John Rodenburg

Last updated
John Rodenburg

FRS
Born
John Marius Rodenburg

1960 (age 63–64) [1]
Alma mater University of Exeter (BSc)
University of Cambridge (PhD)
Awards Royal Society University Research Fellowship
Scientific career
Fields Microscopy
Materials analysis [2]
Institutions University of Sheffield
Sheffield Hallam University
Phase Focus Limited [1]
Murray Edwards College, Cambridge
Thesis Detection and interpretation of electron microdiffraction patterns  (1986)
Doctoral students Peter Nellist
Website www.sheffield.ac.uk/eee/staff/academics/j_rodenburg

John Marius Rodenburg FRS is emeritus professor in the Department of Electronic and Electrical Engineering at the University of Sheffield. [3] [4] He was elected a Fellow of the Royal Society (FRS) in 2019 for "internationally recognised... work on revolutionising the imaging capability of light, X-ray and electron transmission microscopes". [5]

Contents


Education

Rodenburg was educated at University of Exeter where he was awarded a Bachelor of Science degree in Physics with Electronics. He moved to the Cavendish Laboratory [6] to complete his PhD on the detection and interpretation of electron diffraction patterns which was awarded by the University of Cambridge in 1986. [7]

Career and research

Rodenburg worked until 1999 in the University of Cambridge as a University Research Fellow of the Royal Society. [8] He is currently emeritus professor in the Department of Electronics and Electrical Engineering at the University of Sheffield. [9]

His research interests have mostly been in improving the resolution and other capabilities of electron, X-ray and optical microscopy by processing diffraction patterns instead of using lenses. He has innovated many key developments in the diffractive imaging method called ptychography. [10] [11] [12] [13] [14] [15] [16]

In 2006, Rodenburg co-founded Phase Focus Limited, which uses ptychography to image live cells to improve cancer drug design. He served as a director and Chief Scientific Officer from 2006 to 2015. [2] [17] [18] [19] [13]

Awards and honours

Rodenburg was elected a Fellow of the Royal Society (FRS) in 2019.

Personal

Rodenburg is married to the material scientist Professor Conny Rodenburg, [20] and is the brother of the voice coach and writer Patsy Rodenburg [21]

Related Research Articles

In physics, the phase problem is the problem of loss of information concerning the phase that can occur when making a physical measurement. The name comes from the field of X-ray crystallography, where the phase problem has to be solved for the determination of a structure from diffraction data. The phase problem is also met in the fields of imaging and signal processing. Various approaches of phase retrieval have been developed over the years.

<span class="mw-page-title-main">Electron backscatter diffraction</span> Scanning electron microscopy technique

Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In the microscope an incident beam of electrons hits a tilted sample. As backscattered electrons leave the sample, they interact with the atoms and are both elastically diffracted and lose energy, leaving the sample at various scattering angles before reaching the phosphor screen forming Kikuchi patterns (EBSPs). The EBSD spatial resolution depends on many factors, including the nature of the material under study and the sample preparation. They can be indexed to provide information about the material's grain structure, grain orientation, and phase at the micro-scale. EBSD is used for impurities and defect studies, plastic deformation, and statistical analysis for average misorientation, grain size, and crystallographic texture. EBSD can also be combined with energy-dispersive X-ray spectroscopy (EDS), cathodoluminescence (CL), and wavelength-dispersive X-ray spectroscopy (WDS) for advanced phase identification and materials discovery.

Electron crystallography is a method to determine the arrangement of atoms in solids using a transmission electron microscope (TEM). It can involve the use of high-resolution transmission electron microscopy images, electron diffraction patterns including convergent-beam electron diffraction or combinations of these. It has been successful in determining some bulk structures, and also surface structures. Two related methods are low-energy electron diffraction which has solved the structure of many surfaces, and reflection high-energy electron diffraction which is used to monitor surfaces often during growth.

