Whisker (metallurgy)

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Silver whiskers growing out of surface-mount resistors SilverSulfideWhiskers1.jpg
Silver whiskers growing out of surface-mount resistors

Metal whiskering is a phenomenon that occurs in electrical devices when metals form long whisker-like projections over time. Tin whiskers were noticed and documented in the vacuum tube era of electronics early in the 20th century in equipment that used pure, or almost pure, tin solder in their production. It was noticed that small metal hairs or tendrils grew between metal solder pads, causing short circuits. Metal whiskers form in the presence of compressive stress. Germanium, zinc, cadmium, and even lead whiskers have been documented. [1] Many techniques are used to mitigate the problem, including changes to the annealing process (heating and cooling), the addition of elements like copper and nickel, and the inclusion of conformal coatings. [2] Traditionally, lead has been added to slow down whisker growth in tin-based solders.

Contents

Following the Restriction of Hazardous Substances Directive (RoHS), the European Union banned the use of lead in most consumer electronic products from 2006 due to health problems associated with lead and the "high-tech trash" problem, leading to a re-focusing on the issue of whisker formation in lead-free solders.

Mechanism

Microscopic view of tin used to solder electronic components, showing a whisker Tin whisker ESA385984.jpg
Microscopic view of tin used to solder electronic components, showing a whisker

Metal whiskering is a crystalline metallurgical phenomenon involving the spontaneous growth of tiny, filiform hairs from a metallic surface. The effect is primarily seen on elemental metals but also occurs with alloys.

The mechanism behind metal whisker growth is not well understood, but seems to be encouraged by compressive mechanical stresses including:

Metal whiskers differ from metallic dendrites in several respects: dendrites are fern-shaped and grow across the surface of the metal, while metal whiskers are hair-like and project normal to the surface. Dendrite growth requires moisture capable of dissolving the metal into a solution of metal ions, which are then redistributed by electromigration in the presence of an electromagnetic field. While the precise mechanism for whisker formation remains unknown, it is known that whisker formation does not require either dissolution of the metal or the presence of an electromagnetic field.

Effects

Several mm long zinc whiskers on zinc-coated steel Zinc whiskers.jpg
Several mm long zinc whiskers on zinc-coated steel

Whiskers can cause short circuits and arcing in electrical equipment. The phenomenon was discovered by telephone companies in the late 1940s and it was later found that the addition of lead to tin solder provided mitigation. [6] The European Restriction of Hazardous Substances Directive (RoHS), which took effect on July 1, 2006, restricted the use of lead in various types of electronic and electrical equipment. This has driven the use of lead-free alloys with a focus on preventing whisker formation (see § Mitigation and elimination). Others have focused on the development of oxygen-barrier coatings to prevent whisker formation. [7]

Airborne zinc whiskers have been responsible for increased system failure rates in computer server rooms. Zinc whiskers grow from galvanized (electroplated) metal surfaces at a rate of up to a millimeter per year with a diameter of a few micrometers. Whiskers can form on the underside of zinc electroplated floor tiles on raised floors. These whiskers can then become airborne within the floor plenum when the tiles are disturbed, usually during maintenance. Whiskers can be small enough to pass through air filters and can settle inside equipment, resulting in short circuits and system failure. [8]

Tin whiskers do not have to be airborne to damage equipment, as they are typically already growing directly in the environment where they can produce short circuits, i.e., the electronic equipment itself. At frequencies above 6 GHz or in fast digital circuits, tin whiskers can act like miniature antennas, affecting the circuit impedance and causing reflections. In computer disk drives they can break off and cause head crashes or bearing failures. [9] Tin whiskers often cause failures in relays and have been found upon examination of failed relays in nuclear power facilities. [10] Pacemakers have been recalled due to tin whiskers. [11] Research has also identified a particular failure mode for tin whiskers in vacuum (such as in space), where in high-power components a short-circuiting tin whisker is ionized into a plasma that is capable of conducting hundreds of amperes of current, massively increasing the damaging effect of the short circuit. [12] The possible increase in the use of pure tin in electronics due to the RoHS directive drove JEDEC and IPC to release a tin whisker acceptance testing standard and mitigation practices guideline intended to help manufacturers reduce the risk of tin whiskers in lead-free products. [13]

Silver whiskers often appear in conjunction with a layer of silver sulfide, which forms on the surface of silver electrical contacts operating in an atmosphere rich in hydrogen sulfide and high humidity. Such atmospheres can exist in sewage treatment plants and paper mills.

Whiskers over 20 μm in length were observed on gold-plated surfaces and noted in a 2003 NASA internal memorandum. [14]

The effects of metal whiskering were chronicled on History Channel's program Engineering Disasters 19. [15]

Mitigation and elimination

Several approaches are used to reduce or eliminate whisker growth, with ongoing research in the area.

