of a current MRFM microscope is 10 billion times greater than a medical MRI used in hospitals.
Feature-oriented scanning (FOS) is a method of precision measurement of surface topography with a scanning probe microscope in which surface features (objects) are used as reference points for microscope probe attachment. With FOS method, by passing from one surface feature to another located nearby, the relative distance between the features and the feature neighborhood topographies are measured. This approach allows to scan an intended area of a surface by parts and then reconstruct the whole image from the obtained fragments. Beside the mentioned, it is acceptable to use another name for the method – object-oriented scanning (OOS).
The following outline is provided as an overview of and topical guide to nanotechnology:
Nanomechanics is a branch of nanoscience studying fundamental mechanical properties of physical systems at the nanometer scale. Nanomechanics has emerged on the crossroads of biophysics, classical mechanics, solid-state physics, statistical mechanics, materials science, and quantum chemistry. As an area of nanoscience, nanomechanics provides a scientific foundation of nanotechnology.
In 2007, productive nanosystems were defined as functional nanoscale systems that make atomically-specified structures and devices under programmatic control, i.e., performing atomically precise manufacturing. As of 2015, such devices were only hypothetical, and productive nanosystems represented a more advanced approach among several to perform Atomically Precise Manufacturing. A workshop on Integrated Nanosystems for Atomically Precise Manufacturing was held by the Department of Energy in 2015.
The technique of vibrational analysis with scanning probe microscopy allows probing vibrational properties of materials at the submicrometer scale, and even of individual molecules. This is accomplished by integrating scanning probe microscopy (SPM) and vibrational spectroscopy. This combination allows for much higher spatial resolution than can be achieved with conventional Raman/FTIR instrumentation. The technique is also nondestructive, requires non-extensive sample preparation, and provides more contrast such as intensity contrast, polarization contrast and wavelength contrast, as well as providing specific chemical information and topography images simultaneously.
Through-Focus Scanning Optical Microscopy (TSOM) is an imaging method that produces nanometer-scale three-dimensional measurement sensitivity using a conventional bright-field optical microscope. TSOM has been introduced and maintained by Ravikiran Attota at NIST. It was given an R&D 100 Award in 2010. In the TSOM method a target is scanned through the focus of an optical microscope, acquiring conventional optical images at different focal positions. The TSOM images are constructed using the through-focus optical images. A TSOM image is unique under given experimental conditions and is sensitive to changes in the dimensions of a target in a distinct way, which is very well applicable in nanoscale dimensional metrology. The TSOM method is alleged to have several nanometrology applications ranging from nanoparticles to through-silicon-vias (TSV).
In situ electron microscopy is an investigatory technique where an electron microscope is used to watch a sample's response to a stimulus in real time. Due to the nature of the high-energy beam of electrons used to image a sample in an electron microscope, microscopists have long observed that specimens are routinely changed or damaged by the electron beam. Starting in the 1960s, and using transmission electron microscopes (TEMs), scientists made deliberate attempts to modify materials while the sample was in the specimen chamber, and to capture images through time of the induced damages.
AFM-IR or infrared nanospectroscopy is one of a family of techniques that are derived from a combination of two parent instrumental techniques. AFM-IR combines the chemical analysis power of infrared spectroscopy and the high-spatial resolution of scanning probe microscopy (SPM). The term was first used to denote a method that combined a tuneable free electron laser with an atomic force microscope equipped with a sharp probe that measured the local absorption of infrared light by a sample with nanoscale spatial resolution.
Directed assembly of micro- and nano-structures are methods of mass-producing micro to nano devices and materials. Directed assembly allows the accurate control of assembly of micro and nano particles to form even the most intricate and highly functional devices or materials.
The characterization of nanoparticles is a branch of nanometrology that deals with the characterization, or measurement, of the physical and chemical properties of nanoparticles. Nanoparticles measure less than 100 nanometers in at least one of their external dimensions, and are often engineered for their unique properties. Nanoparticles are unlike conventional chemicals in that their chemical composition and concentration are not sufficient metrics for a complete description, because they vary in other physical properties such as size, shape, surface properties, crystallinity, and dispersion state.
A probe tip is an instrument used in scanning probe microscopes (SPMs) to scan the surface of a sample and make nano-scale images of surfaces and structures. The probe tip is mounted on the end of a cantilever and can be as sharp as a single atom. In microscopy, probe tip geometry and the composition of both the tip and the surface being probed directly affect resolution and imaging quality. Tip size and shape are extremely important in monitoring and detecting interactions between surfaces. SPMs can precisely measure electrostatic forces, magnetic forces, chemical bonding, Van der Waals forces, and capillary forces. SPMs can also reveal the morphology and topography of a surface.
Multi-tip scanning tunneling microscopy extends scanning tunneling microscopy (STM) from imaging to dedicated electrical measurements at the nanoscale like a ″multimeter at the nanoscale″. In materials science, nanoscience, and nanotechnology, it is desirable to measure electrical properties at a particular position of the sample. For this purpose, multi-tip STMs in which several tips are operated independently have been developed. Apart from imaging the sample, the tips of a multi-tip STM are used to form contacts to the sample at desired locations and to perform local electrical measurements.
