Angus Kirkland

Last updated
Professor
Angus Kirkland
FInstP FRSC FRMS
Born
Angus Ian Kirkland

August 1965 (age 58)
Education University of Cambridge (MA, Ph.D)
Known forExit-wave restoration [1]
Scientific career
Fields Electron microscopy
HRTEM
STEM
Institutions University of Oxford
Rosalind Franklin Institute
Diamond Light Source
University of Cambridge
Thesis High resolution electron microscopic studies of colloidal metal particles.  (1989)
Notable students Sarah Haigh

Angus Ian Kirkland FInstP FRSC FRMS (born August 1965) [2] [ non-primary source needed ] is the JEOL Professor of Electron Microscopy at the Department of Materials, University of Oxford. [3] Professor Kirkland specialises in High-resolution transmission electron microscopy and Scanning transmission electron microscopy. [4] [5]

Contents

Early life and education

Kirkland completed a Master of Arts in Natural Sciences, and a Doctor of Philosophy at the University of Cambridge in 1989. [6] [7]

Research and career

Kirkland continued at Cavendish Laboratory as post-doctoral fellow until he became Senior Research Associate. He was later elected the Ramsay Memorial Trust Research Fellow.

He then moved to the Department of Materials, University of Oxford where he has led Oxford Electron Image Analysis Group since 2003. [8] [9] He was appointed as professor in 2005, and became the JEOL Professor of Electron Microscopy in 2011. [3] [9] He was the co-director of the University of Oxford’s David Cockayne Centre. [10] [9]

Kirkland research focuses on developing new quantitative techniques for ultra high-resolution electron microscopy, and new imaging detectors. His research also include developing analysis and simulation. [11] [12] He researches nanomaterials inorganic oxides structure and surfaces. The development of new detectors, e.g., Transmission Electron Aberration-Corrected Microscope. [13] [7] [14] Angus Kirkland has an illustrious career with publications in Nature [15] [16] [14] and Science. [17] [18] He led collaborations and grants valued in £million. [19] [20]

As of November 2022, he is the Science Director at the Rosalind Franklin Institute [7] [21] and the electron Physical Science Imaging Centre (ePSIC) at Diamond Light Source. [6] He is also the Editor-in-Chief of Ultramicroscopy. [22]

Awards and honours

Kirkland is a Fellow of the Institute of Physics (FInstP), the Royal Society of Chemistry (FRSC), and the Royal Microscopical Society (FRMS). [6] [7]

Kirkland was awarded the Microscopy Society of America Award for the best paper published (2005). [23] In 2015, he was awarded the Harald Rose Distinguished Lecture Prize. [24] He also received the RMS Alan Agar Medal in 2017. [25] [26]

In 2012, Kirkland was appointed as an Honorary Professor at the centre of HRTEM, Nelson Mandela University, South Africa. [6] [27]

Selected publications

Related Research Articles

Photoemission electron microscopy is a type of electron microscopy that utilizes local variations in electron emission to generate image contrast. The excitation is usually produced by ultraviolet light, synchrotron radiation or X-ray sources. PEEM measures the coefficient indirectly by collecting the emitted secondary electrons generated in the electron cascade that follows the creation of the primary core hole in the absorption process. PEEM is a surface sensitive technique because the emitted electrons originate from a shallow layer. In physics, this technique is referred to as PEEM, which goes together naturally with low-energy electron diffraction (LEED), and low-energy electron microscopy (LEEM). In biology, it is called photoelectron microscopy (PEM), which fits with photoelectron spectroscopy (PES), transmission electron microscopy (TEM), and scanning electron microscopy (SEM).

<span class="mw-page-title-main">Scanning transmission electron microscopy</span> Scanning microscopy using thin samples and transmitted electrons

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis. The rastering of the beam across the sample makes STEM suitable for analytical techniques such as Z-contrast annular dark-field imaging, and spectroscopic mapping by energy dispersive X-ray (EDX) spectroscopy, or electron energy loss spectroscopy (EELS). These signals can be obtained simultaneously, allowing direct correlation of images and spectroscopic data.

