Dark-field X-ray microscopy

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Dark-field X-ray microscopy (DFXM [1] or DFXRM [2] ) is an imaging technique used for multiscale structural characterisation. It is capable of mapping deeply embedded structural elements with nm-resolution using synchrotron X-ray diffraction-based imaging. The technique works by using scattered X-rays to create a high degree of contrast, and by measuring the intensity and spatial distribution of the diffracted beams, it is possible to obtain a three-dimensional map of the sample's structure, orientation, and local strain.

Contents

History

The first experimental demonstration of dark-field X-ray microscopy was reported in 2006 by a group at the European Synchrotron Radiation Facility in Grenoble, France. Since then, the technique has been rapidly evolving and has shown great promise in multiscale structural characterization. [1] Its development is largely due to advances in synchrotron X-ray sources, which provide highly collimated and intense beams of X-rays. The development of dark-field X-ray microscopy has been driven by the need for non-destructive imaging of bulk crystalline samples at high resolution, and it continues to be an active area of research today. However, dark-field microscopy, [3] [4] dark-field scanning transmission X-ray microscopy, [5] and soft dark-field X-ray microscopy [6] has long been used to map deeply embedded structural elements.

Principles and instrumentation

A monochromatic beam from a synchrotron source illuminates the sample. Objective is the objective lens and Detector is the 2D area detector Principle of dark-field X-ray microscopy.webp
A monochromatic beam from a synchrotron source illuminates the sample. Objective is the objective lens and Detector is the 2D area detector

In this technique, a synchrotron light source is used to generate an intense and coherent X-ray beam, which is then focused onto the sample using a specialized objective lens. The objective lens acts as a collimator to select and focus the scattered light, which is then detected by the 2D detector to create a diffraction pattern. [1] The specialized objective lens in DFXM, referred to as an X-ray objective lens, is a crucial component of the instrumentation required for the technique. It can be made from different materials such as beryllium, silicon, and diamond, depending on the specific requirements of the experiment. [8] The objective enables one to enlarge or reduce the spatial resolution and field of view within the sample by varying the number of individual lenses and adjusting and (as in the figure) correspondingly. The diffraction angle is typically 10–30°. [9] [10]

The sample is positioned at an angle such that the direct beam is blocked by a beam stop or aperture, and the diffracted beams from the sample are allowed to pass through a detector. [11]

An embedded crystalline element (for example, a grain or domain) of choice (green) is aligned such that the detector is positioned at a Bragg angle that corresponds to a particular diffraction peak of interest, which is determined by the crystal structure of the sample. The objective magnifies the diffracted beam by a factor and generates an inverted 2D projection of the grain. Through repeated exposures during a 360° rotation of the element around an axis parallel to the diffraction vector, , several 2D projections of the grain are obtained from various angles. [12] A 3D map is then obtained by combining these projections using reconstruction algorithms [13] similar to those developed for CT scanning. If the lattice of the crystalline element exhibits an internal orientation spread, this procedure is repeated for a number of sample tilts, indicated by the angles and . [1]

The current implementation of DFXM at ID06, ESRF, uses a compound refractive lens (CRL) as the objective, giving spatial resolution of 100 nm and angular resolution of 0.001°. [14] [15]

Applications, limitations and alternatives

Current and potential applications

Multiscale mapping of 10% tensile deformed aluminium. (a) Part of the X-ray mapping of all grains in the specimen. (b) Zooming in on one embedded grain and mapping the intrinsic variation in orientation. A vertical section through the grain is shown for ease of inspection of the spatial heterogeneity. (c) Condensing the incoming beam vertically defines a sub-micron layer within the grain. Below: The corresponding keys for the orientation maps Multiscale mapping of 10%25 tensile deformed aluminium.webp
Multiscale mapping of 10% tensile deformed aluminium. (a) Part of the X-ray mapping of all grains in the specimen. (b) Zooming in on one embedded grain and mapping the intrinsic variation in orientation. A vertical section through the grain is shown for ease of inspection of the spatial heterogeneity. (c) Condensing the incoming beam vertically defines a sub-micron layer within the grain. Below: The corresponding keys for the orientation maps