<span class="mw-page-title-main">Scanning transmission electron microscopy</span> Scanning microscopy using thin samples and transmitted electrons

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis. The rastering of the beam across the sample makes STEM suitable for analytical techniques such as Z-contrast annular dark-field imaging, and spectroscopic mapping by energy dispersive X-ray (EDX) spectroscopy, or electron energy loss spectroscopy (EELS). These signals can be obtained simultaneously, allowing direct correlation of images and spectroscopic data.

<span class="mw-page-title-main">John M. Cowley</span> Australian physicist (1923–2004)

John Maxwell Cowley was an American Regents Professor at Arizona State University. The John M. Cowley Center for High-Resolution Electron Microscopy at Arizona State is named in his honor.

John Cowley was an extraordinarily productive scientist over more than five decades. He made pioneering contributions in the fields of electron microscopy, diffraction and crystallography, all of which brought him widespread recognition. He received the highest awards of the International Union of Crystallography, the Electron Microscopy Society of America and the American Crystallographic Society, and he was honored by election to Fellowship of the Australian Academy of Science, The Royal Society of London, and the American Physical Society. His monograph Diffraction Physics remains the standard reference in the field. His ideas, enthusiasm and basic understanding of electron optics and diffraction phenomena provided a valued source of leadership to many generations of students and co-workers, and he was universally admired by his peers and colleagues as a great and inspiring scientist.

<span class="mw-page-title-main">Coherent diffraction imaging</span>

Coherent diffractive imaging (CDI) is a "lensless" technique for 2D or 3D reconstruction of the image of nanoscale structures such as nanotubes, nanocrystals, porous nanocrystalline layers, defects, potentially proteins, and more. In CDI, a highly coherent beam of X-rays, electrons or other wavelike particle or photon is incident on an object.

<span class="mw-page-title-main">Ptychography</span>

Ptychography is a computational method of microscopic imaging. It generates images by processing many coherent interference patterns that have been scattered from an object of interest. Its defining characteristic is translational invariance, which means that the interference patterns are generated by one constant function moving laterally by a known amount with respect to another constant function. The interference patterns occur some distance away from these two components, so that the scattered waves spread out and "fold" into one another as shown in the figure.

In scientific imaging, the two-dimensional spectral signal-to-noise ratio (SSNR) is a signal-to-noise ratio measure which measures the normalised cross-correlation coefficient between several two-dimensional images over corresponding rings in Fourier space as a function of spatial frequency. It is a multi-particle extension of the Fourier ring correlation (FRC), which is related to the Fourier shell correlation. The SSNR is a popular method for finding the resolution of a class average in cryo-electron microscopy.

<span class="mw-page-title-main">Paul Midgley</span>

Paul Anthony Midgley FRS is a Professor of Materials Science in the Department of Materials Science and Metallurgy at the University of Cambridge and a fellow of Peterhouse, Cambridge.

<span class="mw-page-title-main">Fourier ptychography</span> Computational imaging technique in microscopy

Fourier ptychography is a computational imaging technique based on optical microscopy that consists in the synthesis of a wider numerical aperture from a set of full-field images acquired at various coherent illumination angles, resulting in increased resolution compared to a conventional microscope.

<span class="mw-page-title-main">Precession electron diffraction</span> Averaging technique for electron diffraction

Precession electron diffraction (PED) is a specialized method to collect electron diffraction patterns in a transmission electron microscope (TEM). By rotating (precessing) a tilted incident electron beam around the central axis of the microscope, a PED pattern is formed by integration over a collection of diffraction conditions. This produces a quasi-kinematical diffraction pattern that is more suitable as input into direct methods algorithms to determine the crystal structure of the sample.

Carol Trager-Cowan is a Scottish physicist who is a Reader in physics and Science Communicator at the University of Strathclyde. She works on scanning electron microscopy, including Electron backscatter diffraction (EBSD), diffraction contrast and cathodoluminescence imaging.

<span class="mw-page-title-main">Detectors for transmission electron microscopy</span>

There are a variety of technologies available for detecting and recording the images, diffraction patterns, and electron energy loss spectra produced using transmission electron microscopy (TEM).