Conformal coatings

Conformal compound coatings stop the whiskers from penetrating a barrier, reaching a nearby termination and forming a short. [12]

Altering plating chemistry

Termination finishes of nickel, gold or palladium have been shown to eliminate whisker formation in controlled trials. [16]

Tin whisker examples and incidents

Galaxy IV

Galaxy IV was a telecommunications satellite that was disabled and lost due to short circuits caused by tin whiskers in 1998. It was initially thought that space weather contributed to the failure, but later it was discovered that a conformal coating had been misapplied, allowing whiskers formed in the pure tin plating to find their way through a missing coating area, causing a failure of the main control computer. The manufacturer, Hughes, has moved to nickel plating, rather than tin, to reduce the risk of whisker growth. The trade-off has been an increase in weight, adding 50 to 100 kilograms (110 to 220 lb) per payload. [17]

Millstone Nuclear Power Plant

On April 17, 2005, the Millstone Nuclear Power Plant in Connecticut was shut down due to a "false alarm" that indicated an unsafe pressure drop in the reactor's steam system when the steam pressure was actually nominal. The false alarm was caused by a tin whisker that short circuited the logic board responsible for monitoring the steam pressure lines in the power plant. [18]

Toyota accelerator position sensors false positive

In September 2011, three NASA investigators claimed that they identified tin whiskers on the accelerator position sensors [19] of sampled Toyota Camry models that could contribute to the "stuck accelerator" crashes affecting certain Toyota models during 2005–2010. [20] This contradicted an earlier 10-month joint investigation by the National Highway Traffic Safety Administration (NHTSA) and a large group of other NASA researchers that found no electronic defects. [21]

In 2012, NHTSA maintained: "We do not believe that tin whiskers are a plausible explanation for these incidents...[the likely cause was] pedal misapplication." [22]

Toyota also maintains that tin whiskers were not the cause of any stuck accelerator issues: "In the words of U.S. Transportation Secretary Ray LaHood, 'The verdict is in. There is no electronic-based cause for unintended high-speed acceleration in Toyotas. Period.'" According to a Toyota press release, "no data indicates that tin whiskers are more prone to occur in Toyota vehicles than any other vehicle in the marketplace." Toyota also states that "their systems are designed to reduce the risk that tin whiskers will form in the first place." [23]

See also

Related Research Articles

<span class="mw-page-title-main">Solder</span> Alloy used to join metal pieces

Solder is a fusible metal alloy used to create a permanent bond between metal workpieces. Solder is melted in order to wet the parts of the joint, where it adheres to and connects the pieces after cooling. Metals or alloys suitable for use as solder should have a lower melting point than the pieces to be joined. The solder should also be resistant to oxidative and corrosive effects that would degrade the joint over time. Solder used in making electrical connections also needs to have favorable electrical characteristics.

<span class="mw-page-title-main">Electroplating</span> Creation of protective or decorative metallic coating on other metal with electric current

Electroplating, also known as electrochemical deposition or electrodeposition, is a process for producing a metal coating on a solid substrate through the reduction of cations of that metal by means of a direct electric current. The part to be coated acts as the cathode of an electrolytic cell; the electrolyte is a solution of a salt of the metal to be coated, and the anode is usually either a block of that metal, or of some inert conductive material. The current is provided by an external power supply.

<span class="mw-page-title-main">Printed circuit board</span> Board to support and connect electronic components

A printed circuit board (PCB), also called printed wiring board (PWB), is a medium used to connect or "wire" components to one another in a circuit. It takes the form of a laminated sandwich structure of conductive and insulating layers: each of the conductive layers is designed with a pattern of traces, planes and other features etched from one or more sheet layers of copper laminated onto or between sheet layers of a non-conductive substrate. Electrical components may be fixed to conductive pads on the outer layers, generally by means of soldering, which both electrically connects and mechanically fastens the components to the board. Another manufacturing process adds vias, drilled holes that allow electrical interconnections between conductive layers.

<span class="mw-page-title-main">Ball grid array</span> Surface-mount packaging that uses an array of solder balls

A ball grid array (BGA) is a type of surface-mount packaging used for integrated circuits. BGA packages are used to permanently mount devices such as microprocessors. A BGA can provide more interconnection pins than can be put on a dual in-line or flat package. The whole bottom surface of the device can be used, instead of just the perimeter. The traces connecting the package's leads to the wires or balls which connect the die to package are also on average shorter than with a perimeter-only type, leading to better performance at high speeds.

<span class="mw-page-title-main">Tin pest</span> Deterioration of tin objects at low temperature

Tin pest is an autocatalytic, allotropic transformation of the element tin, which causes deterioration of tin objects at low temperatures. Tin pest has also been called tin disease, tin blight, tin plague, or tin leprosy. It is an autocatalytic process, accelerating once it begins. It was first documented in the scientific literature in 1851, having been observed in the pipes of pipe organs in medieval churches that had experienced cool climates.

<span class="mw-page-title-main">Flux (metallurgy)</span> Chemical used in metallurgy for cleaning or purifying molten metal

In metallurgy, a flux is a chemical reducing agent, flowing agent, or purifying agent. Fluxes may have more than one function at a time. They are used in both extractive metallurgy and metal joining.

<span class="mw-page-title-main">Restriction of Hazardous Substances Directive</span> European Union directive restricting ten hazardous materials

The Restriction of Hazardous Substances Directive 2002/95/EC, short for Directive on the restriction of the use of certain hazardous substances in electrical and electronic equipment, was adopted in February 2003 by the European Union.