DFXM has been used for the non-destructive investigation of polycrystalline materials and composites, revealing the 3D microstructure, [16] phases, [17] orientation of individual grains, [18] [19] and local strains. [20] [21] It has also been used for in situ studies of materials recrystallisation, [22] dislocations [23] [24] and other defects, and the deformation [20] and fracture mechanisms in materials, such as metals [11] and composites. [25] DFXM can provide insights into the 3D microstructure and deformation of geological materials such as minerals and rocks, [1] and irradiated materials. [26]

DFXM has the potential to revolutionise the field of nanotechnology by providing non-destructive, high-resolution 3D imaging of nanostructures and nanomaterials. It has been used to investigate the 3D morphology of nanowires and to detect structural defects in nanotubes. [27] [28]

DFXM has shown potential for imaging biological tissues and organs with high contrast and resolution. It has been used to visualize the 3D microstructure of cartilage and bone, as well as to detect early-stage breast cancer in mouse model. [1] [29]

Limitations

The intense X-ray beams used in DFXM can damage delicate samples, particularly biological specimens. [1] DFXM can suffer from imaging artefacts such as ring artefacts, which can affect image quality and limit interpretation. [11]

The instrumentation required for DFXM is expensive and typically only available at synchrotron facilities, making it inaccessible to many researchers. Although DFXM can achieve high spatial resolution, it is still not as high as the resolution achieved by other imaging techniques such as transmission electron microscopy (TEM) or X-ray crystallography. [11]

Preparation of samples for DFXM imaging can be challenging, especially for samples that are not crystalline. There are also limitations on the sample size that can be imaged as the technique works best with thin samples, typically less than 100 microns thick, due to the attenuation of the X-ray beam by thicker samples. [1] DFXM still suffers from long integration times, which can limit its practical applications. This is due to the low flux density of X-rays emitted by synchrotron sources and the high sensitivity required to detect scattered X-rays. [11]

Alternatives

There are several alternative techniques to DFXM, depending on the application, some of which are:

Related Research Articles

<span class="mw-page-title-main">Electron microscope</span> Type of microscope with electrons as a source of illumination

An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope to control the electron beam, for instance focusing them to produce magnified images or electron diffraction patterns. As the wavelength of an electron can be up to 100,000 times smaller than that of visible light, electron microscopes have a much higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes. Electron microscope may refer to:

<span class="mw-page-title-main">Microscopy</span> Viewing of objects which are too small to be seen with the naked eye

Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye. There are three well-known branches of microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.

<span class="mw-page-title-main">Scanning electron microscope</span> Electron microscope where a small beam is scanned across a sample

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image. In the most common SEM mode, secondary electrons emitted by atoms excited by the electron beam are detected using a secondary electron detector. The number of secondary electrons that can be detected, and thus the signal intensity, depends, among other things, on specimen topography. Some SEMs can achieve resolutions better than 1 nanometer.

<span class="mw-page-title-main">Transmission electron microscopy</span> Imaging and diffraction using electrons that pass through samples

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a detector such as a scintillator attached to a charge-coupled device or a direct electron detector.

<span class="mw-page-title-main">Electron diffraction</span> Bending of electron beams due to electrostatic interactions with matter

Electron diffraction is a generic term for phenomena associated with changes in the direction of electron beams due to elastic interactions with atoms. It occurs due to elastic scattering, when there is no change in the energy of the electrons. The negatively charged electrons are scattered due to Coulomb forces when they interact with both the positively charged atomic core and the negatively charged electrons around the atoms. The resulting map of the directions of the electrons far from the sample is called a diffraction pattern, see for instance Figure 1. Beyond patterns showing the directions of electrons, electron diffraction also plays a major role in the contrast of images in electron microscopes.

<span class="mw-page-title-main">Synchrotron light source</span> Particle accelerator designed to produce intense x-ray beams

A synchrotron light source is a source of electromagnetic radiation (EM) usually produced by a storage ring, for scientific and technical purposes. First observed in synchrotrons, synchrotron light is now produced by storage rings and other specialized particle accelerators, typically accelerating electrons. Once the high-energy electron beam has been generated, it is directed into auxiliary components such as bending magnets and insertion devices in storage rings and free electron lasers. These supply the strong magnetic fields perpendicular to the beam that are needed to stimulate the high energy electrons to emit photons.

<span class="mw-page-title-main">X-ray microscope</span> Type of microscope that uses X-rays

An X-ray microscope uses electromagnetic radiation in the X-ray band to produce magnified images of objects. Since X-rays penetrate most objects, there is no need to specially prepare them for X-ray microscopy observations.