Joanne Etheridge is an Australian physicist. She is Director of the Monash Centre for Electron Microscopy and Professor in the Department of Materials Science and Engineering at Monash University.

<span class="mw-page-title-main">Convergent beam electron diffraction</span> Convergent beam electron diffraction technique

Convergent beam electron diffraction (CBED) is an electron diffraction technique where a convergent or divergent beam of electrons is used to study materials.

Peter David Nellist, is a British physicist and materials scientist, currently a professor in the Department of Materials at the University of Oxford. He is noted for pioneering new techniques in high-resolution electron microscopy.

4D scanning transmission electron microscopy is a subset of scanning transmission electron microscopy (STEM) which utilizes a pixelated electron detector to capture a convergent beam electron diffraction (CBED) pattern at each scan location. This technique captures a 2 dimensional reciprocal space image associated with each scan point as the beam rasters across a 2 dimensional region in real space, hence the name 4D STEM. Its development was enabled by evolution in STEM detectors and improvements computational power. The technique has applications in visual diffraction imaging, phase orientation and strain mapping, phase contrast analysis, among others.

Angus J Wilkinson is a professor of materials science based at University of Oxford. He is a specialist in micromechanics, electron microscopy and crystal plasticity. He assists in overseeing the MicroMechanics group while focusing on the fundamentals of material deformation. He developed the HR-EBSD method for mapping stress and dislocation density at high spatial resolution used at the micron scale in mechanical testing and micro-cantilevers to extract data on mechanical properties that are relevant to materials engineering.

Transmission Kikuchi Diffraction (TKD), also sometimes called transmission-electron backscatter diffraction (t-EBSD), is a method for orientation mapping at the nanoscale. It’s used for analysing the microstructures of thin transmission electron microscopy (TEM) specimens in the scanning electron microscope (SEM). This technique has been widely utilised in the characterization of nano-crystalline materials, including oxides, superconductors, and metallic alloys.

<span class="mw-page-title-main">Jianwei Miao</span> Chinese-American physicist

Jianwei (John) Miao is a Professor in the Department of Physics and Astronomy and the California NanoSystems Institute at the University of California, Los Angeles. He performed the first experiment on extending crystallography to allow structural determination of non-crystalline specimens in 1999, which has been known as coherent diffractive imaging (CDI), lensless imaging, or computational microscopy. In 2012, Miao applied the CDI method to pioneer atomic electron tomography (AET), enabling the first determination of 3D atomic structures without assuming crystallinity or averaging.