<span class="mw-page-title-main">Hydrogen embrittlement</span> Reduction in ductility of a metal exposed to hydrogen

Hydrogen embrittlement (HE), also known as hydrogen-assisted cracking or hydrogen-induced cracking (HIC), is a reduction in the ductility of a metal due to absorbed hydrogen. Hydrogen atoms are small and can permeate solid metals. Once absorbed, hydrogen lowers the stress required for cracks in the metal to initiate and propagate, resulting in embrittlement. Hydrogen embrittlement occurs in steels, as well as in iron, nickel, titanium, cobalt, and their alloys. Copper, aluminium, and stainless steels are less susceptible to hydrogen embrittlement.

Plating is a finishing process in which a metal is deposited on a surface. Plating has been done for hundreds of years; it is also critical for modern technology. Plating is used to decorate objects, for corrosion inhibition, to improve solderability, to harden, to improve wearability, to reduce friction, to improve paint adhesion, to alter conductivity, to improve IR reflectivity, for radiation shielding, and for other purposes. Jewelry typically uses plating to give a silver or gold finish.

<span class="mw-page-title-main">Gold plating</span> Coating an object with a thin layer of gold

Gold plating is a method of depositing a thin layer of gold onto the surface of another metal, most often copper or silver, by chemical or electrochemical plating. Plating refers to modern coating methods, such as the ones used in the electronics industry, whereas gilding is the decorative covering of an object with gold, which typically involve more traditional methods and much larger objects.

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<span class="mw-page-title-main">Tinning</span> Covering object with layer of tin

Tinning is the process of thinly coating sheets of wrought iron or steel with tin, and the resulting product is known as tinplate. The term is also widely used for the different process of coating a metal with solder before soldering.

<span class="mw-page-title-main">Electroless nickel-phosphorus plating</span> Chemical-induced nickel coating of a surface

Electroless nickel-phosphorus plating, also referred to as E-nickel, is a chemical process that deposits an even layer of nickel-phosphorus alloy on the surface of a solid substrate, like metal or plastic. The process involves dipping the substrate in a water solution containing nickel salt and a phosphorus-containing reducing agent, usually a hypophosphite salt. It is the most common version of electroless nickel plating and is often referred by that name. A similar process uses a borohydride reducing agent, yielding a nickel-boron coating instead.

Electrochemical migration (ECM) is the dissolution and movement of metal ions in presence of electric potential, which results in the growth of dendritic structures between anode and cathode. The process is most commonly observed in printed circuit boards where it may significantly decrease the insulation between conductors.

<span class="mw-page-title-main">Soldering</span> Process of joining metal pieces with heated filler metal

Soldering is a process of joining two metal surfaces together using a filler metal called solder. The soldering process involves heating the surfaces to be joined and melting the solder, which is then allowed to cool and solidify, creating a strong and durable joint.

<span class="mw-page-title-main">2009–2011 Toyota vehicle recalls</span>

The 2009–11 Toyota vehicle recalls involved three separate but related recalls of automobiles by the Japanese manufacturer Toyota Motor Corporation, which occurred at the end of 2009 and the start of 2010. Toyota initiated the recalls, the first two with the assistance of the U.S. National Highway Traffic Safety Administration (NHTSA), after reports that several vehicles experienced unintended acceleration. The first recall, on November 2, 2009, was to correct a possible incursion of an incorrect or out-of-place front driver's side floor mat into the foot pedal well, which can cause pedal entrapment. The second recall, on January 21, 2010, was begun after some crashes were shown not to have been caused by floor mat incursion. This latter defect was identified as a possible mechanical sticking of the accelerator pedal causing unintended acceleration, referred to as Sticking Accelerator Pedal by Toyota. The original action was initiated by Toyota in their Defect Information Report, dated October 5, 2009, amended January 27, 2010. Following the floor mat and accelerator pedal recalls, Toyota also issued a separate recall for hybrid anti-lock brake software in February 2010.

Sudden unintended acceleration (SUA) is the unintended, unexpected, uncontrolled acceleration of a vehicle, often accompanied by an apparent loss of braking effectiveness. Such problems may be caused by driver error, mechanical or electrical problems, or some combination of these factors. The US National Highway Traffic Safety Administration estimates 16,000 accidents per year in the United States occur when drivers intend to apply the brake but mistakenly apply the accelerator.

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<span class="mw-page-title-main">Materials for use in vacuum</span>

Materials for use in vacuum are materials that show very low rates of outgassing in vacuum and, where applicable, are tolerant to bake-out temperatures. The requirements grow increasingly stringent with the desired degree of vacuum to be achieved in the vacuum chamber. The materials can produce gas by several mechanisms. Molecules of gases and water can be adsorbed on the material surface. Materials may sublimate in vacuum. Or the gases can be released from porous materials or from cracks and crevices. Traces of lubricants, residues from machining, can be present on the surfaces. A specific risk is outgassing of solvents absorbed in plastics after cleaning.

References

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