<span class="mw-page-title-main">Electron backscatter diffraction</span> Scanning electron microscopy technique

Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In the microscope an incident beam of electrons hits a tilted sample. As backscattered electrons leave the sample, they interact with the atoms and are both elastically diffracted and lose energy, leaving the sample at various scattering angles before reaching the phosphor screen forming Kikuchi patterns (EBSPs). The EBSD spatial resolution depends on many factors, including the nature of the material under study and the sample preparation. They can be indexed to provide information about the material's grain structure, grain orientation, and phase at the micro-scale. EBSD is used for impurities and defect studies, plastic deformation, and statistical analysis for average misorientation, grain size, and crystallographic texture. EBSD can also be combined with energy-dispersive X-ray spectroscopy (EDS), cathodoluminescence (CL), and wavelength-dispersive X-ray spectroscopy (WDS) for advanced phase identification and materials discovery.

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<span class="mw-page-title-main">Scanning transmission electron microscopy</span> Scanning microscopy using thin samples and transmitted electrons

A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis. The rastering of the beam across the sample makes STEM suitable for analytical techniques such as Z-contrast annular dark-field imaging, and spectroscopic mapping by energy dispersive X-ray (EDX) spectroscopy, or electron energy loss spectroscopy (EELS). These signals can be obtained simultaneously, allowing direct correlation of images and spectroscopic data.

Phase-contrast imaging is a method of imaging that has a range of different applications. It measures differences in the refractive index of different materials to differentiate between structures under analysis. In conventional light microscopy, phase contrast can be employed to distinguish between structures of similar transparency, and to examine crystals on the basis of their double refraction. This has uses in biological, medical and geological science. In X-ray tomography, the same physical principles can be used to increase image contrast by highlighting small details of differing refractive index within structures that are otherwise uniform. In transmission electron microscopy (TEM), phase contrast enables very high resolution (HR) imaging, making it possible to distinguish features a few Angstrom apart.

Diffraction topography is a imaging technique based on Bragg diffraction. Diffraction topographic images ("topographies") record the intensity profile of a beam of X-rays diffracted by a crystal. A topography thus represents a two-dimensional spatial intensity mapping (image) of the X-rays diffracted in a specific direction, so regions which diffract substantially will appear brighter than those which do not. This is equivalent to the spatial fine structure of a Laue reflection. Topographs often reveal the irregularities in a non-ideal crystal lattice. X-ray diffraction topography is one variant of X-ray imaging, making use of diffraction contrast rather than absorption contrast which is usually used in radiography and computed tomography (CT). Topography is exploited to a lesser extent with neutrons, and is the same concept as dark field imaging in an electron microscope.

<span class="mw-page-title-main">Coherent diffraction imaging</span> Lensless computational imaging method

Coherent diffractive imaging (CDI) is a "lensless" technique for 2D or 3D reconstruction of the image of nanoscale structures such as nanotubes, nanocrystals, porous nanocrystalline layers, defects, potentially proteins, and more. In CDI, a highly coherent beam of X-rays, electrons or other wavelike particle or photon is incident on an object.

<span class="mw-page-title-main">Ptychography</span>

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<span class="mw-page-title-main">Cryogenic electron microscopy</span> Form of transmission electron microscopy (TEM)

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4D scanning transmission electron microscopy is a subset of scanning transmission electron microscopy (STEM) which utilizes a pixelated electron detector to capture a convergent beam electron diffraction (CBED) pattern at each scan location. This technique captures a 2 dimensional reciprocal space image associated with each scan point as the beam rasters across a 2 dimensional region in real space, hence the name 4D STEM. Its development was enabled by evolution in STEM detectors and improvements computational power. The technique has applications in visual diffraction imaging, phase orientation and strain mapping, phase contrast analysis, among others.

Angus J. Wilkinson is a professor of materials science based at the Department of Materials, University of Oxford. He is a specialist in micromechanics, electron microscopy and crystal plasticity. He assists in overseeing the MicroMechanics group while focusing on the fundamentals of material deformation. He developed the HR-EBSD method for mapping stress and dislocation density at high spatial resolution used at the micron scale in mechanical testing and micro-cantilevers to extract data on mechanical properties that are relevant to materials engineering.