<span class="mw-page-title-main">Department of Materials, University of Oxford</span>

The Department of Materials at the University of Oxford, England was founded in the 1950s as the Department of Metallurgy, by William Hume-Rothery, who was a reader in Oxford's Department of Inorganic Chemistry. It is part of the university's Mathematical, Physical and Life Sciences Division

<span class="mw-page-title-main">Harry Atwater</span> Professor of applied physics / materials science

Harry Albert Atwater, Jr. is an American physicist and materials scientist and is the Otis Booth Leadership Chair of the division of engineering and applied science at the California Institute of Technology. Currently he is the Howard Hughes Professor of Applied Physics and Materials Science and the director for the Liquid Sunlight Alliance (LiSA), a Department of Energy Hub program for solar fuels. Atwater's scientific effort focuses on nanophotonic light-matter interactions and solar energy conversion. His current research in energy centers on high efficiency photovoltaics, carbon capture and removal, and photoelectrochemical processes for generation of solar fuels. His research has resulted in world records for solar photovoltaic conversion and photoelectrochemical water splitting. His work also spans fundamental nanophotonic phenomena, in plasmonics and 2D materials, and also applications including active metasurfaces and optical propulsion. 

<span class="mw-page-title-main">Electron tomography</span>

Electron tomography (ET) is a tomography technique for obtaining detailed 3D structures of sub-cellular, macro-molecular, or materials specimens. Electron tomography is an extension of traditional transmission electron microscopy and uses a transmission electron microscope to collect the data. In the process, a beam of electrons is passed through the sample at incremental degrees of rotation around the center of the target sample. This information is collected and used to assemble a three-dimensional image of the target. For biological applications, the typical resolution of ET systems are in the 5–20 nm range, suitable for examining supra-molecular multi-protein structures, although not the secondary and tertiary structure of an individual protein or polypeptide. Recently, atomic resolution in 3D electron tomography reconstructions has been demonstrated.

<span class="mw-page-title-main">Rafal E. Dunin-Borkowski</span> British experimental physicist

Rafal Edward Dunin-Borkowski HonFRMS is a British experimental physicist. He is currently Director of the Institute for Microstructure Research (PGI-5) and the Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) in Forschungszentrum Jülich and Professor of Experimental Physics in RWTH Aachen University.

<i>Ultramicroscopy</i> Academic journal

Ultramicroscopy is an established peer-reviewed scientific journal in the field of electron microscopy. The journal editor-in-chief is Professor Angus Kirkland and it is published by Elsevier. It provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.

<span class="mw-page-title-main">Ondrej Krivanek</span> British physicist

Ondrej L. Krivanek is a Czech/British physicist resident in the United States, and a leading developer of electron-optical instrumentation. He won the Kavli Prize for Nanoscience in 2020 for his substantial innovations in atomic resolution electron microscopy.

<span class="mw-page-title-main">Paul Midgley</span> British materials scientist (born 1966)

Paul Anthony Midgley FRS is a Professor of Materials Science in the Department of Materials Science and Metallurgy at the University of Cambridge and a fellow of Peterhouse, Cambridge.

Karen Chan is an associate professor at the Technical University of Denmark. She is a Canadian and French physicist most notable for her work on catalysis, electrocatalysis, and electrochemical reduction of carbon dioxide.

<span class="mw-page-title-main">Liquid-Phase Electron Microscopy</span>

Liquid-phase electron microscopy refers to a class of methods for imaging specimens in liquid with nanometer spatial resolution using electron microscopy. LP-EM overcomes the key limitation of electron microscopy: since the electron optics requires a high vacuum, the sample must be stable in a vacuum environment. Many types of specimens relevant to biology, materials science, chemistry, geology, and physics, however, change their properties when placed in a vacuum.

<span class="mw-page-title-main">Ben Britton</span> British materials scientist and engineer

Thomas Benjamin Britton is a materials scientist, engineer and Associate Professor at The University of British Columbia. His research interests are in micromechanics, deformation, strain and electron backscatter diffraction (EBSD). In 2014 he was awarded the Silver Medal of the Institute of Materials, Minerals and Mining (IOM3), a society of which he then became a Fellow in 2016.

<span class="mw-page-title-main">Sarah Haigh</span> British microscopist

Sarah Jane Haigh is a Professor in the School of Materials at the University of Manchester. She investigates nanomaterials using transmission electron microscopy, including two-dimensional materials such as graphene.

