List of types of interferometers

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An interferometer is a device for extracting information from the superposition of multiple waves.

Contents

Field and linear interferometers

Intensity and nonlinear interferometers

Quantum optics interferometers

Interferometers outside optics

See also

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<span class="mw-page-title-main">Diffraction</span> Phenomenon of the motion of waves

Diffraction is the interference or bending of waves around the corners of an obstacle or through an aperture into the region of geometrical shadow of the obstacle/aperture. The diffracting object or aperture effectively becomes a secondary source of the propagating wave. Italian scientist Francesco Maria Grimaldi coined the word diffraction and was the first to record accurate observations of the phenomenon in 1660.

<span class="mw-page-title-main">Wave interference</span> Phenomenon resulting from the superposition of two waves

In physics, interference is a phenomenon in which two coherent waves are combined by adding their intensities or displacements with due consideration for their phase difference. The resultant wave may have greater intensity or lower amplitude if the two waves are in phase or out of phase, respectively. Interference effects can be observed with all types of waves, for example, light, radio, acoustic, surface water waves, gravity waves, or matter waves as well as in loudspeakers as electrical waves.

<span class="mw-page-title-main">Optics</span> Branch of physics that studies light

Optics is the branch of physics that studies the behaviour and properties of light, including its interactions with matter and the construction of instruments that use or detect it. Optics usually describes the behaviour of visible, ultraviolet, and infrared light. Light is a type of electromagnetic radiation, and other forms of electromagnetic radiation such as X-rays, microwaves, and radio waves exhibit similar properties.

<span class="mw-page-title-main">Interferometry</span> Measurement method using interference of waves

Interferometry is a technique which uses the interference of superimposed waves to extract information. Interferometry typically uses electromagnetic waves and is an important investigative technique in the fields of astronomy, fiber optics, engineering metrology, optical metrology, oceanography, seismology, spectroscopy, quantum mechanics, nuclear and particle physics, plasma physics, biomolecular interactions, surface profiling, microfluidics, mechanical stress/strain measurement, velocimetry, optometry, and making holograms.

In physics, coherence expresses the potential for two waves to interfere. Two monochromatic beams from a single source always interfere. Physical sources are not strictly monochromatic: they may be partly coherent. Beams from different sources are mutually incoherent.

Optics is the branch of physics which involves the behavior and properties of light, including its interactions with matter and the construction of instruments that use or detect it. Optics usually describes the behavior of visible, ultraviolet, and infrared light. Because light is an electromagnetic wave, other forms of electromagnetic radiation such as X-rays, microwaves, and radio waves exhibit similar properties.

<span class="mw-page-title-main">Mach–Zehnder interferometer</span> Device to determine relative phase shift

The Mach–Zehnder interferometer is a device used to determine the relative phase shift variations between two collimated beams derived by splitting light from a single source. The interferometer has been used, among other things, to measure phase shifts between the two beams caused by a sample or a change in length of one of the paths. The apparatus is named after the physicists Ludwig Mach and Ludwig Zehnder; Zehnder's proposal in an 1891 article was refined by Mach in an 1892 article. Demonstrations of Mach–Zehnder interferometry with particles other than photons had been demonstrated as well in multiple experiments.

<span class="mw-page-title-main">Michelson interferometer</span> Common configuration for optical interferometry

The Michelson interferometer is a common configuration for optical interferometry and was invented by the 19/20th-century American physicist Albert Abraham Michelson. Using a beam splitter, a light source is split into two arms. Each of those light beams is reflected back toward the beamsplitter which then combines their amplitudes using the superposition principle. The resulting interference pattern that is not directed back toward the source is typically directed to some type of photoelectric detector or camera. For different applications of the interferometer, the two light paths can be with different lengths or incorporate optical elements or even materials under test.

The interferometric visibility is a measure of the contrast of interference in any system subject to wave superposition. Examples include as optics, quantum mechanics, water waves, sound waves, or electrical signals. Visibility is defined as the ratio of the amplitude of the interference pattern to the sum of the powers of the individual waves. The interferometric visibility gives a practical way to measure the coherence of two waves. A theoretical definition of the coherence is given by the degree of coherence, using the notion of correlation.

<span class="mw-page-title-main">Fizeau interferometer</span>

A Fizeau interferometer is an interferometric arrangement whereby two reflecting surfaces are placed facing each other. As seen in Fig 1, the rear-surface reflected light from the transparent first reflector is combined with front-surface reflected light from the second reflector to form interference fringes.