<span class="mw-page-title-main">Transmission Kikuchi diffraction</span> Nanoscale orientation mapping method

Transmission Kikuchi Diffraction (TKD), also sometimes called transmission-electron backscatter diffraction (t-EBSD), is a method for orientation mapping at the nanoscale. It’s used for analysing the microstructures of thin transmission electron microscopy (TEM) specimens in the scanning electron microscope (SEM). This technique has been widely utilised in the characterization of nano-crystalline materials, including oxides, superconductors, and metallic alloys.

X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. using a laboratory diffractometer and a monochromatic X-ray pencil beam. The first implementation of the technique at synchrotron facilities was performed in 1998 by Kleuker et al.

References

  1. 1 2 3 4 5 6 7 8 9 10 Simons, H.; King, A.; Ludwig, W.; Detlefs, C.; Pantleon, W.; Schmidt, S.; Stöhr, F.; Snigireva, I.; Snigirev, A.; Poulsen, H. F. (14 January 2015). "Dark-field X-ray microscopy for multiscale structural characterization". Nature Communications. 6 (1): 6098. Bibcode:2015NatCo...6.6098S. doi:10.1038/ncomms7098. ISSN   2041-1723. PMC   4354092 . PMID   25586429. Creative Commons by small.svg  This article incorporates textfrom this source, which is available under the CC BY 4.0 license.
  2. ↑ Simons, Hugh; Ahl, Sonja Rosenlund; Jakobsen, Anders Clemen; Yildirim, Can; Cook, Phil K.; Detlefs, Carsten; Poulsen, Henning Friis (1 August 2018). "Multi-Scale 3D Imaging of Strain and Structure with Dark-Field X-Ray Microscopy". Microscopy and Microanalysis. 24 (S2): 72–75. Bibcode:2018MiMic..24S..72S. doi: 10.1017/s1431927618012758 . ISSN   1431-9276. S2CID   139864737.
  3. ↑ Chapman, Henry N; Fu, Jenny; Jacobsen, Chris; Williams, Shawn (31 July 2003). "Dark-Field X-Ray Microscopy of Immunogold-Labeled Cells". Microscopy and Microanalysis. 2 (2): 53–62. doi:10.1017/S1431927696210530. S2CID   138065437.
  4. ↑ Vogt, S.; Chapman, H. N.; Jacobsen, C.; Medenwaldt, R. (1 March 2001). "Dark field X-ray microscopy: the effects of condenser/detector aperture". Ultramicroscopy. 87 (1): 25–44. doi:10.1016/S0304-3991(00)00065-6. ISSN   0304-3991. PMID   11310539.
  5. ↑ Chapman, Henry N.; Williams, Shawn; Jacobsen, Chris (1 December 1994). Bailey, G.W.; Garratt-Reed, A.J. (eds.). "Imaging of 30 nm gold spheres by dark-field scanning transmission x-ray microscopy: Proceedings of the 52nd Annual Meeting of the Microscopy Society of America". Proceedings - Annual Meeting, Microscopy Society of America: 52–53. doi:10.1017/S0424820100167998.
  6. ↑ Pfauntsch, S. J; Michette, A. G; Buckley, C. J (15 February 1996). "Toroidal condenser optics for dark-field X-ray microscopy". Optics Communications. 124 (1): 141–149. Bibcode:1996OptCo.124..141P. doi:10.1016/0030-4018(95)00672-9. ISSN   0030-4018.
  7. ↑ Simons, Hugh; Jakobsen, Anders Clemen; Ahl, Sonja Rosenlund; Detlefs, Carsten; Poulsen, Henning Friis (1 June 2016). "Multiscale 3D characterization with dark-field x-ray microscopy". MRS Bulletin. 41 (6): 454–459. Bibcode:2016MRSBu..41..454S. doi:10.1557/mrs.2016.114. ISSN   1938-1425. S2CID   263278153.
