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An electron microscope is a microscope that uses a beam of electrons as a source of illumination. They use electron optics that are analogous to the glass lenses of an optical light microscope to control the electron beam, for instance focusing them to produce magnified images or electron diffraction patterns. As the wavelength of an electron can be up to 100,000 times smaller than that of visible light, electron microscopes have a much higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes. Electron microscope may refer to:
In optics, chromatic aberration (CA), also called chromatic distortion, color aberration, color fringing, or purple fringing, is a failure of a lens to focus all colors to the same point. It is caused by dispersion: the refractive index of the lens elements varies with the wavelength of light. The refractive index of most transparent materials decreases with increasing wavelength. Since the focal length of a lens depends on the refractive index, this variation in refractive index affects focusing. Since the focal length of the lens varies with the color of the light different colors of light are brought to focus at different distances from the lens or with different levels of magnification. Chromatic aberration manifests itself as "fringes" of color along boundaries that separate dark and bright parts of the image.
Fred Kavli was a Norwegian-American businessman and philanthropist. He was born on a small farm in Eresfjord, Norway. He founded the Kavlico Corporation, located in Moorpark, California. Under his leadership, the company became one of the world's largest suppliers of sensors for aeronautic, automotive, and industrial applications supplying General Electric and the Ford Motor Company.
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Forschungszentrum Jülich (FZJ) is a German national research institution that pursues interdisciplinary research in the fields of energy, information, and bioeconomy. It operates a broad range of research infrastructures like supercomputers, an atmospheric simulation chamber, electron microscopes, a particle accelerator, cleanrooms for nanotechnology, among other things. Current research priorities include the structural change in the Rhineland lignite-mining region, hydrogen, and quantum technologies. As a member of the Helmholtz Association with roughly 6,800 employees in ten institutes and 80 subinstitutes, Jülich is one of the largest research institutions in Europe.
The Transmission Electron Aberration-Corrected Microscope (TEAM) Project is a collaborative research project between four US laboratories and two companies. The project's main activity is design and application of a transmission electron microscope (TEM) with a spatial resolution below 0.05 nanometers, which is roughly half the size of an atom of hydrogen.
Sir John Brian Pendry, is an English theoretical physicist known for his research into refractive indices and creation of the first practical "Invisibility Cloak". He is a professor of theoretical solid state physics at Imperial College London where he was head of the department of physics (1998–2001) and principal of the faculty of physical sciences (2001–2002). He is an honorary fellow of Downing College, Cambridge, and an IEEE fellow. He received the Kavli Prize in Nanoscience "for transformative contributions to the field of nano-optics that have broken long-held beliefs about the limitations of the resolution limits of optical microscopy and imaging.", together with Stefan Hell, and Thomas Ebbesen, in 2014.
Otto Scherzer was a German theoretical physicist who made contributions to electron microscopy.
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Harald Rose is a German physicist.
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Peter David Nellist, is a British physicist and materials scientist, currently a professor in the Department of Materials at the University of Oxford. He is noted for pioneering new techniques in high-resolution electron microscopy.
Nion is a manufacturer of scanning transmission electron microscopes (STEMs) based in Kirkland, Washington.
Aberration-Corrected Transmission Electron Microscopy (AC-TEM) is the general term for using electron microscopes where electro optical components are introduced to reduce the aberrations that would otherwise reduce the resolution of images. Historically electron microscopes had quite severe aberrations, and until about the start of the 21st century the resolution was quite limited, at best able to image the atomic structure of materials so long as the atoms were far enough apart. Theoretical methods of correcting the aberrations existed for some time, but could not be implemented in practice. Around the turn of the century the electron optical components were coupled with computer control of the lenses and their alignment; this was the breakthrough which led to significant improvements both in resolution and the clarity of the images. As of 2024 both correction of optical as well as chromatic aberrations is standard in many commercial electron microscopes. They are extensively used in many different areas of science.
References
- ↑ Jürgens, Michaela. "LEM – Mitarbeiter". KIT (in German). Retrieved 14 December 2021.
- ↑ "Dr. Max Haider". Corrected Electron Optical Systems (in German). Retrieved 14 December 2021.
- ↑ "KIT – KIT – Media – Press Releases – Archive Press Releases – Maximilian Haider Is Granted Wolf Prize for Physics". www.kit.edu. 16 April 2021. Retrieved 14 December 2021.
- ↑ "Innovation Award | Corrected Electron Optical Systems".
- ↑ Honda Prize Past Laureates
- ↑ "Congress in honour of Maximilian Haider and Harald Rose | Corrected Electron Optical Systems".
- ↑ "BBVA Foundation Frontiers of Knowledge Awards". Archived from the original on 6 October 2015. Retrieved 11 August 2018.
- ↑ "Honorary Fellows". RMS. Retrieved 14 December 2021.
- ↑ NIMS Award
- ↑ 2020 Kavli Prize in Nanoscience, www.kavliprize.org. Retrieved 27 May 2020.
