A microscope is a laboratory instrument used to examine objects that are too small to be seen by the naked eye. Microscopy is the science of investigating small objects and structures using a microscope. Microscopic means being invisible to the eye unless aided by a microscope.
Electron energy loss spectroscopy (EELS) is a form of electron microscopy in which a material is exposed to a beam of electrons with a known, narrow range of kinetic energies. Some of the electrons will undergo inelastic scattering, which means that they lose energy and have their paths slightly and randomly deflected. The amount of energy loss can be measured via an electron spectrometer and interpreted in terms of what caused the energy loss. Inelastic interactions include phonon excitations, inter- and intra-band transitions, plasmon excitations, inner shell ionizations, and Cherenkov radiation. The inner-shell ionizations are particularly useful for detecting the elemental components of a material. For example, one might find that a larger-than-expected number of electrons comes through the material with 285 eV less energy than they had when they entered the material. This is approximately the amount of energy needed to remove an inner-shell electron from a carbon atom, which can be taken as evidence that there is a significant amount of carbon present in the sample. With some care, and looking at a wide range of energy losses, one can determine the types of atoms, and the numbers of atoms of each type, being struck by the beam. The scattering angle can also be measured, giving information about the dispersion relation of whatever material excitation caused the inelastic scattering.
Transmission Electron Aberration-Corrected Microscope (TEAM) is a collaborative research project between four US laboratories and two companies. The project's main activity is design and application of a transmission electron microscope (TEM) with a spatial resolution below 0.05 nanometers, which is roughly half the size of an atom of hydrogen.
A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis. The rastering of the beam across the sample makes STEM suitable for analytical techniques such as Z-contrast annular dark-field imaging, and spectroscopic mapping by energy dispersive X-ray (EDX) spectroscopy, or electron energy loss spectroscopy (EELS). These signals can be obtained simultaneously, allowing direct correlation of images and spectroscopic data.
George David William Smith FRS, FIMMM, FInstP, FRSC, CEng is a materials scientist with special interest in the study of the microstructure, composition and properties of engineering materials at the atomic level. He invented, together with Alfred Cerezo and Terry Godfrey, the Atom-Probe Tomograph in 1988.
David John Hugh Cockayne FRS FInstP was Professor in the physical examination of materials in the Department of Materials at the University of Oxford and professorial fellow at Linacre College from 2000 to 2009. He was the president of the International Federation of Societies for Microscopy from 2003 till 2007, then vice-president 2007 to 2010.
The following outline is provided as an overview of and topical guide to nanotechnology:
The Department of Materials Science and Metallurgy (DMSM) is a large research and teaching division of the University of Cambridge. Since 2013 it has been located in West Cambridge, having previously occupied several buildings on the New Museums Site in the centre of Cambridge.
Michael John Whelan HonFRMS FRS FInstP is a British scientist.
Ondrej L. Krivanek is a Czech/British physicist resident in the United States, and a leading developer of electron-optical instrumentation. He won the Kavli Prize for Nanoscience in 2020 for his substantial innovations in atomic resolution electron microscopy.
Dame Pratibha Laxman Gai-Boyes is a British microscopist and Professor and Chair of Electron Microscopy and former Director at The York JEOL Nanocentre, Departments of Chemistry and Physics, University of York. She created the atomic-resolution environmental transmission electron microscope (ETEM) and is an outspoken advocate for women with careers in science.
George Andrew Davidson Briggs is a British scientist. He is Professor of Nanomaterials in the Department of Materials at the University of Oxford. He is best known for his early work in acoustic microscopy and his current work in materials for quantum technologies.
Sergei V. Kalinin is the Weston Fulton Professor at the Department of Materials Science and Engineering at the University of Tennessee-Knoxville.
Catherine Mary Fiona Rae is a Professor of Superalloys in the Department of Materials at the University of Cambridge. Rae is the Director of the Rolls-Royce UTC in Cambridge. She is known for her expertise in electron microscopy and the behaviour of materials in aerospace applications.
Amanda Karen Petford-Long is a Professor of Materials Science and Distinguished Fellow at the Argonne National Laboratory. She is also a Professor of Materials Science at Northwestern University.
Sarah Jane Haigh is a Professor in the School of Materials at the University of Manchester. She investigates nanomaterials using transmission electron microscopy, including two-dimensional materials such as graphene.
Hazel Elaine Assender, is the head of Department and Professor of Materials at the Department of Materials, University of Oxford. She is an expert in polymer chemistry, thin film electronics and nanomaterials. Assender is a fellow of Linacre College, Oxford.
Caterina Ducati is a Professor of Nanomaterials in the Department of Materials at the University of Cambridge. She serves as Director of the University of Cambridge Master's programme in Micro- and Nanotechnology Enterprise as well as leading teaching in the Nanotechnology Doctoral Training Centre.
Peter David Nellist, is a British physicist and materials scientist, currently a professor in the Department of Materials at the University of Oxford. He is noted for pioneering new techniques in high-resolution electron microscopy.
Angus Ian KirklandFInstP FRSC FRMS is the JEOL Professor of Electron Microscopy at the Department of Materials, University of Oxford. Professor Kirkland specialises in High-resolution transmission electron microscopy and Scanning transmission electron microscopy.