  8. ↑ Ando, Masami; Gupta, Rajiv; Iwakoshi, Akari; Kim, Jong-Ki; Shimao, Daisuke; Sugiyama, Hiroshi; Sunaguchi, Naoki; Yuasa, Tetsuya; Ichihara, Shu (November 2020). "X-ray dark-field phase-contrast imaging: Origins of the concept to practical implementation and applications". Physica Medica. 79: 188–208. doi: 10.1016/j.ejmp.2020.11.034 . ISSN   1724-191X. PMID   33342666. S2CID   229343273.
  9. ↑ Vaughan, G. B. M.; Wright, J. P.; Bytchkov, A.; Rossat, M.; Gleyzolle, H.; Snigireva, I.; Snigirev, A. (1 March 2011). "X-ray transfocators: focusing devices based on compound refractive lenses". Journal of Synchrotron Radiation. 18 (2): 125–133. Bibcode:2011JSynR..18..125V. doi:10.1107/S0909049510044365. ISSN   0909-0495. PMC   3267637 . PMID   21335897.
  10. ↑ Snigirev, A.; Kohn, V.; Snigireva, I.; Lengeler, B. (November 1996). "A compound refractive lens for focusing high-energy X-rays". Nature. 384 (6604): 49–51. Bibcode:1996Natur.384...49S. doi:10.1038/384049a0. ISSN   1476-4687. S2CID   4229340.
  11. 1 2 3 4 5 Dresselhaus-Marais, Leora E.; Kozioziemski, Bernard; Holstad, Theodor S.; Ræder, Trygve Magnus; Seaberg, Matthew; Nam, Daewoong; Kim, Sangsoo; Breckling, Sean; Chollet, Matthieu; Cook, Philip K.; Folsom, Eric; Galtier, Eric; Gavilan, Lisseth; Gonzalez, Arnulfo; Gorhover, Tais (2023). "Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers". Scientific Reports. 13 (1): 17573. arXiv: 2210.08366 . Bibcode:2023NatSR..1317573D. doi:10.1038/s41598-023-35526-5. PMC   10579415 . PMID   37845245.
  12. ↑ Ludwig, W.; Cloetens, P.; Härtwig, J.; Baruchel, J.; Hamelin, B.; Bastie, P. (1 October 2001). "Three-dimensional imaging of crystal defects by 'topo-tomography'". Journal of Applied Crystallography. 34 (5): 602–607. Bibcode:2001JApCr..34..602L. doi:10.1107/S002188980101086X. ISSN   0021-8898.
  13. ↑ Ferrer, Júlia Garriga; Rodríguez-Lamas, Raquel; Payno, Henri; De Nolf, Wout; Cook, Phil; Jover, Vicente Armando Solé; Favre-Nicolin, Vincent; Yıldırım, Can; Detlefs, Carsten (11 May 2022). "darfix: Data analysis for dark-field X-ray microscopy". Journal of Synchrotron Radiation. 30 (3): 527–537. arXiv: 2205.05494 . Bibcode:2023JSynR..30..527G. doi:10.1107/S1600577523001674. PMC   10161887 . PMID   37000183.
  14. ↑ Kutsal, M; Bernard, P; Berruyer, G; Cook, P K; Hino, R; Jakobsen, A C; Ludwig, W; Ormstrup, J; Roth, T; Simons, H; Smets, K; Sierra, J X; Wade, J; Wattecamps, P; Yildirim, C (1 August 2019). "The ESRF dark-field x-ray microscope at ID06". IOP Conference Series: Materials Science and Engineering. 580 (1): 012007. Bibcode:2019MS&E..580a2007K. doi: 10.1088/1757-899x/580/1/012007 . ISSN   1757-8981. S2CID   208267226.
  15. ↑ "ID06 - Hard X-ray Microscope". www.esrf.fr. Archived from the original on 20 April 2023. Retrieved 20 April 2023.
  16. ↑ Bucsek, Ashley; Seiner, Hanuš; Simons, Hugh; Yildirim, Can; Cook, Phil; Chumlyakov, Yuriy; Detlefs, Carsten; Stebner, Aaron P. (15 October 2019). "Sub-surface measurements of the austenite microstructure in response to martensitic phase transformation". Acta Materialia. 179: 273–286. Bibcode:2019AcMat.179..273B. doi: 10.1016/j.actamat.2019.08.036 . ISSN   1359-6454.
  17. ↑ Carlsen, Mads Allerup (2022). Phase Resolved Dark-Field X-ray Microscopy. Department of Physics, Technical University of Denmark.