Pinshane Yeh Huang is an Associate Professor of Materials Science at the University of Illinois at Urbana–Champaign. She develops transmission electron microscopy to investigate two-dimensional materials. During her PhD she discovered the thinnest piece of glass in the world, which was included in the Guinness World Records. Huang was awarded the 2019 Presidential Early Career Award for Scientists and Engineers.

John Marius Rodenburg is emeritus professor in the Department of Electronic and Electrical Engineering at the University of Sheffield. He was elected a Fellow of the Royal Society (FRS) in 2019 for "internationally recognised... work on revolutionising the imaging capability of light, X-ray and electron transmission microscopes".

Joanne Etheridge is an Australian physicist. She is Director of the Monash Centre for Electron Microscopy and Professor in the Department of Materials Science and Engineering at Monash University.

<span class="mw-page-title-main">Zhong Lin Wang</span> Chinese-American physicist

Zhong Lin Wang is a Chinese-American physicist, materials scientist and engineer specialized in nanotechnology, energy science and electronics. He received his PhD from Arizona State University in 1987. He is the Hightower Chair in Materials Science and Engineering and Regents' Professor Chair Emeritus at the Georgia Institute of Technology, US.

Peter David Nellist, is a British physicist and materials scientist, currently a professor in the Department of Materials at the University of Oxford. He is noted for pioneering new techniques in high-resolution electron microscopy.

4D scanning transmission electron microscopy is a subset of scanning transmission electron microscopy (STEM) which utilizes a pixelated electron detector to capture a convergent beam electron diffraction (CBED) pattern at each scan location. This technique captures a 2 dimensional reciprocal space image associated with each scan point as the beam rasters across a 2 dimensional region in real space, hence the name 4D STEM. Its development was enabled by evolution in STEM detectors and improvements computational power. The technique has applications in visual diffraction imaging, phase orientation and strain mapping, phase contrast analysis, among others.

Angus J. Wilkinson is a professor of materials science based at University of Oxford. He is a specialist in micromechanics, electron microscopy and crystal plasticity. He assists in overseeing the MicroMechanics group while focusing on the fundamentals of material deformation. He developed the HR-EBSD method for mapping stress and dislocation density at high spatial resolution used at the micron scale in mechanical testing and micro-cantilevers to extract data on mechanical properties that are relevant to materials engineering.