<span class="mw-page-title-main">Point diffraction interferometer</span> Type of common-path interferometer

A point diffraction interferometer (PDI) is a type of common-path interferometer. Unlike an amplitude-splitting interferometer, such as a Michelson interferometer, which separates out an unaberrated beam and interferes this with the test beam, a common-path interferometer generates its own reference beam. In PDI systems, the test and reference beams travel the same or almost the same path. This design makes the PDI extremely useful when environmental isolation is not possible or a reduction in the number of precision optics is required. The reference beam is created from a portion of the test beam by diffraction from a small pinhole in a semitransparent coating. The principle of a PDI is shown in Figure 1.

Optical heterodyne detection is a method of extracting information encoded as modulation of the phase, frequency or both of electromagnetic radiation in the wavelength band of visible or infrared light. The light signal is compared with standard or reference light from a "local oscillator" (LO) that would have a fixed offset in frequency and phase from the signal if the latter carried null information. "Heterodyne" signifies more than one frequency, in contrast to the single frequency employed in homodyne detection.

Angle-resolved low-coherence interferometry (a/LCI) is an emerging biomedical imaging technology which uses the properties of scattered light to measure the average size of cell structures, including cell nuclei. The technology shows promise as a clinical tool for in situ detection of dysplastic, or precancerous tissue.

The N-slit interferometer is an extension of the double-slit interferometer also known as Young's double-slit interferometer. One of the first known uses of N-slit arrays in optics was illustrated by Newton. In the first part of the twentieth century, Michelson described various cases of N-slit diffraction.

Speckle, speckle pattern, or speckle noise is a granular noise texture degrading the quality as a consequence of interference among wavefronts in coherent imaging systems, such as radar, synthetic aperture radar (SAR), medical ultrasound and optical coherence tomography. Speckle is not external noise; rather, it is an inherent fluctuation in diffuse reflections, because the scatterers are not identical for each cell, and the coherent illumination wave is highly sensitive to small variations in phase changes.

<span class="mw-page-title-main">White light scanner</span>

A white light scanner (WLS) is a device for performing surface height measurements of an object using coherence scanning interferometry (CSI) with spectrally-broadband, "white light" illumination. Different configurations of scanning interferometer may be used to measure macroscopic objects with surface profiles measuring in the centimeter range, to microscopic objects with surface profiles measuring in the micrometer range. For large-scale non-interferometric measurement systems, see structured-light 3D scanner.

<span class="mw-page-title-main">Air-wedge shearing interferometer</span>

The air-wedge shearing interferometer is probably the simplest type of interferometer designed to visualize the disturbance of the wavefront after propagation through a test object. This interferometer is based on utilizing a thin wedged air-gap between two optical glass surfaces and can be used with virtually any light source even with non-coherent white light.

A common-path interferometer is a class of interferometers in which the reference beam and sample beams travel along the same path. Examples include the Sagnac interferometer, Zernike phase-contrast interferometer, and the point diffraction interferometer. A common-path interferometer is generally more robust to environmental vibrations than a "double-path interferometer" such as the Michelson interferometer or the Mach–Zehnder interferometer. Although travelling along the same path, the reference and sample beams may travel along opposite directions, or they may travel along the same direction but with the same or different polarization.

<span class="mw-page-title-main">Phase-contrast X-ray imaging</span> Imaging systems using changes in phase

Phase-contrast X-ray imaging or phase-sensitive X-ray imaging is a general term for different technical methods that use information concerning changes in the phase of an X-ray beam that passes through an object in order to create its images. Standard X-ray imaging techniques like radiography or computed tomography (CT) rely on a decrease of the X-ray beam's intensity (attenuation) when traversing the sample, which can be measured directly with the assistance of an X-ray detector. However, in phase contrast X-ray imaging, the beam's phase shift caused by the sample is not measured directly, but is transformed into variations in intensity, which then can be recorded by the detector.

<span class="mw-page-title-main">White light interferometry</span> Measurement technique

As described here, white light interferometry is a non-contact optical method for surface height measurement on 3D structures with surface profiles varying between tens of nanometers and a few centimeters. It is often used as an alternative name for coherence scanning interferometry in the context of areal surface topography instrumentation that relies on spectrally-broadband, visible-wavelength light.