  18. ↑ Yildirim, C.; Jessop, C.; Ahlström, J.; Detlefs, C.; Zhang, Y. (1 May 2021). "3D mapping of orientation variation and local residual stress within individual grains of pearlitic steel using synchrotron dark field X-ray microscopy". Scripta Materialia. 197: 113783. doi: 10.1016/j.scriptamat.2021.113783 . ISSN   1359-6462. S2CID   233536615.
  19. ↑ Chen, Y.; Tang, Y. T.; Collins, D. M.; Clark, S. J.; Ludwig, W.; Rodriguez-Lamas, R.; Detlefs, C.; Reed, R. C.; Lee, P. D.; Withers, P. J.; Yildirim, C. (1 September 2023). "High-resolution 3D strain and orientation mapping within a grain of a directed energy deposition laser additively manufactured superalloy". Scripta Materialia. 234: 115579. arXiv: 2303.04764 . doi:10.1016/j.scriptamat.2023.115579. ISSN   1359-6462. S2CID   257405123.
  20. 1 2 Yildirim, Can; Cook, Phil; Detlefs, Carsten; Simons, Hugh; Poulsen, Henning Friis (1 April 2020). "Probing nanoscale structure and strain by dark-field x-ray microscopy". MRS Bulletin. 45 (4): 277–282. Bibcode:2020MRSBu..45..277Y. doi:10.1557/mrs.2020.89. ISSN   0883-7694. S2CID   216535051.
  21. ↑ Simons, Hugh; Haugen, Astri Bjørnetun; Jakobsen, Anders Clemen; Schmidt, Søren; Stöhr, Frederik; Majkut, Marta; Detlefs, Carsten; Daniels, John E.; Damjanovic, Dragan; Poulsen, Henning Friis (1 September 2018). "Long-range symmetry breaking in embedded ferroelectrics". Nature Materials. 17 (9): 814–819. Bibcode:2018NatMa..17..814S. doi:10.1038/s41563-018-0116-3. ISSN   1476-4660. PMID   29941920. S2CID   49413867.
  22. ↑ Ahl, S R; Simons, H; Jakobsen, A C; Zhang, Y B; Stöhr, F; Jensen, D Juul; Poulsen, H F (7 August 2015). "Dark field X-ray microscopy for studies of recrystallization". IOP Conference Series: Materials Science and Engineering. 89 (1): 012016. Bibcode:2015MS&E...89a2016A. doi: 10.1088/1757-899X/89/1/012016 . ISSN   1757-8981. S2CID   23480120.
  23. ↑ Jakobsen, A. C.; Simons, H.; Ludwig, W.; Yildirim, C.; Leemreize, H.; Porz, L.; Detlefs, C.; Poulsen, H. F. (1 February 2019). "Mapping of individual dislocations with dark-field X-ray microscopy". Journal of Applied Crystallography. 52 (1): 122–132. Bibcode:2019JApCr..52..122J. doi:10.1107/S1600576718017302. ISSN   1600-5767.
  24. ↑ Huang, Pin-Hua; Coffee, Ryan; Dresselhaus-Marais, Leora (28 February 2023). "Automatic Determination of the Weak-Beam Condition in Dark Field X-ray Microscopy". Integrating Materials and Manufacturing Innovation. 12 (2): 83–91. arXiv: 2211.05247 . doi:10.1007/s40192-023-00295-6. S2CID   258287377.
  25. ↑ Hlushko, K.; Keckes, J.; Ressel, G.; Pörnbacher, J.; Ecker, W.; Kutsal, M.; Cook, P. K.; Detlefs, C.; Yildirim, C. (1 October 2020). "Dark-field X-ray microscopy reveals mosaicity and strain gradients across sub-surface TiC and TiN particles in steel matrix composites". Scripta Materialia. 187: 402–406. doi:10.1016/j.scriptamat.2020.06.053. ISSN   1359-6462. S2CID   224903821.
  26. ↑ Yildirim, C.; Vitoux, H.; Dresselhaus-Marais, L. E.; Steinmann, R.; Watier, Y.; Cook, P. K.; Kutsal, M.; Detlefs, C. (12 June 2020). "Radiation furnace for synchrotron dark-field x-ray microscopy experiments". Review of Scientific Instruments. 91 (65109): 065109. arXiv: 1912.01255 . Bibcode:2020RScI...91f5109Y. doi:10.1063/1.5141139. PMID   32611059. S2CID   208548585.