References

  1. ↑ Kirkland, A. I.; Saxton, W. O.; Chau, K. -L.; Tsuno, K.; Kawasaki, M. (1995-03-01). "Super-resolution by aperture synthesis: tilt series reconstruction in CTEM". Ultramicroscopy. 57 (4): 355–374. doi:10.1016/0304-3991(94)00191-O. ISSN   0304-3991.
  2. ↑ "Angus Ian KIRKLAND personal appointments - Find and update company information - GOV.UK". find-and-update.company-information.service.gov.uk. Retrieved 2022-11-13.
  3. 1 2 "Angus Kirkland". www.materials.ox.ac.uk. Retrieved 2022-11-13.
  4. ↑ "Angus Kirkland". scholar.google.com. Retrieved 2022-11-13.
  5. ↑ "Angus I. Kirkland | University of Oxford | 307 Publications | 9194 Citations | Related Authors". SciSpace - Author. Retrieved 2022-11-13.
  6. 1 2 3 4 "Angus Kirkland - - Diamond Light Source". www.diamond.ac.uk. Retrieved 2022-11-13.
  7. 1 2 3 4 "Science Director - Professor Angus Kirkland". Rosalind Franklin Institute. Retrieved 2022-11-13.
  8. ↑ "Oxford Electron Image Analysis Group - Oxford Electron Image Analysis Group". www-eia.materials.ox.ac.uk. Retrieved 2022-11-13.
  9. 1 2 3 "Lab profile: Angus Kirkland, University of Oxford". Materials Today. Retrieved 2022-11-13.
  10. ↑ "Oxford Electron Image Analysis Group - Professor Angus Kirkland". www-eia.materials.ox.ac.uk. Retrieved 2022-11-13.
  11. ↑ "Prof Angus Kirkland". The ImagingBioPro Network. Retrieved 2022-11-13.
  12. ↑ "Kirkland, Angus - University of Oxford - Department of Materials". www.x-mol.com. Retrieved 2022-11-13.
  13. ↑ "Speakers". femms2017.org. Retrieved 2022-11-13.
  14. 1 2 Peng, Lele; Wei, Ziyang; Wan, Chengzhang; Li, Jing; Chen, Zhuo; Zhu, Dan; Baumann, Daniel; Liu, Haotian; Allen, Christopher S.; Xu, Xiang; Kirkland, Angus I.; Shakir, Imran; Almutairi, Zeyad; Tolbert, Sarah; Dunn, Bruce (September 2020). "A fundamental look at electrocatalytic sulfur reduction reaction". Nature Catalysis. 3 (9): 762–770. doi:10.1038/s41929-020-0498-x. ISSN   2520-1158. S2CID   221381477.
  15. ↑ Fei, Huilong; Dong, Juncai; Feng, Yexin; Allen, Christopher S.; Wan, Chengzhang; Volosskiy, Boris; Li, Mufan; Zhao, Zipeng; Wang, Yiliu; Sun, Hongtao; An, Pengfei; Chen, Wenxing; Guo, Zhiying; Lee, Chain; Chen, Dongliang (January 2018). "General synthesis and definitive structural identification of MN4C4 single-atom catalysts with tunable electrocatalytic activities". Nature Catalysis. 1 (1): 63–72. doi:10.1038/s41929-017-0008-y. ISSN   2520-1158. S2CID   103450647.
  16. ↑ Robertson, Alex W.; Allen, Christopher S.; Wu, Yimin A.; He, Kuang; Olivier, Jaco; Neethling, Jan; Kirkland, Angus I.; Warner, Jamie H. (2012-10-23). "Spatial control of defect creation in graphene at the nanoscale". Nature Communications. 3 (1): 1144. Bibcode:2012NatCo...3.1144R. doi: 10.1038/ncomms2141 . ISSN   2041-1723. PMID   23093181.
  17. ↑ Meyer, Rüdiger R.; Sloan, Jeremy; Dunin-Borkowski, Rafal E.; Kirkland, Angus I.; Novotny, Miles C.; Bailey, Sam R.; Hutchison, John L.; Green, Malcolm L. H. (2000-08-25). "Discrete Atom Imaging of One-Dimensional Crystals Formed Within Single-Walled Carbon Nanotubes". Science. 289 (5483): 1324–1326. Bibcode:2000Sci...289.1324M. doi:10.1126/science.289.5483.1324. ISSN   0036-8075. PMID   10958773.
  18. ↑ Warner, Jamie H.; Margine, Elena Roxana; Mukai, Masaki; Robertson, Alexander W.; Giustino, Feliciano; Kirkland, Angus I. (2012-07-13). "Dislocation-Driven Deformations in Graphene". Science. 337 (6091): 209–212. Bibcode:2012Sci...337..209W. doi:10.1126/science.1217529. ISSN   0036-8075. PMID   22798609. S2CID   39088552.
  19. ↑ "Angus Kirkland - GTR".
  20. ↑ "Rosalind Franklin Institute invest £1.55m for unique electron microscope". EurekAlert!. Retrieved 2022-11-13.
  21. ↑ Weller, Olaf (2019-11-13). "Exclusive interview with Prof. Angus Kirkland, RFI, UK". DENSsolutions. Retrieved 2022-11-13.
  22. ↑ "Ultramicroscopy | Journal". ScienceDirect.com by Elsevier. Retrieved 2022-11-13.
  23. ↑ "Microscopy Society of America Award for the best paper published (2005) - Google Search". www.google.com. Retrieved 2022-11-13.
  24. ↑ "Oxford Electron Image Analysis Group - Oxford Electron Image Analysis Group". www-eia.materials.ox.ac.uk. Retrieved 2022-11-13.
  25. ↑ Labmate, International. "Royal Microscopical Society Medal Series - Winners Announced". Labmate Online. Retrieved 2022-11-13.
  26. ↑ Mel. "Alan Agar Award for Electron Microscopy". www.rms.org.uk. Retrieved 2022-11-13.
  27. ↑ "VISITOR SNAPSHOT: Professor Angus Kirkland (Oxford University, United Kingdom) and Professor Peter van Aken (Max Planck Institute, Germany) both Honorary Professors at the Nelson Mandela University visited the Centre for HRTEM for a specialist lecture series". Twitter. Retrieved 2022-11-13.
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