References

  1. 1 2 Anon (2006). "John Marius Rodenburg". companieshouse.gov.uk. London: Companies House. Archived from the original on 2019-11-07.
  2. 1 2 John Rodenburg publications indexed by Google Scholar OOjs UI icon edit-ltr-progressive.svg
  3. ↑ Sheffield, University of (20 October 2022). "Professor John Rodenburg - Academics - Staff - EEE - The University of Sheffield". www.sheffield.ac.uk.
  4. ↑ Sheffield, University of. "University of Sheffield engineer awarded one of academia's greatest honours - Latest - News - The University of Sheffield". www.sheffield.ac.uk.
  5. ↑ "John Rodenburg: Biography". The Royal Society. Retrieved 22 February 2024.
  6. ↑ Howie, A.; McGill, C. A.; Rodenburg, J. M. (1985). "Intensity Correlations in Microdiffraction from "Amorphous" Materials". Le Journal de Physique Colloques. 46 (C9): C9-59–C9-62. doi:10.1051/jphyscol:1985906. ISSN   0449-1947.
  7. ↑ Rodenburg, John Marius (1986). Detection and interpretation of electron microdiffraction patterns. jisc.ac.uk (PhD thesis). University of Cambridge. OCLC   59723869. EThOS   uk.bl.ethos.377238.
  8. ↑ "University Research Fellowship | Royal Society". royalsociety.org. Retrieved 2023-07-19.
  9. ↑ "Rodenburg, John, Professor". www.sheffield.ac.uk. 2022-10-20. Retrieved 2023-07-19.
  10. ↑ "The theory of super-resolution electron microscopy via Wigner-distribution deconvolution". Philosophical Transactions of the Royal Society of London A: Mathematical, Physical and Engineering Sciences. 339 (1655): 521–553. 1992-06-15. doi:10.1098/rsta.1992.0050. ISSN   0962-8428. S2CID   123384269.
  11. ↑ Rodenburg, J. M.; McCallum, B. C.; Nellist, P. D. (1993-03-01). "Experimental tests on double-resolution coherent imaging via STEM". Ultramicroscopy. 48 (3): 304–314. doi:10.1016/0304-3991(93)90105-7. ISSN   0304-3991.
  12. ↑ Nellist, P. D.; McCallum, B. C.; Rodenburg, J. M. (April 1995). "Resolution beyond the 'information limit' in transmission electron microscopy". Nature. 374 (6523): 630–632. doi:10.1038/374630a0. ISSN   1476-4687. S2CID   4330017.
  13. 1 2 Rodenburg, J. M.; Faulkner, H. M. L. (2004). "A phase retrieval algorithm for shifting illumination". Applied Physics Letters. 85 (20): 4795–4797. Bibcode:2004ApPhL..85.4795R. doi:10.1063/1.1823034. ISSN   0003-6951.
  14. ↑ Rodenburg, J. M.; Hurst, A. C.; Cullis, A. G.; Dobson, B. R.; Pfeiffer, F.; Bunk, O.; David, C.; Jefimovs, K.; Johnson, I. (2007-01-18). "Hard-X-Ray Lensless Imaging of Extended Objects". Physical Review Letters. 98 (3): 034801. doi:10.1103/PhysRevLett.98.034801. PMID   17358687.
  15. ↑ Maiden, Andrew M.; Rodenburg, John M. (September 2009). "An improved ptychographical phase retrieval algorithm for diffractive imaging". Ultramicroscopy. 109 (10): 1256–1262. doi:10.1016/j.ultramic.2009.05.012. ISSN   1879-2723. PMID   19541420.
  16. ↑ Maiden, A. M.; Humphry, M. J.; Rodenburg, J. M. (2012-08-01). "Ptychographic transmission microscopy in three dimensions using a multi-slice approach". JOSA A. 29 (8): 1606–1614. doi:10.1364/JOSAA.29.001606. ISSN   1520-8532. PMID   23201876.
  17. ↑ Maiden, Andrew M.; Rodenburg, John M. (2009). "An improved ptychographical phase retrieval algorithm for diffractive imaging". Ultramicroscopy. 109 (10): 1256–1262. doi:10.1016/j.ultramic.2009.05.012. ISSN   0304-3991. PMID   19541420.
  18. ↑ Rodenburg, J. M.; Hurst, A. C.; Cullis, A. G.; Dobson, B. R.; Pfeiffer, F.; Bunk, O.; David, C.; Jefimovs, K.; Johnson, I. (2007). "Hard-X-Ray Lensless Imaging of Extended Objects". Physical Review Letters. 98 (3): 034801. Bibcode:2007PhRvL..98c4801R. doi:10.1103/PhysRevLett.98.034801. ISSN   0031-9007. PMID   17358687.
  19. ↑ Faulkner, H. M. L.; Rodenburg, J. M. (2004). "Movable Aperture Lensless Transmission Microscopy: A Novel Phase Retrieval Algorithm". Physical Review Letters. 93 (2): 023903. Bibcode:2004PhRvL..93b3903F. doi:10.1103/PhysRevLett.93.023903. ISSN   0031-9007. PMID   15323918.
  20. ↑ "Rodenburg (née Schönjahn), Cornelia, Professor". www.sheffield.ac.uk. 2023-04-18. Retrieved 2023-07-19.
  21. ↑ bloomsbury.com. "Who's Who 2023". Bloomsbury. Retrieved 2023-07-19.
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