  27. ↑ Ormstrup, Jeppe; Østergaard, Emil V.; Detlefs, Carsten; Mathiesen, Ragnvald H.; Yildirim, Can; Kutsal, Mustafacan; Cook, Philip K.; Watier, Yves; Cosculluela, Carlos; Simons, Hugh (3 June 2020). "Imaging microstructural dynamics and strain fields in electro-active materials in situ with dark field x-ray microscopy". Review of Scientific Instruments. 91 (65103): 065103. Bibcode:2020RScI...91f5103O. doi: 10.1063/1.5142319 . PMID   32611058. S2CID   220307399.
  28. ↑ Plumb, Jayden; Poudyal, Ishwor; Dally, Rebecca L.; Daly, Samantha; Wilson, Stephen D.; Islam, Zahir (2023). "Dark field X-ray microscopy below liquid-helium temperature: The case of NaMnO2". Materials Characterization. 204. arXiv: 2211.09247 . doi:10.1016/j.matchar.2023.113174.
  29. ↑ Cook, Phil K; Simons, Hugh; Jakobsen, Anders C; Yildirim, Can; Poulsen, Henning F; Detlefs, Carsten (2018). "Insights into the Exceptional Crystallographic Order of Biominerals Using Dark-Field X-ray Microscopy". Microscopy and Microanalysis. 24 (S2): 88–89. Bibcode:2018MiMic..24S..90C. doi: 10.1017/S1431927618012837 .
  30. ↑ Yang, Wenge; Larson, B. C; Tischler, J. Z; Ice, G. E; Budai, J. D; Liu, W (1 August 2004). "Differential-aperture X-ray structural microscopy: a submicron-resolution three-dimensional probe of local microstructure and strain". Micron. International Wuhan Symposium on Advanced Electron Microscopy. 35 (6): 431–439. doi:10.1016/j.micron.2004.02.004. ISSN   0968-4328. PMID   15120127.
  31. ↑ Larson, B. C.; Yang, Wenge; Ice, G. E.; Budai, J. D.; Tischler, J. Z. (February 2002). "Three-dimensional X-ray structural microscopy with submicrometre resolution". Nature. 415 (6874): 887–890. Bibcode:2002Natur.415..887L. doi:10.1038/415887a. ISSN   1476-4687. PMID   11859363. S2CID   4415765.
  32. ↑ Hofmann, Felix; Phillips, Nicholas W.; Das, Suchandrima; Karamched, Phani; Hughes, Gareth M.; Douglas, James O.; Cha, Wonsuk; Liu, Wenjun (14 January 2020). "Nanoscale imaging of the full strain tensor of specific dislocations extracted from a bulk sample". Physical Review Materials. 4 (1): 013801. arXiv: 1903.04079 . Bibcode:2020PhRvM...4a3801H. doi:10.1103/PhysRevMaterials.4.013801. S2CID   195798830.
  33. ↑ Vicente, Rafael A.; Neckel, Itamar T.; Sankaranarayanan, Subramanian K. R. S.; Solla-Gullon, José; Fernández, Pablo S. (27 April 2021). "Bragg Coherent Diffraction Imaging for In Situ Studies in Electrocatalysis". ACS Nano. 15 (4): 6129–6146. doi:10.1021/acsnano.1c01080. ISSN   1936-0851. PMC   8155327 . PMID   33793205.
  34. ↑ Yang, David; Lapington, Mark T.; He, Guanze; Song, Kay; Zhang, Minyi; Barker, Clara; Harder, Ross J.; Cha, Wonsuk; Liu, Wenjun; Phillips, Nicholas W.; Hofmann, Felix (1 October 2022). "Refinements for Bragg coherent X-ray diffraction imaging: electron backscatter diffraction alignment and strain field computation". Journal of Applied Crystallography. 55 (5): 1184–1195. Bibcode:2022JApCr..55.1184Y. doi:10.1107/S1600576722007646. ISSN   1600-5767. PMC   9533756 . PMID   36249491.
  35. ↑ Li, Peng; Hofmann, Felix; Leake, Steven; Allain, Marc; Chamard, Virginie (10 March 2019). Multi-angle Bragg projection ptychography with probe retrieval. The Minerals, Metals & Materials Society Annual Meeting (TMS2019). San Antonio, TX, United States.
  36. ↑ "Ptychography - - Diamond Light Source". www.diamond.ac.uk. Retrieved 17 August 2023.
  37. ↑ Zheng, Guoan; Shen, Cheng; Jiang, Shaowei; Song, Pengming; Yang, Changhuei (March 2021). "Concept, implementations and applications of Fourier ptychography". Nature Reviews Physics. 3 (3): 207–223. Bibcode:2021NatRP...3..207Z. doi:10.1038/s42254-021-00280-y. ISSN   2522-5820. S2CID   257114076.
  38. ↑ "Diffraction Contrast Tomography (DCT)". www.esrf.fr. Retrieved 17 August 2023.
  39. ↑ Reischig, Péter; King, Andrew; Nervo, Laura; Viganò, Nicola; Guilhem, Yoann; Palenstijn, Willem Jan; Batenburg, K. Joost; Preuss, Michael; Ludwig, Wolfgang (2013). "Advances in X-ray diffraction contrast tomography: flexibility in the setup geometry and application to multiphase materials". Journal of Applied Crystallography. 46 (2): 297. Bibcode:2013JApCr..46..297R. doi:10.1107/S0021889813002604.
  40. ↑ Poulsen, H. F.; Nielsen, S. F.; Lauridsen, E. M.; Schmidt, S.; Suter, R. M.; Lienert, U.; Margulies, L.; Lorentzen, T.; Juul Jensen, D. (2001). "Three-dimensional maps of grain boundaries and the stress state of individual grains in polycrystals and powders". Journal of Applied Crystallography. 34 (6): 751–756. Bibcode:2001JApCr..34..751P. doi: 10.1107/s0021889801014273 .
  41. ↑ Koko, Abdalrhaman; Tong, Vivian; Wilkinson, Angus J.; Marrow, T. James (1 June 2023). "An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)". Ultramicroscopy. 248: 113705. arXiv: 2206.10242 . doi:10.1016/j.ultramic.2023.113705. ISSN   0304-3991. PMID   36871367. S2CID   249889699.
  42. ↑ Schwartz, Adam J.; Kumar, Mukul; Adams, Brent L.; Field, David P., eds. (2009). Electron Backscatter Diffraction in Materials Science. doi:10.1007/978-0-387-88136-2. ISBN   978-0-387-88135-5.
  43. ↑ Lin, F. X.; Godfrey, A.; Jensen, D. Juul; Winther, G. (1 November 2010). "3D EBSD characterization of deformation structures in commercial purity aluminum". Materials Characterization. 61 (11): 1203–1210. doi:10.1016/j.matchar.2010.07.013. ISSN   1044-5803.
  44. ↑ Stinville, J. C.; Callahan, P. G.; Charpagne, M. A.; Echlin, M. P.; Valle, V.; Pollock, T. M. (1 March 2020). "Direct measurements of slip irreversibility in a nickel-based superalloy using high resolution digital image correlation". Acta Materialia. 186: 172–189. Bibcode:2020AcMat.186..172S. doi: 10.1016/j.actamat.2019.12.009 . ISSN   1359-6454. S2CID   213631580.
  45. ↑ Zhao, Zhipeng; Zhu, Guoming; Kang, Yonglin; Peng, Lin (13 January 2020). "Analysis of the formation of sub-grain boundaries in commercially pure titanium compressed at elevated temperature". Materials Science and Engineering: A. 771: 138680. doi:10.1016/j.msea.2019.138680. ISSN   0921-5093. S2CID   210240660.
  46. ↑ Kirkland, E (1998). Advanced computing in Electron Microscopy. Springer. ISBN   978-0-306-45936-8.
  47. ↑ Li, Qiu; Wang, Yong; Li, Tiantian; Li, Wei; Wang, Feifan; Janotti, Anderson; Law, Stephanie; Gu, Tingyi (14 April 2020). "Localized Strain Measurement in Molecular Beam Epitaxially Grown Chalcogenide Thin Films by Micro-Raman Spectroscopy". ACS Omega. 5 (14): 8090–8096. doi:10.1021/acsomega.0c00224. ISSN   2470-1343. PMC   7161023 . PMID   32309718.
  48. ↑ Liang, Xingzhong; Rivera-Díaz-del-Castillo, Pedro E. J. (1 January 2022), "Neutron Diffraction", in Caballero, Francisca G. (ed.), Encyclopedia of Materials: Metals and Alloys, Oxford: Elsevier, pp. 695–702, ISBN   978-0-12-819733-2 , retrieved 20 April 2023

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